Inventor · disambiguated record
Dai Shinozaki
Also filed as: SHINOZAKI DAI
6 granted patents·2 pending applications·26 citations·filing 2003–2014
77Inventor score
Files withTOKYO ELECTRON LTD4MIYAZONO MITSUYOSHI1NAKAMURA MICHIKAZU1SUGIYAMA MASAHIKO1TANAKA PRECIOUS METAL IND1
Top patents by PatentIndex Score
8 records- 0180US7586317B2Inspection apparatus, probe card and inspection methodTOKYO ELECTRON LTD·Filed 2008·Granted Sep 8, 2009·8 cites·13 claims
- 0266US7301357B2Inspection method and inspection equipmentTOKYO ELECTRON LTD·Filed 2003·Granted Nov 27, 2007·13 cites·10 claims
- 0361US8471585B2Method for evaluating semiconductor deviceMIYAZONO MITSUYOSHI·Filed 2010·Granted Jun 25, 2013·2 cites·6 claims
- 0459US7701241B2Circuit for protecting DUT, method for protecting DUT, testing apparatus and testing methodTOKYO ELECTRON LTD·Filed 2007·Granted Apr 20, 2010·3 cites·14 claims
- 0546US9607922B2Semiconductor device and heat-dissipating mechanismTANAKA PRECIOUS METAL IND·Filed 2014·Granted Mar 28, 2017·0 cites·4 claims
- 0640US2014239484A1Method for forming sintered silver coating film, baking apparatus, and semiconductor deviceTOKYO ELECTRON LTD·Filed 2014·Application pending·0 cites
- 0735US8749068B2Mounting method and mounting deviceNAKAMURA MICHIKAZU·Filed 2010·Granted Jun 10, 2014·0 cites·16 claims
- 0834US2012291950A1Mounting method and mounting deviceSUGIYAMA MASAHIKO·Filed 2010·Application pending·0 cites
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →