Inventor

LIAO WEN-JUNG

TW51 patents

⚠️ This page may combine multiple inventors who share the name “LIAO WEN-JUNG”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

LIAO WEN-JUNG

UNITED MICROELECTRONICS CORP

High electron mobility transistor and method for fabricating the same

Semiconductor device and fabricating method thereof

Insulating structure of high electron mobility transistor and manufacturing method thereof

Test key structure and test key group

High electron mobility transistor and method for fabricating the same

High electron mobility transistor and method for fabricating the same

High electron mobility transistor and method for fabricating the same

High electron mobility transistor and method for forming the same

Semiconductor device and fabricating method thereof

High electron mobility transistor and method for fabricating the same

Semiconductor device and fabricating method thereof

High electron mobility transistor

High electron mobility transistor and method for fabricating the same

Layout structure of electronic element and testing method of the same thereof

High electron mobility transistor and method for fabricating the same

High-electron mobility transistor and fabrication method thereof

High electron mobility transistor and method for fabricating the same

Manufacturing method of semiconductor device

Manufacturing method for forminginsulating structure of high electron mobility transistor

Semiconductor device

Semiconductor device and manufacturing method thereof

High electron mobility transistor and method for fabricating the same

Semiconductor device

Semiconductor transistor structure with reduced contact resistance and fabrication method thereof

Semiconductor device

High electron mobility transistor

High electron mobility transistor and fabrication method thereof

High electron mobility transistor and fabrication method thereof

Insulating structure of high electron mobility transistor and manufacturing method thereof

High electron mobility transistor and method for fabricating the same

Semiconductive device with mesa structure and method of fabricating the same

High electron mobility transistor and fabrication method thereof

High-electron mobility transistor and fabrication method thereof

Manufacturing method for forming insulating structure of high electron mobility transistor

Semiconductor epitaxial structure with reduced defects

Thermal uniformity compensating method and apparatus

High electron mobility transistor and method for forming the same

High electron mobility transistor and method for forming the same

Manufacturing method of capacitor structure including patterned conductive layer disposed between two electrodes

Capacitor structure including patterned conductive layer disposed between two electrodes and manufacturing method thereof

Nitride semiconductor device and manufacturing method thereof

Semiconductor structure and testing method using the same

Enhancement mode high electron mobility transistor

High electron mobility transistor and method for fabricating the same

Layout generating method

Method for analyzing process output and method for creating equipment parameter model

(unassigned)

Connector structure

KUO CHIEN-LI

Method for predicting tolerable spacing between conductors in semiconductor process

MSTAR SEMICONDUCTOR INC

Method and data processing apparatus supporting simultaneous playback

LIN KAO-CHENG

Method and apparatus of electrical device characterization