Inventor
TSENG NAN-HSIN
TW20 patents
⚠️ This page may combine multiple inventors who share the name “TSENG NAN-HSIN”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
TAIWAN SEMICONDUCTOR MFG
7 patentsUS9269537B2Feb 23, 2016
E-beam lithography with alignment gating
TAIWAN SEMICONDUCTOR MFG26 citations92
US7986591B2Jul 26, 2011
Ultra high resolution timing measurement
TAIWAN SEMICONDUCTOR MFG4 citations63
US8937512B1Jan 20, 2015
Voltage-controlled oscillator
TAIWAN SEMICONDUCTOR MFG3 citations59
US8384430B2Feb 26, 2013
RC delay detectors with high sensitivity for through substrate vias
TAIWAN SEMICONDUCTOR MFG4 citations59
US8981842B1Mar 17, 2015
Integrated circuit comprising buffer chain
TAIWAN SEMICONDUCTOR MFG1 citations51
US9059685B2Jun 16, 2015
Circuit and method for pulse width measurement
TAIWAN SEMICONDUCTOR MFG1 citations50
US9117796B2Aug 25, 2015
Semiconductor arrangement and formation thereof
TAIWAN SEMICONDUCTOR MFG0 citations47
TAIWAN SEMICONDUCTOR MFG CO LTD
6 patentsUS11283402B2Mar 22, 2022
Device and method of operating the same
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations61
US10868494B2Dec 15, 2020
Device and method of operating the same
TAIWAN SEMICONDUCTOR MFG CO LTD1 citations61
US9478469B2Oct 25, 2016
Integrated circuit comprising buffer chain
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations51
US9714979B2Jul 25, 2017
Contactless signal testing
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations50
US9423452B2Aug 23, 2016
Contactless signal testing
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations50
US10277206B2Apr 30, 2019
Integrated circuit with an oscillating signal-generating assembly
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations37
TSENG NAN-HSIN
5 patentsUS8113412B1Feb 14, 2012
Methods for detecting defect connections between metal bumps
TSENG NAN-HSIN7 citations82
US8680882B2Mar 25, 2014
3D-IC interposer testing structure and method of testing the structure
TSENG NAN-HSIN2 citations61
US8614571B2Dec 24, 2013
Apparatus and method for on-chip sampling of dynamic IR voltage drop
TSENG NAN-HSIN2 citations61
US8305847B2Nov 6, 2012
Ultra high resolution timing measurement
TSENG NAN-HSIN0 citations51
US8339155B2Dec 25, 2012
System and method for detecting soft-fails
TSENG NAN-HSIN0 citations48