P

Inventor

UZOH CYPRIAN E

US58 patents
⚠️ This page may combine multiple inventors who share the name “UZOH CYPRIAN E”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

IBM

27 patents
US6258707B1Jul 10, 2001

Triple damascence tungsten-copper interconnect structure

IBM152 citations99
US6234870B1May 22, 2001

Serial intelligent electro-chemical-mechanical wafer processor

IBM192 citations99
US6071388AJun 6, 2000

Electroplating workpiece fixture having liquid gap spacer

IBM190 citations99
US6066030AMay 23, 2000

Electroetch and chemical mechanical polishing equipment

IBM471 citations99
US5933753AAug 3, 1999

Open-bottomed via liner structure and method for fabricating same

IBM281 citations99
US5930669AJul 27, 1999

Continuous highly conductive metal wiring structures and method for fabricating the same

IBM301 citations99
US6429519B1Aug 6, 2002

Wiring structures containing interconnected metal and wiring levels including a continuous, single crystalline or polycrystalline conductive material having one or more twin boundaries

IBM105 citations98
US6344129B1Feb 5, 2002

Method for plating copper conductors and devices formed

IBM46 citations96
US6261426B1Jul 17, 2001

Method and apparatus for enhancing the uniformity of electrodeposition or electroetching

IBM77 citations96
US6180505B1Jan 30, 2001

Process for forming a copper-containing film

IBM71 citations96
US6123825ASep 26, 2000

Electromigration-resistant copper microstructure and process of making

IBM85 citations96
US6113759ASep 5, 2000

Anode design for semiconductor deposition having novel electrical contact assembly

IBM62 citations96
US6569783B2May 27, 2003

Graded composition diffusion barriers for chip wiring applications

IBM21 citations93
US6337151B1Jan 8, 2002

Graded composition diffusion barriers for chip wiring applications

IBM40 citations93
US6274935B2Aug 14, 2001

Copper wire-bonding pad

IBM17 citations93
US6235406B1May 22, 2001

Copper film including laminated impurities

IBM29 citations93
US6217734B1Apr 17, 2001

Electroplating electrical contacts

IBM30 citations93
US6126806AOct 3, 2000

Enhancing copper electromigration resistance with indium and oxygen lamination

IBM36 citations93
US6685814B2Feb 3, 2004

Method for enhancing the uniformity of electrodeposition or electroetching

IBM37 citations92
US6572982B1Jun 3, 2003

Electromigration-resistant copper microstructure

IBM15 citations92
US6251251B1Jun 26, 2001

Anode design for semiconductor deposition

IBM35 citations92
US6413854B1Jul 2, 2002

Method to build multi level structure

IBM35 citations89
US6380628B2Apr 30, 2002

Microstructure liner having improved adhesion

IBM17 citations81
US6258717B1Jul 10, 2001

Method to produce high quality metal fill in deep submicron vias and lines

IBM5 citations74
US6337218B1Jan 8, 2002

Method to test devices on high performance ULSI wafers

IBM7 citations73
US6331237B1Dec 18, 2001

Method of improving contact reliability for electroplating

IBM12 citations70
US6768203B1Jul 27, 2004

Open-bottomed via liner structure and method for fabricating same

IBM3 citations63

NOVELLUS SYSTEMS INC

9 patents

ASM NUTOOL INC

8 patents

NUTOOL INC

6 patents

Showing the top 50 of 58 patents by PatentIndex Score.