Inventor
KIRKPATRICK BRIAN K
US52 patents
⚠️ This page may combine multiple inventors who share the name “KIRKPATRICK BRIAN K”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
TEXAS INSTRUMENTS INC
38 patentsUS7838356B2Nov 23, 2010
Gate dielectric first replacement gate processes and integrated circuits therefrom
TEXAS INSTRUMENTS INC21 citations92
US6720247B2Apr 13, 2004
Pre-pattern surface modification for low-k dielectrics using A H2 plasma
TEXAS INSTRUMENTS INC48 citations92
US9070785B1Jun 30, 2015
High-k / metal gate CMOS transistors with TiN gates
TEXAS INSTRUMENTS INC10 citations84
US8372703B2Feb 12, 2013
Gate dielectric first replacement gate processes and integrated circuits therefrom
TEXAS INSTRUMENTS INC10 citations84
US9721847B2Aug 1, 2017
High-k / metal gate CMOS transistors with TiN gates
TEXAS INSTRUMENTS INC2 citations73
US7732284B1Jun 8, 2010
Post high-k dielectric/metal gate clean
TEXAS INSTRUMENTS INC7 citations73
US7049242B2May 23, 2006
Post high voltage gate dielectric pattern plasma surface treatment
TEXAS INSTRUMENTS INC6 citations73
US7018925B2Mar 28, 2006
Post high voltage gate oxide pattern high-vacuum outgas surface treatment
TEXAS INSTRUMENTS INC6 citations73
US6287983B2Sep 11, 2001
Selective nitride etching with silicate ion pre-loading
TEXAS INSTRUMENTS INC10 citations69
US6921721B2Jul 26, 2005
Post plasma clean process for a hardmask
TEXAS INSTRUMENTS INC7 citations67
US6797644B2Sep 28, 2004
Method to reduce charge interface traps and channel hot carrier degradation
TEXAS INSTRUMENTS INC9 citations64
US7943456B2May 17, 2011
Selective wet etch process for CMOS ICs having embedded strain inducing regions and integrated circuits therefrom
TEXAS INSTRUMENTS INC4 citations63
US7927993B2Apr 19, 2011
Cross-contamination control for semiconductor process flows having metal comprising gate electrodes
TEXAS INSTRUMENTS INC2 citations63
US8043921B2Oct 25, 2011
Nitride removal while protecting semiconductor surfaces for forming shallow junctions
TEXAS INSTRUMENTS INC4 citations62
US7339240B2Mar 4, 2008
Dual-gate integrated circuit semiconductor device
TEXAS INSTRUMENTS INC2 citations62
US7384869B2Jun 10, 2008
Protection of silicon from phosphoric acid using thick chemical oxide
TEXAS INSTRUMENTS INC5 citations60
US6831008B2Dec 14, 2004
Nickel silicide—silicon nitride adhesion through surface passivation
TEXAS INSTRUMENTS INC5 citations60
US9490143B1Nov 8, 2016
Method of fabricating semiconductors
TEXAS INSTRUMENTS INC2 citations59
US11942359B2Mar 26, 2024
Reduced semiconductor wafer bow and warpage
TEXAS INSTRUMENTS INC0 citations58
US11205575B2Dec 21, 2021
Method for stripping one or more layers from a semiconductor wafer
TEXAS INSTRUMENTS INC0 citations53
US10483261B2Nov 19, 2019
Integrated circuit having chemically modified spacer surface
TEXAS INSTRUMENTS INC0 citations52
US9620423B2Apr 11, 2017
Integrated circuit having chemically modified spacer surface
TEXAS INSTRUMENTS INC0 citations52
US8748992B2Jun 10, 2014
MOS transistors including SiON gate dielectric with enhanced nitrogen concentration at its sidewalls
TEXAS INSTRUMENTS INC0 citations52
US7402524B2Jul 22, 2008
Post high voltage gate oxide pattern high-vacuum outgas surface treatment
TEXAS INSTRUMENTS INC0 citations51
US6861348B2Mar 1, 2005
Pre-pattern surface modification of low-k dielectrics
TEXAS INSTRUMENTS INC1 citations51
US9768078B2Sep 19, 2017
Inner L-spacer for replacement gate flow
TEXAS INSTRUMENTS INC0 citations50
US9362375B2Jun 7, 2016
Inner L-spacer for replacement gate flow
TEXAS INSTRUMENTS INC0 citations50
US9178037B2Nov 3, 2015
Inner L-spacer for replacement gate flow
TEXAS INSTRUMENTS INC0 citations50
US9087917B2Jul 21, 2015
Inner L-spacer for replacement gate flow
TEXAS INSTRUMENTS INC0 citations50
US7998865B2Aug 16, 2011
Systems and methods for removing wafer edge residue and debris using a residue remover mechanism
TEXAS INSTRUMENTS INC0 citations50
US9881795B2Jan 30, 2018
Method of fabricating semiconductors
TEXAS INSTRUMENTS INC0 citations48
US7504339B2Mar 17, 2009
Method to form shallow trench isolation with rounded upper corner for advanced semiconductor circuits
TEXAS INSTRUMENTS INC1 citations48
US6917093B2Jul 12, 2005
Method to form shallow trench isolation with rounded upper corner for advanced semiconductor circuits
TEXAS INSTRUMENTS INC1 citations48
US11205578B2Dec 21, 2021
Dopant anneal with stabilization step for IC with matched devices
TEXAS INSTRUMENTS INC0 citations45
US11239346B2Feb 1, 2022
Split gate memory cell fabrication and system
TEXAS INSTRUMENTS INC0 citations44
US7968443B2Jun 28, 2011
Cross-contamination control for processing of circuits comprising MOS devices that include metal comprising high-K dielectrics
TEXAS INSTRUMENTS INC0 citations42
US6869862B2Mar 22, 2005
Method for improving a physical property defect value of a gate dielectric
TEXAS INSTRUMENTS INC0 citations42
US9224657B2Dec 29, 2015
Hard mask for source/drain epitaxy control
TEXAS INSTRUMENTS INC0 citations40
APPLIED MATERIALS INC
6 patentsUS12480215B2Nov 25, 2025
Integratead wet clean for bevel treatments
APPLIED MATERIALS INC0 citations62
US12051599B2Jul 30, 2024
Cleaning method with in-line SPM processing
APPLIED MATERIALS INC0 citations60
US12027382B2Jul 2, 2024
Surface cleaning with directed high pressure chemistry
APPLIED MATERIALS INC0 citations60
US11682567B2Jun 20, 2023
Cleaning system with in-line SPM processing
APPLIED MATERIALS INC0 citations60
US12575357B2Mar 10, 2026
Integrated wet clean for gate stack development
APPLIED MATERIALS INC0 citations52
US12538737B2Jan 27, 2026
Integrated wet clean for epitaxial growth
APPLIED MATERIALS INC0 citations52
KIRKPATRICK BRIAN K
4 patentsUS8450221B2May 28, 2013
Method of forming MOS transistors including SiON gate dielectric with enhanced nitrogen concentration at its sidewalls
KIRKPATRICK BRIAN K2 citations61
US8618661B2Dec 31, 2013
Die having coefficient of thermal expansion graded layer
KIRKPATRICK BRIAN K2 citations60
US9496359B2Nov 15, 2016
Integrated circuit having chemically modified spacer surface
KIRKPATRICK BRIAN K0 citations51
US8252609B2Aug 28, 2012
Curvature reduction for semiconductor wafers
KIRKPATRICK BRIAN K0 citations45
BARNA GABRIEL GEORGE
1 patentPRINS STEVEN L
1 patentShowing the top 50 of 52 patents by PatentIndex Score.