P

Inventor

YANG TIEN-CHUN

US79 patents
⚠️ This page may combine multiple inventors who share the name “YANG TIEN-CHUN”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

ADVANCED MICRO DEVICES INC

13 patents
US6825684B1Nov 30, 2004

Hot carrier oxide qualification method

ADVANCED MICRO DEVICES INC14 citations84
US6486682B1Nov 26, 2002

Determination of dielectric constants of thin dielectric materials in a MOS (metal oxide semiconductor) stack

ADVANCED MICRO DEVICES INC14 citations84
US6859748B1Feb 22, 2005

Test structure for measuring effect of trench isolation on oxide in a memory device

ADVANCED MICRO DEVICES INC7 citations74
US6756806B1Jun 29, 2004

Method of determining location of gate oxide breakdown of MOSFET by measuring currents

ADVANCED MICRO DEVICES INC10 citations74
US6734080B1May 11, 2004

Semiconductor isolation material deposition system and method

ADVANCED MICRO DEVICES INC8 citations74
US6734028B1May 11, 2004

Method of detecting shallow trench isolation corner thinning by electrical stress

ADVANCED MICRO DEVICES INC9 citations74
US6593590B1Jul 15, 2003

Test structure apparatus for measuring standby current in flash memory devices

ADVANCED MICRO DEVICES INC10 citations74
US6472236B1Oct 29, 2002

Determination of effective oxide thickness of a plurality of dielectric materials in a MOS stack

ADVANCED MICRO DEVICES INC12 citations74
US6728160B1Apr 27, 2004

Path gate driver circuit

ADVANCED MICRO DEVICES INC8 citations71
US6884638B1Apr 26, 2005

Method of fabricating a flash memory semiconductor device by determining the active region width between shallow trench isolation structures using an overdrive current measurement technique and a device thereby fabricated

ADVANCED MICRO DEVICES INC3 citations63
US6856160B1Feb 15, 2005

Maximum VCC calculation method for hot carrier qualification

ADVANCED MICRO DEVICES INC4 citations63
US6825083B1Nov 30, 2004

Method for reducing shallow trench isolation edge thinning on thin gate oxides to improve peripheral transistor reliability and performance for high performance flash memory devices

ADVANCED MICRO DEVICES INC5 citations63
US6731130B1May 4, 2004

Method of determining gate oxide thickness of an operational MOSFET

ADVANCED MICRO DEVICES INC6 citations63

TAIWAN SEMICONDUCTOR MFG CO LTD

12 patents

TAIWAN SEMICONDUCTOR MFG

7 patents

YANG TIEN-CHUN

5 patents

SPANSION LLC

3 patents

LIN CHIH-CHANG

3 patents

LIN YVONNE

2 patents

HUANG MING-CHIEH

2 patents

FASL LLC

1 patent

SWEI STEVEN

1 patent

YANG TIEN CHUN

1 patent

Showing the top 50 of 79 patents by PatentIndex Score.