Inventor

TSUCHIYA NORIHIKO

JP18 patents

⚠️ This page may combine multiple inventors who share the name “TSUCHIYA NORIHIKO”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

TSUCHIYA NORIHIKO

TOSHIBA KK

Semiconductor silicon wafer and process for producing it

Process for producing Semiconductor silicon wafer

Substrate having shallow trench isolation

Wafer processsing method for manufacturing wafers having contaminant-gettering damage on one surface

Semiconductor wafer with ID mark, equipment for and method of manufacturing semiconductor device from them

Defect-position identifying method for semiconductor substrate

Method of growing thin film on semiconductor substrate and its manufacturing apparatus

Semiconductor device and a method for manufacturing the same

Semiconductor wafer treatment method, semiconductor wafer inspection method, semiconductor device development method and semiconductor wafer treatment apparatus

Method for evaluating an SOI substrate, evaluation processor, and method for manufacturing a semiconductor device

Method of manufacturing a substrate having shallow trench isolation

Semiconductor wafer and method of manufacturing the same

Dielectrically isolated substrate and method for manufacturing the same

System for analyzing metal impurity on the surface of a single crystal semiconductor by using total reflection of x-rays fluorescence

System and method for controlling manufacturing processes, and method for manufacturing a semiconductor device

Method of inspecting semiconductor wafer

KABUSHIKIA KAISHA TOSHIBA

Semiconductor wafer with ID mark, equipment for and method of manufacturing semiconductor device from them

TOSHIBA MEMORY CORP

Etching method and etchant