Inventor
UZOH CYPRIAN E
US58 patents
⚠️ This page may combine multiple inventors who share the name “UZOH CYPRIAN E”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
IBM
27 patentsUS6258707B1Jul 10, 2001
Triple damascence tungsten-copper interconnect structure
IBM152 citations99
US6234870B1May 22, 2001
Serial intelligent electro-chemical-mechanical wafer processor
IBM192 citations99
US6071388AJun 6, 2000
Electroplating workpiece fixture having liquid gap spacer
IBM190 citations99
US6066030AMay 23, 2000
Electroetch and chemical mechanical polishing equipment
IBM471 citations99
US5933753AAug 3, 1999
Open-bottomed via liner structure and method for fabricating same
IBM281 citations99
US5930669AJul 27, 1999
Continuous highly conductive metal wiring structures and method for fabricating the same
IBM301 citations99
US6429519B1Aug 6, 2002
Wiring structures containing interconnected metal and wiring levels including a continuous, single crystalline or polycrystalline conductive material having one or more twin boundaries
IBM105 citations98
US6344129B1Feb 5, 2002
Method for plating copper conductors and devices formed
IBM46 citations96
US6261426B1Jul 17, 2001
Method and apparatus for enhancing the uniformity of electrodeposition or electroetching
IBM77 citations96
US6180505B1Jan 30, 2001
Process for forming a copper-containing film
IBM71 citations96
US6123825ASep 26, 2000
Electromigration-resistant copper microstructure and process of making
IBM85 citations96
US6113759ASep 5, 2000
Anode design for semiconductor deposition having novel electrical contact assembly
IBM62 citations96
US6569783B2May 27, 2003
Graded composition diffusion barriers for chip wiring applications
IBM21 citations93
US6337151B1Jan 8, 2002
Graded composition diffusion barriers for chip wiring applications
IBM40 citations93
US6274935B2Aug 14, 2001
Copper wire-bonding pad
IBM17 citations93
US6235406B1May 22, 2001
Copper film including laminated impurities
IBM29 citations93
US6217734B1Apr 17, 2001
Electroplating electrical contacts
IBM30 citations93
US6126806AOct 3, 2000
Enhancing copper electromigration resistance with indium and oxygen lamination
IBM36 citations93
US6685814B2Feb 3, 2004
Method for enhancing the uniformity of electrodeposition or electroetching
IBM37 citations92
US6572982B1Jun 3, 2003
Electromigration-resistant copper microstructure
IBM15 citations92
US6251251B1Jun 26, 2001
Anode design for semiconductor deposition
IBM35 citations92
US6413854B1Jul 2, 2002
Method to build multi level structure
IBM35 citations89
US6380628B2Apr 30, 2002
Microstructure liner having improved adhesion
IBM17 citations81
US6258717B1Jul 10, 2001
Method to produce high quality metal fill in deep submicron vias and lines
IBM5 citations74
US6337218B1Jan 8, 2002
Method to test devices on high performance ULSI wafers
IBM7 citations73
US6331237B1Dec 18, 2001
Method of improving contact reliability for electroplating
IBM12 citations70
US6768203B1Jul 27, 2004
Open-bottomed via liner structure and method for fabricating same
IBM3 citations63
NOVELLUS SYSTEMS INC
9 patentsUS7211174B2May 1, 2007
Method and system to provide electrical contacts for electrotreating processes
NOVELLUS SYSTEMS INC10 citations83
US7238092B2Jul 3, 2007
Low-force electrochemical mechanical processing method and apparatus
NOVELLUS SYSTEMS INC16 citations82
US7416975B2Aug 26, 2008
Method of forming contact layers on substrates
NOVELLUS SYSTEMS INC7 citations74
US7704880B1Apr 27, 2010
Method of forming contact layers on substrates
NOVELLUS SYSTEMS INC2 citations63
US7503830B2Mar 17, 2009
Apparatus for reduction of defects in wet processed layers
NOVELLUS SYSTEMS INC2 citations63
US7244347B2Jul 17, 2007
Method and system to provide electrical contacts for electrotreating processes
NOVELLUS SYSTEMS INC5 citations63
US7195696B2Mar 27, 2007
Electrode assembly for electrochemical processing of workpiece
NOVELLUS SYSTEMS INC2 citations63
US7195700B2Mar 27, 2007
Method of electroplating copper layers with flat topography
NOVELLUS SYSTEMS INC3 citations63
US7250104B2Jul 31, 2007
Method and system for optically enhanced metal planarization
NOVELLUS SYSTEMS INC6 citations61
ASM NUTOOL INC
8 patentsUS6946066B2Sep 20, 2005
Multi step electrodeposition process for reducing defects and minimizing film thickness
ASM NUTOOL INC22 citations93
US6936154B2Aug 30, 2005
Planarity detection methods and apparatus for electrochemical mechanical processing systems
ASM NUTOOL INC26 citations93
US6866763B2Mar 15, 2005
Method and system monitoring and controlling film thickness profile during plating and electroetching
ASM NUTOOL INC19 citations84
US7189146B2Mar 13, 2007
Method for reduction of defects in wet processed layers
ASM NUTOOL INC9 citations74
US6861354B2Mar 1, 2005
Method and structure to reduce defects in integrated circuits and substrates
ASM NUTOOL INC7 citations74
US6821409B2Nov 23, 2004
Electroetching methods and systems using chemical and mechanical influence
ASM NUTOOL INC10 citations73
US7115510B2Oct 3, 2006
Method for electrochemically processing a workpiece
ASM NUTOOL INC3 citations63
US7097755B2Aug 29, 2006
Electrochemical mechanical processing with advancible sweeper
ASM NUTOOL INC3 citations61
NUTOOL INC
6 patentsUS6867136B2Mar 15, 2005
Method for electrochemically processing a workpiece
NUTOOL INC141 citations99
US6780772B2Aug 24, 2004
Method and system to provide electroplanarization of a workpiece with a conducting material layer
NUTOOL INC73 citations98
US6716084B2Apr 6, 2004
Carrier head for holding a wafer and allowing processing on a front face thereof to occur
NUTOOL INC20 citations92
US6695962B2Feb 24, 2004
Anode designs for planar metal deposits with enhanced electrolyte solution blending and process of supplying electrolyte solution using such designs
NUTOOL INC10 citations74
US6649523B2Nov 18, 2003
Method and system to provide material removal and planarization employing a reactive pad
NUTOOL INC10 citations74
US6777338B2Aug 17, 2004
Edge and bevel cleaning process and system
NUTOOL INC7 citations73
Showing the top 50 of 58 patents by PatentIndex Score.