P

Inventor

CHENG ANHAO

TW18 patents

Patents

18 patents
US10541218B2Jan 21, 2020

Redistribution layer structure and fabrication method therefor

TAIWAN SEMICONDUCTOR MFG CO LTD5 citations82
US11373970B2Jun 28, 2022

Semiconductor device having a redistribution line

TAIWAN SEMICONDUCTOR MFG CO LTD2 citations71
US11227935B2Jan 18, 2022

Gate structure and methods thereof

TAIWAN SEMICONDUCTOR MFG CO LTD3 citations71
US10811314B2Oct 20, 2020

Method of forming semiconductor device having a dual material redistribution line

TAIWAN SEMICONDUCTOR MFG CO LTD2 citations71
US10431664B2Oct 1, 2019

Gate structure and methods thereof

TAIWAN SEMICONDUCTOR MFG CO LTD5 citations71
US9991189B2Jun 5, 2018

Semiconductor device having a dual material redistribution line

TAIWAN SEMICONDUCTOR MFG CO LTD2 citations71
US12363987B2Jul 15, 2025

Partial metal grain size control to improve CMP loading effect

TAIWAN SEMICONDUCTOR MFG CO LTD0 citations62
US12218181B2Feb 4, 2025

Barrier layer for metal insulator metal capacitors

TAIWAN SEMICONDUCTOR MFG CO LTD0 citations62
US12211890B2Jan 28, 2025

Barrier layer for metal insulator metal capacitors

TAIWAN SEMICONDUCTOR MFG CO LTD0 citations62
US11978781B2May 7, 2024

Partial metal grain size control to improve CMP loading effect

TAIWAN SEMICONDUCTOR MFG CO LTD0 citations62
US12400948B2Aug 26, 2025

Structure and method for interlevel dielectric layer with regions of differing dielectric constant

TAIWAN SEMICONDUCTOR MFG CO LTD0 citations61
US12166104B2Dec 10, 2024

Gate structure and methods thereof

TAIWAN SEMICONDUCTOR MFG CO LTD0 citations61
US12027447B2Jul 2, 2024

Semiconductor device having a dual material redistribution line

TAIWAN SEMICONDUCTOR MFG CO LTD0 citations61
US11955421B2Apr 9, 2024

Structure and method for interlevel dielectric layer with regions of differing dielectric constant

TAIWAN SEMICONDUCTOR MFG CO LTD0 citations61
US11799014B2Oct 24, 2023

Gate structure and methods thereof

TAIWAN SEMICONDUCTOR MFG CO LTD0 citations61
US11410882B2Aug 9, 2022

Method of forming semiconductor device having a dual material redistribution line and semiconductor device

TAIWAN SEMICONDUCTOR MFG CO LTD0 citations61
US12074024B2Aug 27, 2024

Semiconductor devices and methods of manufacturing thereof

TAIWAN SEMICONDUCTOR MFG CO LTD0 citations56
US12581711B2Mar 17, 2026

Semiconductor structure and method of manufacturing the same

TAIWAN SEMICONDUCTOR MFG CO LTD0 citations51