Inventor
NOGUCHI HIDEKAZU
JP27 patents
⚠️ This page may combine multiple inventors who share the name “NOGUCHI HIDEKAZU”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
MICRON TECHNOLOGY INC
15 patentsUS11222686B1Jan 11, 2022
Apparatuses and methods for controlling refresh timing
MICRON TECHNOLOGY INC26 citations94
US10957377B2Mar 23, 2021
Apparatuses and methods for distributed targeted refresh operations
MICRON TECHNOLOGY INC33 citations94
US11322192B2May 3, 2022
Apparatuses and methods for calculating row hammer refresh addresses in a semiconductor device
MICRON TECHNOLOGY INC17 citations93
US11557331B2Jan 17, 2023
Apparatuses and methods for controlling refresh operations
MICRON TECHNOLOGY INC9 citations84
US10580475B2Mar 3, 2020
Apparatuses and methods for calculating row hammer refresh addresses in a semiconductor device
MICRON TECHNOLOGY INC6 citations83
US11450378B2Sep 20, 2022
Apparatuses and methods of power supply control for threshold voltage compensated sense amplifiers
MICRON TECHNOLOGY INC2 citations73
US11356081B2Jun 7, 2022
Average interval generator
MICRON TECHNOLOGY INC3 citations73
US10878862B2Dec 29, 2020
Apparatuses and methods for DRAM wordline control with reverse temperature coefficient delay
MICRON TECHNOLOGY INC4 citations72
US12131767B2Oct 29, 2024
Apparatuses and methods for generating refresh addresses
MICRON TECHNOLOGY INC0 citations62
US12002501B2Jun 4, 2024
Apparatuses and methods for distributed targeted refresh operations
MICRON TECHNOLOGY INC1 citations62
US11721389B2Aug 8, 2023
Apparatuses and methods of power supply control for threshold voltage compensated sense amplifiers
MICRON TECHNOLOGY INC0 citations62
US11468937B2Oct 11, 2022
Apparatuses and methods for generating refresh addresses
MICRON TECHNOLOGY INC0 citations62
US11257529B2Feb 22, 2022
Apparatuses and methods for DRAM wordline control with reverse temperature coefficient delay
MICRON TECHNOLOGY INC1 citations62
US12106792B2Oct 1, 2024
Apparatuses and methods for partial array self refresh masking
MICRON TECHNOLOGY INC0 citations55
US12224037B2Feb 11, 2025
Apparatuses and methods of memory access control with section predecoding and section selection
MICRON TECHNOLOGY INC0 citations44
OKI ELECTRIC IND CO LTD
8 patentsUS6218893B1Apr 17, 2001
Power circuit and clock signal detection circuit
OKI ELECTRIC IND CO LTD20 citations92
US6977851B2Dec 20, 2005
Semiconductor memory device
OKI ELECTRIC IND CO LTD7 citations73
US6751128B2Jun 15, 2004
Semiconductor memory device having shortened testing time
OKI ELECTRIC IND CO LTD6 citations62
US6738299B2May 18, 2004
Semiconductor memory device with redundant memory cells
OKI ELECTRIC IND CO LTD2 citations62
US6341086B2Jan 22, 2002
Semiconductor memory circuit including a data output circuit
OKI ELECTRIC IND CO LTD3 citations62
US7295055B2Nov 13, 2007
Device for eliminating clock signal noise in a semiconductor integrated circuit
OKI ELECTRIC IND CO LTD2 citations61
US7161405B2Jan 9, 2007
Level shift circuit
OKI ELECTRIC IND CO LTD1 citations52
US7005931B2Feb 28, 2006
Semiconductor integrated circuit
OKI ELECTRIC IND CO LTD0 citations41
NOGUCHI HIDEKAZU
3 patentsUS8125248B2Feb 28, 2012
Semiconductor device, method of fabricating semiconductor device, and semiconductor device layout method
NOGUCHI HIDEKAZU2 citations60
US9076503B2Jul 7, 2015
Semiconductor device
NOGUCHI HIDEKAZU0 citations49
US8726106B2May 13, 2014
Semiconductor device having redundant select line to replace regular select line
NOGUCHI HIDEKAZU0 citations49