Inventor · disambiguated record
Theodore P. Moffitt
Also filed as: MOFFITT THEODORE · MOFFITT THEODORE P
8 granted patents·5 pending applications·2 citations·filing 2009–2017
74Inventor score
Top patents by PatentIndex Score
13 records- 0166US8461022B2Methods and apparatus for aligning a substrate in a process chamberKOELMEL BLAKE R·Filed 2010·Granted Jun 11, 2013·2 cites·20 claims
- 0257US2011070724A1Defect-free junction formation using octadecaborane self-amorphizing implantsAPPLIED MATERIALS INC·Filed 2009·Application pending·0 cites
- 0355US9146337B2Apparatus for speckle reduction, pulse stretching, and beam homogenizationAPPLIED MATERIALS INC·Filed 2013·Granted Sep 29, 2015·0 cites·18 claims
- 0454US8815719B2Defect-free junction formation using octadecaborane self-amorphizing implantsLI JIPING·Filed 2012·Granted Aug 26, 2014·0 cites·17 claims
- 0553US10376991B2Pulse width controllerAPPLIED MATERIALS INC·Filed 2013·Granted Aug 13, 2019·0 cites·10 claims
- 0650US10114157B2Pulse width controllerAPPLIED MATERIALS INC·Filed 2013·Granted Oct 30, 2018·0 cites·8 claims
- 0750US2012190182A1Defect-free junction formation using octadecaborane self-amorphizing implantsLI JIPING·Filed 2012·Application pending·0 cites
- 0845US10458861B2Non-contact temperature measurement by dual-wavelength shift in Brewster's angleAPPLIED MATERIALS INC·Filed 2017·Granted Oct 29, 2019·0 cites·19 claims
- 0943US10537965B2Fiber array line generatorAPPLIED MATERIALS INC·Filed 2014·Granted Jan 21, 2020·0 cites·14 claims
- 1043US2015293371A1Diffractive optical elements and methods for patterning thin film electrochemical devicesAPPLIED MATERIALS INC·Filed 2013·Application pending·0 cites
- 1139US9064844B2Laser reflectometry for substrate processingMOFFITT THEODORE P·Filed 2012·Granted Jun 23, 2015·0 cites·20 claims
- 1237US2017148726A1Semiconductor processing method and semiconductor deviceAPPLIED MATERIALS INC·Filed 2016·Application pending·0 cites
- 1333US2016020117A1Scanned pulse anneal apparatus and methodsAPPLIED MATERIALS INC·Filed 2015·Application pending·0 cites
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →