Inventor
DERDERIAN JAMES M
US55 patents
⚠️ This page may combine multiple inventors who share the name “DERDERIAN JAMES M”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
MICRON TECHNOLOGY INC
46 patentsUS6569709B2May 27, 2003
Assemblies including stacked semiconductor devices separated a distance defined by adhesive material interposed therebetween, packages including the assemblies, and methods
MICRON TECHNOLOGY INC176 citations99
US7335533B2Feb 26, 2008
Methods for assembling semiconductor devices in superimposed relation with adhesive material defining the distance adjacent semiconductor devices are spaced apart from one another
MICRON TECHNOLOGY INC34 citations96
US7276393B2Oct 2, 2007
Microelectronic imaging units and methods of manufacturing microelectronic imaging units
MICRON TECHNOLOGY INC33 citations95
US7064069B2Jun 20, 2006
Substrate thinning including planarization
MICRON TECHNOLOGY INC45 citations95
US6940181B2Sep 6, 2005
Thinned, strengthened semiconductor substrates and packages including same
MICRON TECHNOLOGY INC45 citations95
US9768149B2Sep 19, 2017
Semiconductor device assembly with heat transfer structure formed from semiconductor material
MICRON TECHNOLOGY INC24 citations94
US7675131B2Mar 9, 2010
Flip-chip image sensor packages and methods of fabricating the same
MICRON TECHNOLOGY INC38 citations93
US7332372B2Feb 19, 2008
Methods for forming assemblies and packages that include stacked semiconductor devices separated a distance defined by adhesive material interposed therebetween
MICRON TECHNOLOGY INC21 citations93
US6870269B2Mar 22, 2005
Assemblies including stacked semiconductor devices separated a distance defined by adhesive material interposed therebetween, packages including the assemblies, and methods
MICRON TECHNOLOGY INC22 citations93
US7476955B2Jan 13, 2009
Die package having an adhesive flow restriction area
MICRON TECHNOLOGY INC17 citations92
US9733304B2Aug 15, 2017
Semiconductor device test apparatuses
MICRON TECHNOLOGY INC5 citations84
US9691746B2Jun 27, 2017
Methods of manufacturing stacked semiconductor die assemblies with high efficiency thermal paths
MICRON TECHNOLOGY INC9 citations84
US9515002B2Dec 6, 2016
Bonding pads with thermal pathways
MICRON TECHNOLOGY INC6 citations84
US9412675B2Aug 9, 2016
Interconnect structure with improved conductive properties and associated systems and methods
MICRON TECHNOLOGY INC8 citations84
US7518223B2Apr 14, 2009
Semiconductor devices and semiconductor device assemblies including a nonconfluent spacer layer
MICRON TECHNOLOGY INC12 citations84
US7498606B2Mar 3, 2009
Microelectronic imaging units and methods of manufacturing microelectronic imaging units
MICRON TECHNOLOGY INC9 citations84
US7364934B2Apr 29, 2008
Microelectronic imaging units and methods of manufacturing microelectronic imaging units
MICRON TECHNOLOGY INC9 citations84
US6869828B2Mar 22, 2005
Assemblies including stacked semiconductor devices separated a distance defined by adhesive material interposed therebetween, packages including the assemblies, and methods
MICRON TECHNOLOGY INC11 citations82
US8012776B2Sep 6, 2011
Methods of manufacturing imaging device packages
MICRON TECHNOLOGY INC6 citations74
US10861765B2Dec 8, 2020
Carrier removal by use of multilayer foil
MICRON TECHNOLOGY INC2 citations73
US10580746B2Mar 3, 2020
Bonding pads with thermal pathways
MICRON TECHNOLOGY INC1 citations73
US10573612B2Feb 25, 2020
Bonding pads with thermal pathways
MICRON TECHNOLOGY INC1 citations73
US10481200B2Nov 19, 2019
Semiconductor device test apparatuses comprising at least one test site having an array of pockets
MICRON TECHNOLOGY INC1 citations73
US10163830B2Dec 25, 2018
Bonding pads with thermal pathways
MICRON TECHNOLOGY INC3 citations73
US10163693B1Dec 25, 2018
Methods for processing semiconductor dice and fabricating assemblies incorporating same
MICRON TECHNOLOGY INC3 citations73
US9837383B2Dec 5, 2017
Interconnect structure with improved conductive properties and associated systems and methods
MICRON TECHNOLOGY INC2 citations73
US7858420B2Dec 28, 2010
Microelectronic imaging units and methods of manufacturing microelectronic imaging units
MICRON TECHNOLOGY INC6 citations73
US7655507B2Feb 2, 2010
Microelectronic imaging units and methods of manufacturing microelectronic imaging units
MICRON TECHNOLOGY INC6 citations73
US7427811B2Sep 23, 2008
Semiconductor substrate
MICRON TECHNOLOGY INC8 citations73
US7402453B2Jul 22, 2008
Microelectronic imaging units and methods of manufacturing microelectronic imaging units
MICRON TECHNOLOGY INC7 citations73
US7056812B2Jun 6, 2006
Process for strengthening semiconductor substrates following thinning
MICRON TECHNOLOGY INC5 citations73
US11967576B2Apr 23, 2024
Systems for thermally treating conductive elements on semiconductor and wafer structures
MICRON TECHNOLOGY INC0 citations63
US11081458B2Aug 3, 2021
Methods and apparatuses for reflowing conductive elements of semiconductor devices
MICRON TECHNOLOGY INC0 citations63
US10126357B2Nov 13, 2018
Methods of testing semiconductor devices comprising a die stack having protruding conductive elements
MICRON TECHNOLOGY INC1 citations63
US9443744B2Sep 13, 2016
Stacked semiconductor die assemblies with high efficiency thermal paths and associated methods
MICRON TECHNOLOGY INC2 citations63
US11776877B2Oct 3, 2023
Methods of manufacturing stacked semiconductor die assemblies with high efficiency thermal paths
MICRON TECHNOLOGY INC0 citations62
US11139258B2Oct 5, 2021
Bonding pads with thermal pathways
MICRON TECHNOLOGY INC0 citations62
US7491570B2Feb 17, 2009
Die package having an adhesive flow restriction area
MICRON TECHNOLOGY INC2 citations62
US7262488B2Aug 28, 2007
Substrate with enhanced properties for planarization
MICRON TECHNOLOGY INC4 citations62
US12543261B2Feb 3, 2026
Solder mask fault fiber optics sensor
MICRON TECHNOLOGY INC0 citations52
US10748878B2Aug 18, 2020
Semiconductor device assembly with heat transfer structure formed from semiconductor material
MICRON TECHNOLOGY INC0 citations52
US10559495B2Feb 11, 2020
Methods for processing semiconductor dice and fabricating assemblies incorporating same
MICRON TECHNOLOGY INC0 citations52
US10559551B2Feb 11, 2020
Semiconductor device assembly with heat transfer structure formed from semiconductor material
MICRON TECHNOLOGY INC0 citations52
US10431519B1Oct 1, 2019
Carrier removal by use of multilayer foil
MICRON TECHNOLOGY INC0 citations52
US10297577B2May 21, 2019
Semiconductor device assembly with heat transfer structure formed from semiconductor material
MICRON TECHNOLOGY INC0 citations52
US10163755B2Dec 25, 2018
Methods of manufacturing stacked semiconductor die assemblies with high efficiency thermal paths
MICRON TECHNOLOGY INC1 citations52
APTINA IMAGING CORP
3 patentsUS7786574B2Aug 31, 2010
Microelectronic imaging units
APTINA IMAGING CORP6 citations73
US7511374B2Mar 31, 2009
Microelectronic imaging units having covered image sensors
APTINA IMAGING CORP5 citations73
US7691660B2Apr 6, 2010
Methods of manufacturing microelectronic imaging units on a microfeature workpiece
APTINA IMAGING CORP1 citations62
DERDERIAN JAMES M
1 patentShowing the top 50 of 55 patents by PatentIndex Score.