Inventor · disambiguated record
Jason Arjavac
Also filed as: ARJAVAC JASON · ARJAVAC JASON H · ARJAVAC JASON HARRISON
18 granted patents·1 pending application·144 citations·filing 2003–2023
94Inventor score
Top patents by PatentIndex Score
19 records- 0193US8890064B2Method for S/TEM sample analysisFEI CO·Filed 2013·Granted Nov 18, 2014·12 cites·8 claims
- 0292US8525137B2Method for creating S/TEM sample and sample structureBLACKWOOD JEFF·Filed 2007·Granted Sep 3, 2013·13 cites·26 claims
- 0391US8357913B2Method and apparatus for sample extraction and handlingFEI CO·Filed 2007·Granted Jan 22, 2013·17 cites·15 claims
- 0490US8455821B2Method for S/TEM sample analysisARJAVAC JASON·Filed 2007·Granted Jun 4, 2013·22 cites·2 claims
- 0589US8163145B2Method and apparatus for controlling topographical variation on a milled cross-section of a structureNADEAU JAMES P·Filed 2009·Granted Apr 24, 2012·17 cites·24 claims
- 0688US9576772B1CAD-assisted TEM prep recipe creationFEI CO·Filed 2015·Granted Feb 21, 2017·11 cites·15 claims
- 0786US9275831B2Method for S/TEM sample analysisFEI CO·Filed 2014·Granted Mar 1, 2016·4 cites·20 claims
- 0885US8884247B2System and method for ex situ analysis of a substrateFEI CO·Filed 2012·Granted Nov 11, 2014·9 cites·7 claims
- 0980US10465293B2Dose-based end-pointing for low-kV FIB milling TEM sample preparationMILLER THOMAS G·Filed 2012·Granted Nov 5, 2019·4 cites·28 claims
- 1080US6926935B2Proximity depositionFEI CO·Filed 2003·Granted Aug 9, 2005·20 cites·25 claims
- 1179US9349570B2Method and apparatus for sample extraction and handlingFEI CO·Filed 2015·Granted May 24, 2016·2 cites·12 claims
- 1275US7611610B2Method and apparatus for controlling topographical variation on a milled cross-section of a structureFEI CO·Filed 2003·Granted Nov 3, 2009·10 cites·30 claims
- 1371US8912488B2Automated sample orientationFEI CO·Filed 2012·Granted Dec 16, 2014·2 cites·14 claims
- 1470US11313042B2Dose-based end-pointing for low-kV FIB milling in TEM sample preparationFEI CO·Filed 2019·Granted Apr 26, 2022·0 cites·18 claims
- 1562US12249482B2Microscopy feedback for improved milling accuracyFEI CO·Filed 2022·Granted Mar 11, 2025·0 cites·26 claims
- 1662US9852750B2Method and apparatus for controlling topographical variation on a milled cross-section of a structureNADEAU JAMES P·Filed 2012·Granted Dec 26, 2017·1 cites·9 claims
- 1761US9581526B2Method for S/TEM sample analysisFEI CO·Filed 2016·Granted Feb 28, 2017·0 cites·18 claims
- 1856US8993962B2Method and apparatus for sample extraction and handlingFEI CO·Filed 2013·Granted Mar 31, 2015·0 cites·20 claims
- 1956US2025095959A1Delayering apparatus and methodsFEI CO·Filed 2023·Application pending·0 cites
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →