P

Inventor

DERDERIAN JAMES M

US55 patents
⚠️ This page may combine multiple inventors who share the name “DERDERIAN JAMES M”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

MICRON TECHNOLOGY INC

46 patents
US6569709B2May 27, 2003

Assemblies including stacked semiconductor devices separated a distance defined by adhesive material interposed therebetween, packages including the assemblies, and methods

MICRON TECHNOLOGY INC176 citations99
US7335533B2Feb 26, 2008

Methods for assembling semiconductor devices in superimposed relation with adhesive material defining the distance adjacent semiconductor devices are spaced apart from one another

MICRON TECHNOLOGY INC34 citations96
US7276393B2Oct 2, 2007

Microelectronic imaging units and methods of manufacturing microelectronic imaging units

MICRON TECHNOLOGY INC33 citations95
US7064069B2Jun 20, 2006

Substrate thinning including planarization

MICRON TECHNOLOGY INC45 citations95
US6940181B2Sep 6, 2005

Thinned, strengthened semiconductor substrates and packages including same

MICRON TECHNOLOGY INC45 citations95
US9768149B2Sep 19, 2017

Semiconductor device assembly with heat transfer structure formed from semiconductor material

MICRON TECHNOLOGY INC24 citations94
US7675131B2Mar 9, 2010

Flip-chip image sensor packages and methods of fabricating the same

MICRON TECHNOLOGY INC38 citations93
US7332372B2Feb 19, 2008

Methods for forming assemblies and packages that include stacked semiconductor devices separated a distance defined by adhesive material interposed therebetween

MICRON TECHNOLOGY INC21 citations93
US6870269B2Mar 22, 2005

Assemblies including stacked semiconductor devices separated a distance defined by adhesive material interposed therebetween, packages including the assemblies, and methods

MICRON TECHNOLOGY INC22 citations93
US7476955B2Jan 13, 2009

Die package having an adhesive flow restriction area

MICRON TECHNOLOGY INC17 citations92
US9733304B2Aug 15, 2017

Semiconductor device test apparatuses

MICRON TECHNOLOGY INC5 citations84
US9691746B2Jun 27, 2017

Methods of manufacturing stacked semiconductor die assemblies with high efficiency thermal paths

MICRON TECHNOLOGY INC9 citations84
US9515002B2Dec 6, 2016

Bonding pads with thermal pathways

MICRON TECHNOLOGY INC6 citations84
US9412675B2Aug 9, 2016

Interconnect structure with improved conductive properties and associated systems and methods

MICRON TECHNOLOGY INC8 citations84
US7518223B2Apr 14, 2009

Semiconductor devices and semiconductor device assemblies including a nonconfluent spacer layer

MICRON TECHNOLOGY INC12 citations84
US7498606B2Mar 3, 2009

Microelectronic imaging units and methods of manufacturing microelectronic imaging units

MICRON TECHNOLOGY INC9 citations84
US7364934B2Apr 29, 2008

Microelectronic imaging units and methods of manufacturing microelectronic imaging units

MICRON TECHNOLOGY INC9 citations84
US6869828B2Mar 22, 2005

Assemblies including stacked semiconductor devices separated a distance defined by adhesive material interposed therebetween, packages including the assemblies, and methods

MICRON TECHNOLOGY INC11 citations82
US8012776B2Sep 6, 2011

Methods of manufacturing imaging device packages

MICRON TECHNOLOGY INC6 citations74
US10861765B2Dec 8, 2020

Carrier removal by use of multilayer foil

MICRON TECHNOLOGY INC2 citations73
US10580746B2Mar 3, 2020

Bonding pads with thermal pathways

MICRON TECHNOLOGY INC1 citations73
US10573612B2Feb 25, 2020

Bonding pads with thermal pathways

MICRON TECHNOLOGY INC1 citations73
US10481200B2Nov 19, 2019

Semiconductor device test apparatuses comprising at least one test site having an array of pockets

MICRON TECHNOLOGY INC1 citations73
US10163830B2Dec 25, 2018

Bonding pads with thermal pathways

MICRON TECHNOLOGY INC3 citations73
US10163693B1Dec 25, 2018

Methods for processing semiconductor dice and fabricating assemblies incorporating same

MICRON TECHNOLOGY INC3 citations73
US9837383B2Dec 5, 2017

Interconnect structure with improved conductive properties and associated systems and methods

MICRON TECHNOLOGY INC2 citations73
US7858420B2Dec 28, 2010

Microelectronic imaging units and methods of manufacturing microelectronic imaging units

MICRON TECHNOLOGY INC6 citations73
US7655507B2Feb 2, 2010

Microelectronic imaging units and methods of manufacturing microelectronic imaging units

MICRON TECHNOLOGY INC6 citations73
US7427811B2Sep 23, 2008

Semiconductor substrate

MICRON TECHNOLOGY INC8 citations73
US7402453B2Jul 22, 2008

Microelectronic imaging units and methods of manufacturing microelectronic imaging units

MICRON TECHNOLOGY INC7 citations73
US7056812B2Jun 6, 2006

Process for strengthening semiconductor substrates following thinning

MICRON TECHNOLOGY INC5 citations73
US11967576B2Apr 23, 2024

Systems for thermally treating conductive elements on semiconductor and wafer structures

MICRON TECHNOLOGY INC0 citations63
US11081458B2Aug 3, 2021

Methods and apparatuses for reflowing conductive elements of semiconductor devices

MICRON TECHNOLOGY INC0 citations63
US10126357B2Nov 13, 2018

Methods of testing semiconductor devices comprising a die stack having protruding conductive elements

MICRON TECHNOLOGY INC1 citations63
US9443744B2Sep 13, 2016

Stacked semiconductor die assemblies with high efficiency thermal paths and associated methods

MICRON TECHNOLOGY INC2 citations63
US11776877B2Oct 3, 2023

Methods of manufacturing stacked semiconductor die assemblies with high efficiency thermal paths

MICRON TECHNOLOGY INC0 citations62
US11139258B2Oct 5, 2021

Bonding pads with thermal pathways

MICRON TECHNOLOGY INC0 citations62
US7491570B2Feb 17, 2009

Die package having an adhesive flow restriction area

MICRON TECHNOLOGY INC2 citations62
US7262488B2Aug 28, 2007

Substrate with enhanced properties for planarization

MICRON TECHNOLOGY INC4 citations62
US12543261B2Feb 3, 2026

Solder mask fault fiber optics sensor

MICRON TECHNOLOGY INC0 citations52
US10748878B2Aug 18, 2020

Semiconductor device assembly with heat transfer structure formed from semiconductor material

MICRON TECHNOLOGY INC0 citations52
US10559495B2Feb 11, 2020

Methods for processing semiconductor dice and fabricating assemblies incorporating same

MICRON TECHNOLOGY INC0 citations52
US10559551B2Feb 11, 2020

Semiconductor device assembly with heat transfer structure formed from semiconductor material

MICRON TECHNOLOGY INC0 citations52
US10431519B1Oct 1, 2019

Carrier removal by use of multilayer foil

MICRON TECHNOLOGY INC0 citations52
US10297577B2May 21, 2019

Semiconductor device assembly with heat transfer structure formed from semiconductor material

MICRON TECHNOLOGY INC0 citations52
US10163755B2Dec 25, 2018

Methods of manufacturing stacked semiconductor die assemblies with high efficiency thermal paths

MICRON TECHNOLOGY INC1 citations52

APTINA IMAGING CORP

3 patents

DERDERIAN JAMES M

1 patent

Showing the top 50 of 55 patents by PatentIndex Score.