Inventor
RAINEY BETHANN
US24 patents
⚠️ This page may combine multiple inventors who share the name “RAINEY BETHANN”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
IBM
21 patentsUS7115920B2Oct 3, 2006
FinFET transistor and circuit
IBM175 citations99
US6794718B2Sep 21, 2004
High mobility crystalline planes in double-gate CMOS technology
IBM263 citations99
US6909147B2Jun 21, 2005
Multi-height FinFETS
IBM171 citations98
US6888199B2May 3, 2005
High-density split-gate FinFET
IBM77 citations98
US6992354B2Jan 31, 2006
FinFET having suppressed parasitic device characteristics
IBM54 citations96
US7288802B2Oct 30, 2007
Virtual body-contacted trigate
IBM18 citations93
US8021943B2Sep 20, 2011
Simultaneously formed isolation trench and through-box contact for silicon-on-insulator technology
IBM22 citations92
US6965133B2Nov 15, 2005
Method of base formation in a BiCMOS process
IBM16 citations92
US6953726B2Oct 11, 2005
High-density split-gate FinFET
IBM17 citations92
US6869852B1Mar 22, 2005
Self-aligned raised extrinsic base bipolar transistor structure and method
IBM20 citations92
US7904868B2Mar 8, 2011
Structures including means for lateral current carrying capability improvement in semiconductor devices
IBM8 citations84
US7087506B2Aug 8, 2006
Method of forming freestanding semiconductor layer
IBM13 citations84
US7700446B2Apr 20, 2010
Virtual body-contacted trigate
IBM7 citations74
US7390721B2Jun 24, 2008
Methods of base formation in a BiCMOS process
IBM6 citations74
US7368355B2May 6, 2008
FinFET transistor and circuit
IBM4 citations74
US7964466B2Jun 21, 2011
FinFET transistor and circuit
IBM1 citations63
US7709892B2May 4, 2010
Semiconductor device having freestanding semiconductor layer
IBM3 citations63
US7470578B2Dec 30, 2008
Method of making a finFET having suppressed parasitic device characteristics
IBM4 citations63
US7453151B2Nov 18, 2008
Methods for lateral current carrying capability improvement in semiconductor devices
IBM5 citations63
US7777276B2Aug 17, 2010
FinFET transistor and circuit
IBM0 citations52
US7814454B2Oct 12, 2010
Selectable device options for characterizing semiconductor devices
IBM0 citations47