P

Inventor

HONG GARY

TW219 patents
⚠️ This page may combine multiple inventors who share the name “HONG GARY”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

UNITED MICROELECTRONICS CORP

38 patents
US5994745ANov 30, 1999

ROM device having shaped gate electrodes and corresponding code implants

UNITED MICROELECTRONICS CORP124 citations99
US5495441AFeb 27, 1996

Split-gate flash memory cell

UNITED MICROELECTRONICS CORP207 citations99
US5460988AOct 24, 1995

Process for high density flash EPROM cell

UNITED MICROELECTRONICS CORP201 citations99
US5414287AMay 9, 1995

Process for high density split-gate memory cell for flash or EPROM

UNITED MICROELECTRONICS CORP242 citations99
US5378647AJan 3, 1995

Method of making a bottom gate mask ROM device

UNITED MICROELECTRONICS CORP147 citations99
US6720267B1Apr 13, 2004

Method for forming a cantilever beam model micro-electromechanical system

UNITED MICROELECTRONICS CORP124 citations98
US5350710ASep 27, 1994

Device for preventing antenna effect on circuit

UNITED MICROELECTRONICS CORP118 citations98
US6232202B1May 15, 2001

Method for manufacturing shallow trench isolation structure including a dual trench

UNITED MICROELECTRONICS CORP78 citations96
US5716884AFeb 10, 1998

Process for fabricating a stacked capacitor

UNITED MICROELECTRONICS CORP57 citations96
US5674760AOct 7, 1997

Method of forming isolation regions in a MOS transistor device

UNITED MICROELECTRONICS CORP61 citations96
US5667940ASep 16, 1997

Process for creating high density integrated circuits utilizing double coating photoresist mask

UNITED MICROELECTRONICS CORP96 citations96
US5614746AMar 25, 1997

Structure and process of manufacture of split gate flash memory cell

UNITED MICROELECTRONICS CORP49 citations96
US5538913AJul 23, 1996

Process for fabricating MOS transistors having full-overlap lightly-doped drain structure

UNITED MICROELECTRONICS CORP81 citations96
US5523251AJun 4, 1996

Method for fabricating a self aligned mask ROM

UNITED MICROELECTRONICS CORP77 citations96
US5512770AApr 30, 1996

MOSFET device structure three spaced-apart deep boron implanted channel regions aligned with gate electrode of NMOSFET device

UNITED MICROELECTRONICS CORP64 citations96
US5489543AFeb 6, 1996

Method of forming a MOS device having a localized anti-punchthrough region

UNITED MICROELECTRONICS CORP68 citations96
US5486714AJan 23, 1996

Trench EEPROM with tunnel oxide in trench

UNITED MICROELECTRONICS CORP89 citations96
US5472896ADec 5, 1995

Method for fabricating polycide gate MOSFET devices

UNITED MICROELECTRONICS CORP55 citations96
US5472897ADec 5, 1995

Method for fabricating MOS device with reduced anti-punchthrough region

UNITED MICROELECTRONICS CORP60 citations96
US5445983AAug 29, 1995

Method of manufacturing EEPROM memory device with a select gate

UNITED MICROELECTRONICS CORP75 citations96
US5445984AAug 29, 1995

Method of making a split gate flash memory cell

UNITED MICROELECTRONICS CORP57 citations96
US5438009AAug 1, 1995

Method of fabrication of MOSFET device with buried bit line

UNITED MICROELECTRONICS CORP95 citations96
US5429970AJul 4, 1995

Method of making flash EEPROM memory cell

UNITED MICROELECTRONICS CORP76 citations96
US5413949AMay 9, 1995

Method of making self-aligned MOSFET

UNITED MICROELECTRONICS CORP70 citations96
US5382545AJan 17, 1995

Interconnection process with self-aligned via plug

UNITED MICROELECTRONICS CORP51 citations96
US5298447AMar 29, 1994

Method of fabricating a flash memory cell

UNITED MICROELECTRONICS CORP85 citations96
US5429956AJul 4, 1995

Method for fabricating a field effect transistor with a self-aligned anti-punchthrough implant channel

UNITED MICROELECTRONICS CORP109 citations95
US5350698ASep 27, 1994

Multilayer polysilicon gate self-align process for VLSI CMOS device

UNITED MICROELECTRONICS CORP57 citations95
US6396745B1May 28, 2002

Vertical two-transistor flash memory

UNITED MICROELECTRONICS CORP86 citations94
US6284597B1Sep 4, 2001

Method of fabricating flash memory

UNITED MICROELECTRONICS CORP28 citations93
US5969384AOct 19, 1999

Flash memory having separate data programming and erasing terminals

UNITED MICROELECTRONICS CORP29 citations93
US5952039ASep 14, 1999

Method for manufacturing DRAM capacitor

UNITED MICROELECTRONICS CORP26 citations93
US5869369AFeb 9, 1999

Method of fabricating a flash memory

UNITED MICROELECTRONICS CORP34 citations93
US5770501AJun 23, 1998

Process of fabricating NAND-structure flash EEPROM using liquid phase deposition

UNITED MICROELECTRONICS CORP49 citations93
US5726070AMar 10, 1998

Silicon-rich tunnel oxide formed by oxygen implantation for flash EEPROM

UNITED MICROELECTRONICS CORP19 citations93
US5721442AFeb 24, 1998

High density flash EPROM

UNITED MICROELECTRONICS CORP24 citations93
US5703387ADec 30, 1997

Split gate memory cell with vertical floating gate

UNITED MICROELECTRONICS CORP35 citations93
US5686332ANov 11, 1997

Process for fabricating flash memory devices

UNITED MICROELECTRONICS CORP23 citations93

UNITED SEMICONDUCTOR CORP

12 patents

Showing the top 50 of 219 patents by PatentIndex Score.