Inventor
CARREJO JUAN P
US5 patents
Patents
5 patentsUS5338932AAug 16, 1994
Method and apparatus for measuring the topography of a semiconductor device
MOTOROLA INC76 citations94
US5388323AFeb 14, 1995
Method of forming a probe for an atomic force microscope
MOTOROLA INC21 citations91
US5356218AOct 18, 1994
Probe for providing surface images
MOTOROLA INC30 citations91
US5326971AJul 5, 1994
Transmission electron microscope environmental specimen holder
MOTOROLA INC53 citations90
US5214389AMay 25, 1993
Multi-dimensional high-resolution probe for semiconductor measurements including piezoelectric transducer arrangement for controlling probe position
MOTOROLA INC74 citations90