P

Inventor

KIRKPATRICK BRIAN K

US52 patents
⚠️ This page may combine multiple inventors who share the name “KIRKPATRICK BRIAN K”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

TEXAS INSTRUMENTS INC

38 patents
US7838356B2Nov 23, 2010

Gate dielectric first replacement gate processes and integrated circuits therefrom

TEXAS INSTRUMENTS INC21 citations92
US6720247B2Apr 13, 2004

Pre-pattern surface modification for low-k dielectrics using A H2 plasma

TEXAS INSTRUMENTS INC48 citations92
US9070785B1Jun 30, 2015

High-k / metal gate CMOS transistors with TiN gates

TEXAS INSTRUMENTS INC10 citations84
US8372703B2Feb 12, 2013

Gate dielectric first replacement gate processes and integrated circuits therefrom

TEXAS INSTRUMENTS INC10 citations84
US9721847B2Aug 1, 2017

High-k / metal gate CMOS transistors with TiN gates

TEXAS INSTRUMENTS INC2 citations73
US7732284B1Jun 8, 2010

Post high-k dielectric/metal gate clean

TEXAS INSTRUMENTS INC7 citations73
US7049242B2May 23, 2006

Post high voltage gate dielectric pattern plasma surface treatment

TEXAS INSTRUMENTS INC6 citations73
US7018925B2Mar 28, 2006

Post high voltage gate oxide pattern high-vacuum outgas surface treatment

TEXAS INSTRUMENTS INC6 citations73
US6287983B2Sep 11, 2001

Selective nitride etching with silicate ion pre-loading

TEXAS INSTRUMENTS INC10 citations69
US6921721B2Jul 26, 2005

Post plasma clean process for a hardmask

TEXAS INSTRUMENTS INC7 citations67
US6797644B2Sep 28, 2004

Method to reduce charge interface traps and channel hot carrier degradation

TEXAS INSTRUMENTS INC9 citations64
US7943456B2May 17, 2011

Selective wet etch process for CMOS ICs having embedded strain inducing regions and integrated circuits therefrom

TEXAS INSTRUMENTS INC4 citations63
US7927993B2Apr 19, 2011

Cross-contamination control for semiconductor process flows having metal comprising gate electrodes

TEXAS INSTRUMENTS INC2 citations63
US8043921B2Oct 25, 2011

Nitride removal while protecting semiconductor surfaces for forming shallow junctions

TEXAS INSTRUMENTS INC4 citations62
US7339240B2Mar 4, 2008

Dual-gate integrated circuit semiconductor device

TEXAS INSTRUMENTS INC2 citations62
US7384869B2Jun 10, 2008

Protection of silicon from phosphoric acid using thick chemical oxide

TEXAS INSTRUMENTS INC5 citations60
US6831008B2Dec 14, 2004

Nickel silicide—silicon nitride adhesion through surface passivation

TEXAS INSTRUMENTS INC5 citations60
US9490143B1Nov 8, 2016

Method of fabricating semiconductors

TEXAS INSTRUMENTS INC2 citations59
US11942359B2Mar 26, 2024

Reduced semiconductor wafer bow and warpage

TEXAS INSTRUMENTS INC0 citations58
US11205575B2Dec 21, 2021

Method for stripping one or more layers from a semiconductor wafer

TEXAS INSTRUMENTS INC0 citations53
US10483261B2Nov 19, 2019

Integrated circuit having chemically modified spacer surface

TEXAS INSTRUMENTS INC0 citations52
US9620423B2Apr 11, 2017

Integrated circuit having chemically modified spacer surface

TEXAS INSTRUMENTS INC0 citations52
US8748992B2Jun 10, 2014

MOS transistors including SiON gate dielectric with enhanced nitrogen concentration at its sidewalls

TEXAS INSTRUMENTS INC0 citations52
US7402524B2Jul 22, 2008

Post high voltage gate oxide pattern high-vacuum outgas surface treatment

TEXAS INSTRUMENTS INC0 citations51
US6861348B2Mar 1, 2005

Pre-pattern surface modification of low-k dielectrics

TEXAS INSTRUMENTS INC1 citations51
US9768078B2Sep 19, 2017

Inner L-spacer for replacement gate flow

TEXAS INSTRUMENTS INC0 citations50
US9362375B2Jun 7, 2016

Inner L-spacer for replacement gate flow

TEXAS INSTRUMENTS INC0 citations50
US9178037B2Nov 3, 2015

Inner L-spacer for replacement gate flow

TEXAS INSTRUMENTS INC0 citations50
US9087917B2Jul 21, 2015

Inner L-spacer for replacement gate flow

TEXAS INSTRUMENTS INC0 citations50
US7998865B2Aug 16, 2011

Systems and methods for removing wafer edge residue and debris using a residue remover mechanism

TEXAS INSTRUMENTS INC0 citations50
US9881795B2Jan 30, 2018

Method of fabricating semiconductors

TEXAS INSTRUMENTS INC0 citations48
US7504339B2Mar 17, 2009

Method to form shallow trench isolation with rounded upper corner for advanced semiconductor circuits

TEXAS INSTRUMENTS INC1 citations48
US6917093B2Jul 12, 2005

Method to form shallow trench isolation with rounded upper corner for advanced semiconductor circuits

TEXAS INSTRUMENTS INC1 citations48
US11205578B2Dec 21, 2021

Dopant anneal with stabilization step for IC with matched devices

TEXAS INSTRUMENTS INC0 citations45
US11239346B2Feb 1, 2022

Split gate memory cell fabrication and system

TEXAS INSTRUMENTS INC0 citations44
US7968443B2Jun 28, 2011

Cross-contamination control for processing of circuits comprising MOS devices that include metal comprising high-K dielectrics

TEXAS INSTRUMENTS INC0 citations42
US6869862B2Mar 22, 2005

Method for improving a physical property defect value of a gate dielectric

TEXAS INSTRUMENTS INC0 citations42
US9224657B2Dec 29, 2015

Hard mask for source/drain epitaxy control

TEXAS INSTRUMENTS INC0 citations40

APPLIED MATERIALS INC

6 patents

KIRKPATRICK BRIAN K

4 patents

BARNA GABRIEL GEORGE

1 patent

PRINS STEVEN L

1 patent

Showing the top 50 of 52 patents by PatentIndex Score.