Inventor
HOU CHUN-LIANG
TW35 patents
⚠️ This page may combine multiple inventors who share the name “HOU CHUN-LIANG”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
UNITED MICROELECTRONICS CORP
33 patentsUS11264492B2Mar 1, 2022
High electron mobility transistor and method for fabricating the same
UNITED MICROELECTRONICS CORP21 citations93
US7715260B1May 11, 2010
Operating voltage tuning method for static random access memory
UNITED MICROELECTRONICS CORP41 citations89
US9230871B1Jan 5, 2016
Test key structure and test key group
UNITED MICROELECTRONICS CORP7 citations84
US12027604B2Jul 2, 2024
High electron mobility transistor and method for fabricating the same
UNITED MICROELECTRONICS CORP1 citations73
US11894441B2Feb 6, 2024
High electron mobility transistor and method for fabricating the same
UNITED MICROELECTRONICS CORP2 citations73
US11735644B2Aug 22, 2023
High electron mobility transistor and method for fabricating the same
UNITED MICROELECTRONICS CORP3 citations73
US11695049B2Jul 4, 2023
High electron mobility transistor and method for forming the same
UNITED MICROELECTRONICS CORP4 citations73
US11367779B2Jun 21, 2022
High electron mobility transistor and method for fabricating the same
UNITED MICROELECTRONICS CORP2 citations73
US10971610B2Apr 6, 2021
High electron mobility transistor
UNITED MICROELECTRONICS CORP4 citations73
US11804544B2Oct 31, 2023
High electron mobility transistor and method for fabricating the same
UNITED MICROELECTRONICS CORP2 citations72
US9063193B2Jun 23, 2015
Layout structure of electronic element and testing method of the same thereof
UNITED MICROELECTRONICS CORP3 citations63
US12328889B2Jun 10, 2025
High electron mobility transistor and method for fabricating the same
UNITED MICROELECTRONICS CORP0 citations62
US12125903B2Oct 22, 2024
High electron mobility transistor and method for fabricating the same
UNITED MICROELECTRONICS CORP0 citations62
US11791407B2Oct 17, 2023
Semiconductor transistor structure with reduced contact resistance and fabrication method thereof
UNITED MICROELECTRONICS CORP0 citations62
US11610989B2Mar 21, 2023
High electron mobility transistor
UNITED MICROELECTRONICS CORP0 citations62
US11502177B2Nov 15, 2022
High electron mobility transistor and fabrication method thereof
UNITED MICROELECTRONICS CORP0 citations62
US11489048B2Nov 1, 2022
High electron mobility transistor and fabrication method thereof
UNITED MICROELECTRONICS CORP0 citations62
US11239338B2Feb 1, 2022
High electron mobility transistor and method for fabricating the same
UNITED MICROELECTRONICS CORP0 citations62
US11177377B2Nov 16, 2021
Semiconductive device with mesa structure and method of fabricating the same
UNITED MICROELECTRONICS CORP0 citations62
US11063124B2Jul 13, 2021
High electron mobility transistor and fabrication method thereof
UNITED MICROELECTRONICS CORP0 citations62
US11004952B1May 11, 2021
High-electron mobility transistor and fabrication method thereof
UNITED MICROELECTRONICS CORP0 citations62
US10861970B1Dec 8, 2020
Semiconductor epitaxial structure with reduced defects
UNITED MICROELECTRONICS CORP1 citations62
US9235677B1Jan 12, 2016
Thermal uniformity compensating method and apparatus
UNITED MICROELECTRONICS CORP2 citations62
US12266701B2Apr 1, 2025
High electron mobility transistor and method for forming the same
UNITED MICROELECTRONICS CORP0 citations61
US12206000B2Jan 21, 2025
High electron mobility transistor and method for forming the same
UNITED MICROELECTRONICS CORP0 citations61
US10776402B2Sep 15, 2020
Manufacture parameters grouping and analyzing method, and manufacture parameters grouping and analyzing system
UNITED MICROELECTRONICS CORP1 citations57
US10762618B1Sep 1, 2020
Mask weak pattern recognition apparatus and mask weak pattern recognition method
UNITED MICROELECTRONICS CORP1 citations53
US9964587B2May 8, 2018
Semiconductor structure and testing method using the same
UNITED MICROELECTRONICS CORP0 citations52
US11935947B2Mar 19, 2024
Enhancement mode high electron mobility transistor
UNITED MICROELECTRONICS CORP0 citations51
US11749740B2Sep 5, 2023
High electron mobility transistor and method for fabricating the same
UNITED MICROELECTRONICS CORP0 citations50
US9171127B1Oct 27, 2015
Layout generating method
UNITED MICROELECTRONICS CORP0 citations49
US11074376B2Jul 27, 2021
Method for analyzing process output and method for creating equipment parameter model
UNITED MICROELECTRONICS CORP0 citations47
US10482153B2Nov 19, 2019
Analyzing method and analyzing system for manufacturing data
UNITED MICROELECTRONICS CORP0 citations36