Inventor
HONG GARY
TW219 patents
⚠️ This page may combine multiple inventors who share the name “HONG GARY”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
UNITED MICROELECTRONICS CORP
38 patentsUS5994745ANov 30, 1999
ROM device having shaped gate electrodes and corresponding code implants
UNITED MICROELECTRONICS CORP124 citations99
US5495441AFeb 27, 1996
Split-gate flash memory cell
UNITED MICROELECTRONICS CORP207 citations99
US5460988AOct 24, 1995
Process for high density flash EPROM cell
UNITED MICROELECTRONICS CORP201 citations99
US5414287AMay 9, 1995
Process for high density split-gate memory cell for flash or EPROM
UNITED MICROELECTRONICS CORP242 citations99
US5378647AJan 3, 1995
Method of making a bottom gate mask ROM device
UNITED MICROELECTRONICS CORP147 citations99
US6720267B1Apr 13, 2004
Method for forming a cantilever beam model micro-electromechanical system
UNITED MICROELECTRONICS CORP124 citations98
US5350710ASep 27, 1994
Device for preventing antenna effect on circuit
UNITED MICROELECTRONICS CORP118 citations98
US6232202B1May 15, 2001
Method for manufacturing shallow trench isolation structure including a dual trench
UNITED MICROELECTRONICS CORP78 citations96
US5716884AFeb 10, 1998
Process for fabricating a stacked capacitor
UNITED MICROELECTRONICS CORP57 citations96
US5674760AOct 7, 1997
Method of forming isolation regions in a MOS transistor device
UNITED MICROELECTRONICS CORP61 citations96
US5667940ASep 16, 1997
Process for creating high density integrated circuits utilizing double coating photoresist mask
UNITED MICROELECTRONICS CORP96 citations96
US5614746AMar 25, 1997
Structure and process of manufacture of split gate flash memory cell
UNITED MICROELECTRONICS CORP49 citations96
US5538913AJul 23, 1996
Process for fabricating MOS transistors having full-overlap lightly-doped drain structure
UNITED MICROELECTRONICS CORP81 citations96
US5523251AJun 4, 1996
Method for fabricating a self aligned mask ROM
UNITED MICROELECTRONICS CORP77 citations96
US5512770AApr 30, 1996
MOSFET device structure three spaced-apart deep boron implanted channel regions aligned with gate electrode of NMOSFET device
UNITED MICROELECTRONICS CORP64 citations96
US5489543AFeb 6, 1996
Method of forming a MOS device having a localized anti-punchthrough region
UNITED MICROELECTRONICS CORP68 citations96
US5486714AJan 23, 1996
Trench EEPROM with tunnel oxide in trench
UNITED MICROELECTRONICS CORP89 citations96
US5472896ADec 5, 1995
Method for fabricating polycide gate MOSFET devices
UNITED MICROELECTRONICS CORP55 citations96
US5472897ADec 5, 1995
Method for fabricating MOS device with reduced anti-punchthrough region
UNITED MICROELECTRONICS CORP60 citations96
US5445983AAug 29, 1995
Method of manufacturing EEPROM memory device with a select gate
UNITED MICROELECTRONICS CORP75 citations96
US5445984AAug 29, 1995
Method of making a split gate flash memory cell
UNITED MICROELECTRONICS CORP57 citations96
US5438009AAug 1, 1995
Method of fabrication of MOSFET device with buried bit line
UNITED MICROELECTRONICS CORP95 citations96
US5429970AJul 4, 1995
Method of making flash EEPROM memory cell
UNITED MICROELECTRONICS CORP76 citations96
US5413949AMay 9, 1995
Method of making self-aligned MOSFET
UNITED MICROELECTRONICS CORP70 citations96
US5382545AJan 17, 1995
Interconnection process with self-aligned via plug
UNITED MICROELECTRONICS CORP51 citations96
US5298447AMar 29, 1994
Method of fabricating a flash memory cell
UNITED MICROELECTRONICS CORP85 citations96
US5429956AJul 4, 1995
Method for fabricating a field effect transistor with a self-aligned anti-punchthrough implant channel
UNITED MICROELECTRONICS CORP109 citations95
US5350698ASep 27, 1994
Multilayer polysilicon gate self-align process for VLSI CMOS device
UNITED MICROELECTRONICS CORP57 citations95
US6396745B1May 28, 2002
Vertical two-transistor flash memory
UNITED MICROELECTRONICS CORP86 citations94
US6284597B1Sep 4, 2001
Method of fabricating flash memory
UNITED MICROELECTRONICS CORP28 citations93
US5969384AOct 19, 1999
Flash memory having separate data programming and erasing terminals
UNITED MICROELECTRONICS CORP29 citations93
US5952039ASep 14, 1999
Method for manufacturing DRAM capacitor
UNITED MICROELECTRONICS CORP26 citations93
US5869369AFeb 9, 1999
Method of fabricating a flash memory
UNITED MICROELECTRONICS CORP34 citations93
US5770501AJun 23, 1998
Process of fabricating NAND-structure flash EEPROM using liquid phase deposition
UNITED MICROELECTRONICS CORP49 citations93
US5726070AMar 10, 1998
Silicon-rich tunnel oxide formed by oxygen implantation for flash EEPROM
UNITED MICROELECTRONICS CORP19 citations93
US5721442AFeb 24, 1998
High density flash EPROM
UNITED MICROELECTRONICS CORP24 citations93
US5703387ADec 30, 1997
Split gate memory cell with vertical floating gate
UNITED MICROELECTRONICS CORP35 citations93
US5686332ANov 11, 1997
Process for fabricating flash memory devices
UNITED MICROELECTRONICS CORP23 citations93
UNITED SEMICONDUCTOR CORP
12 patentsUS6171909B1Jan 9, 2001
Method for forming a stacked gate
UNITED SEMICONDUCTOR CORP141 citations97
US6069058AMay 30, 2000
Shallow trench isolation for semiconductor devices
UNITED SEMICONDUCTOR CORP64 citations96
US6001707ADec 14, 1999
Method for forming shallow trench isolation structure
UNITED SEMICONDUCTOR CORP56 citations96
US5899719AMay 4, 1999
Sub-micron MOSFET
UNITED SEMICONDUCTOR CORP72 citations96
US6153472ANov 28, 2000
Method for fabricating a flash memory
UNITED SEMICONDUCTOR CORP65 citations95
US6035530AMar 14, 2000
Method of manufacturing interconnect
UNITED SEMICONDUCTOR CORP37 citations93
US6037234AMar 14, 2000
Method of fabricating capacitor
UNITED SEMICONDUCTOR CORP34 citations93
US6030882AFeb 29, 2000
Method for manufacturing shallow trench isolation structure
UNITED SEMICONDUCTOR CORP21 citations93
US6025229AFeb 15, 2000
Method of fabricating split-gate source side injection flash memory array
UNITED SEMICONDUCTOR CORP26 citations93
US5972752AOct 26, 1999
Method of manufacturing a flash memory cell having a tunnel oxide with a long narrow top profile
UNITED SEMICONDUCTOR CORP34 citations93
US5966600AOct 12, 1999
DRAM process with a multilayer stack structure
UNITED SEMICONDUCTOR CORP41 citations93
US5960285ASep 28, 1999
Flash EEPROM device
UNITED SEMICONDUCTOR CORP34 citations93
Showing the top 50 of 219 patents by PatentIndex Score.