P

Inventor

WAGNER KENNETH D

US9 patents
⚠️ This page may combine multiple inventors who share the name “WAGNER KENNETH D”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

IBM

3 patents
US5612963AMar 18, 1997

Hybrid pattern self-testing of integrated circuits

IBM108 citations96
US5375091ADec 20, 1994

Method and apparatus for memory dynamic burn-in and test

IBM23 citations90
US5633812AMay 27, 1997

Fault simulation of testing for board circuit failures

IBM36 citations86

S3 INC

3 patents
US6389566B1May 14, 2002

Edge-triggered scan flip-flop and one-pass scan synthesis methodology

S3 INC57 citations93
US6169418B1Jan 2, 2001

Efficient routing from multiple sources to embedded DRAM and other large circuit blocks

S3 INC40 citations91
US6158033ADec 5, 2000

Multiple input signature testing & diagnosis for embedded blocks in integrated circuits

S3 INC32 citations89

BLUE WILLOW SYSTEMS INC

1 patent
US9922524B2Mar 20, 2018

Methods for detecting and handling fall and perimeter breach events for residents of an assisted living facility

BLUE WILLOW SYSTEMS INC42 citations93

PMC SIERRA US INC

1 patent
US9104825B1Aug 11, 2015

Method of reducing current leakage in a product variant of a semiconductor device

PMC SIERRA US INC2 citations54

SCATCHARD BRUCE

1 patent
US8843870B2Sep 23, 2014

Method of reducing current leakage in a device and a device thereby formed

SCATCHARD BRUCE0 citations26