Inventor
YANG TIEN-CHUN
US79 patents
⚠️ This page may combine multiple inventors who share the name “YANG TIEN-CHUN”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
ADVANCED MICRO DEVICES INC
13 patentsUS6825684B1Nov 30, 2004
Hot carrier oxide qualification method
ADVANCED MICRO DEVICES INC14 citations84
US6486682B1Nov 26, 2002
Determination of dielectric constants of thin dielectric materials in a MOS (metal oxide semiconductor) stack
ADVANCED MICRO DEVICES INC14 citations84
US6859748B1Feb 22, 2005
Test structure for measuring effect of trench isolation on oxide in a memory device
ADVANCED MICRO DEVICES INC7 citations74
US6756806B1Jun 29, 2004
Method of determining location of gate oxide breakdown of MOSFET by measuring currents
ADVANCED MICRO DEVICES INC10 citations74
US6734080B1May 11, 2004
Semiconductor isolation material deposition system and method
ADVANCED MICRO DEVICES INC8 citations74
US6734028B1May 11, 2004
Method of detecting shallow trench isolation corner thinning by electrical stress
ADVANCED MICRO DEVICES INC9 citations74
US6593590B1Jul 15, 2003
Test structure apparatus for measuring standby current in flash memory devices
ADVANCED MICRO DEVICES INC10 citations74
US6472236B1Oct 29, 2002
Determination of effective oxide thickness of a plurality of dielectric materials in a MOS stack
ADVANCED MICRO DEVICES INC12 citations74
US6728160B1Apr 27, 2004
Path gate driver circuit
ADVANCED MICRO DEVICES INC8 citations71
US6884638B1Apr 26, 2005
Method of fabricating a flash memory semiconductor device by determining the active region width between shallow trench isolation structures using an overdrive current measurement technique and a device thereby fabricated
ADVANCED MICRO DEVICES INC3 citations63
US6856160B1Feb 15, 2005
Maximum VCC calculation method for hot carrier qualification
ADVANCED MICRO DEVICES INC4 citations63
US6825083B1Nov 30, 2004
Method for reducing shallow trench isolation edge thinning on thin gate oxides to improve peripheral transistor reliability and performance for high performance flash memory devices
ADVANCED MICRO DEVICES INC5 citations63
US6731130B1May 4, 2004
Method of determining gate oxide thickness of an operational MOSFET
ADVANCED MICRO DEVICES INC6 citations63
TAIWAN SEMICONDUCTOR MFG CO LTD
12 patentsUS9831860B2Nov 28, 2017
Clock generation circuit
TAIWAN SEMICONDUCTOR MFG CO LTD7 citations84
US9787176B2Oct 10, 2017
Charge pump
TAIWAN SEMICONDUCTOR MFG CO LTD13 citations84
US11677388B2Jun 13, 2023
Latch circuits and method of operating a latch circuit
TAIWAN SEMICONDUCTOR MFG CO LTD2 citations73
US10483954B2Nov 19, 2019
Clock generation circuit and charge pumping system
TAIWAN SEMICONDUCTOR MFG CO LTD1 citations73
US10355682B2Jul 16, 2019
Clock generation circuit and charge pumping system
TAIWAN SEMICONDUCTOR MFG CO LTD1 citations73
US9966935B2May 8, 2018
Latch circuit and method of operating the latch circuit
TAIWAN SEMICONDUCTOR MFG CO LTD2 citations73
US9923457B2Mar 20, 2018
Regulated power converter and method of operating the same
TAIWAN SEMICONDUCTOR MFG CO LTD3 citations73
US9584107B2Feb 28, 2017
Delay line circuit
TAIWAN SEMICONDUCTOR MFG CO LTD3 citations73
US11657881B2May 23, 2023
Dynamic reference current memory array and method
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations63
US11094384B2Aug 17, 2021
Dynamic reference current sensing
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations63
US9047956B2Jun 2, 2015
Concurrent operation of plural flash memories
TAIWAN SEMICONDUCTOR MFG CO LTD1 citations63
US12483228B2Nov 25, 2025
Latch circuit and method of operating the same
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations62
TAIWAN SEMICONDUCTOR MFG
7 patentsUS8004354B1Aug 23, 2011
Automatic level control
TAIWAN SEMICONDUCTOR MFG31 citations89
US7961050B1Jun 14, 2011
Integrated circuits including an equalizer and operating methods thereof
TAIWAN SEMICONDUCTOR MFG17 citations84
US9275719B2Mar 1, 2016
Voltage regulator
TAIWAN SEMICONDUCTOR MFG2 citations63
US8797091B2Aug 5, 2014
Integrated circuits with bi-directional charge pumps
TAIWAN SEMICONDUCTOR MFG2 citations63
US8565023B2Oct 22, 2013
Concurrent operation of plural flash memories
TAIWAN SEMICONDUCTOR MFG2 citations63
US8354862B2Jan 15, 2013
Phase-lock assistant circuitry
TAIWAN SEMICONDUCTOR MFG2 citations63
US8929137B2Jan 6, 2015
Operating method of memory having redundancy circuitry
TAIWAN SEMICONDUCTOR MFG1 citations62
YANG TIEN-CHUN
5 patentsUS9437257B2Sep 6, 2016
Sensing circuit, memory device and data detecting method
YANG TIEN-CHUN17 citations84
US8223576B2Jul 17, 2012
Regulators regulating charge pump and memory circuits thereof
YANG TIEN-CHUN8 citations84
US8736351B2May 27, 2014
Negative charge pump
YANG TIEN-CHUN4 citations72
US8456942B2Jun 4, 2013
Regulators regulating charge pump and memory circuits thereof
YANG TIEN-CHUN2 citations62
US8238178B2Aug 7, 2012
Redundancy circuits and operating methods thereof
YANG TIEN-CHUN1 citations61
SPANSION LLC
3 patentsUS7724075B2May 25, 2010
Method to provide a higher reference voltage at a lower power supply in flash memory devices
SPANSION LLC27 citations93
US7505298B2Mar 17, 2009
Transfer of non-associated information on flash memory devices
SPANSION LLC13 citations84
US7026843B1Apr 11, 2006
Flexible cascode amplifier circuit with high gain for flash memory cells
SPANSION LLC3 citations63
LIN CHIH-CHANG
3 patentsLIN YVONNE
2 patentsHUANG MING-CHIEH
2 patentsFASL LLC
1 patentSWEI STEVEN
1 patentYANG TIEN CHUN
1 patentShowing the top 50 of 79 patents by PatentIndex Score.