Inventor
SRIRAM SAPTHARISHI
US54 patents
⚠️ This page may combine multiple inventors who share the name “SRIRAM SAPTHARISHI”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
CREE INC
31 patentsUS7265399B2Sep 4, 2007
Asymetric layout structures for transistors and methods of fabricating the same
CREE INC78 citations97
US6956239B2Oct 18, 2005
Transistors having buried p-type layers beneath the source region
CREE INC43 citations96
US9847411B2Dec 19, 2017
Recessed field plate transistor structures
CREE INC26 citations94
US7348612B2Mar 25, 2008
Metal-semiconductor field effect transistors (MESFETs) having drains coupled to the substrate and methods of fabricating the same
CREE INC40 citations93
US7525122B2Apr 28, 2009
Passivation of wide band-gap based semiconductor devices with hydrogen-free sputtered nitrides
CREE INC22 citations92
US6906350B2Jun 14, 2005
Delta doped silicon carbide metal-semiconductor field effect transistors having a gate disposed in a double recess structure
CREE INC16 citations92
US6902964B2Jun 7, 2005
Methods of fabricating delta doped silicon carbide metal-semiconductor field effect transistors having a gate disposed in a double recess structure
CREE INC21 citations92
US10892356B2Jan 12, 2021
Group III-nitride high-electron mobility transistors with buried p-type layers and process for making the same
CREE INC9 citations86
US9755059B2Sep 5, 2017
Cascode structures with GaN cap layers
CREE INC10 citations84
US9679981B2Jun 13, 2017
Cascode structures for GaN HEMTs
CREE INC7 citations84
US9306009B2Apr 5, 2016
Mix doping of a semi-insulating Group III nitride
CREE INC8 citations84
US7858460B2Dec 28, 2010
Passivation of wide band-gap based semiconductor devices with hydrogen-free sputtered nitrides
CREE INC10 citations83
US10516043B1Dec 24, 2019
Monolithic microwave integrated circuits having both enhancement-mode and depletion mode transistors
CREE INC10 citations82
US7646043B2Jan 12, 2010
Transistors having buried p-type layers coupled to the gate
CREE INC14 citations81
US7402844B2Jul 22, 2008
Metal semiconductor field effect transistors (MESFETS) having channels of varying thicknesses and related methods
CREE INC7 citations74
US10840334B2Nov 17, 2020
Gallium nitride high-electron mobility transistors with deep implanted p-type layers in silicon carbide substrates for power switching and radio frequency applications and process for making the same
CREE INC2 citations73
US10615273B2Apr 7, 2020
Semiconductor devices having a plurality of unit cell transistors that have smoothed turn-on behavior and improved linearity
CREE INC3 citations72
US11929428B2Mar 12, 2024
Circuits and group III-nitride high-electron mobility transistors with buried p-type layers improving overload recovery and process for implementing the same
CREE INC2 citations71
US10861963B2Dec 8, 2020
Monolithic microwave integrated circuits having both enhancement-mode and depletion mode transistors
CREE INC1 citations71
US9608078B2Mar 28, 2017
Semiconductor device with improved field plate
CREE INC2 citations71
US12402346B2Aug 26, 2025
Circuits and group III-nitride transistors with buried p-layers and controlled gate voltages and methods thereof
CREE INC0 citations62
US11862719B2Jan 2, 2024
Group III-nitride high-electron mobility transistors with buried p-type layers and process for making the same
CREE INC0 citations62
US10192980B2Jan 29, 2019
Gallium nitride high-electron mobility transistors with deep implanted p-type layers in silicon carbide substrates for power switching and radio frequency applications and process for making the same
CREE INC1 citations62
US11594628B2Feb 28, 2023
Monolithic microwave integrated circuits having both enhancement-mode and depletion mode transistors
CREE INC0 citations61
US10354879B2Jul 16, 2019
Depletion mode semiconductor devices including current dependent resistance
CREE INC1 citations61
US10978583B2Apr 13, 2021
Semiconductor devices having a plurality of unit cell transistors that have smoothed turn-on behavior and improved linearity
CREE INC0 citations60
US12557322B2Feb 17, 2026
Group III-nitride transistors with back barrier structures and buried p-type layers and methods thereof
CREE INC0 citations52
US9356129B2May 31, 2016
Tunnel junction field effect transistors having self-aligned source and gate electrodes and methods of forming the same
CREE INC0 citations52
US9202903B2Dec 1, 2015
Tunnel junction field effect transistors having self-aligned source and gate electrodes and methods of forming the same
CREE INC1 citations52
US7326962B2Feb 5, 2008
Transistors having buried N-type and P-type regions beneath the source region and methods of fabricating the same
CREE INC1 citations52
US7297580B2Nov 20, 2007
Methods of fabricating transistors having buried p-type layers beneath the source region
CREE INC0 citations52
WOLFSPEED INC
8 patentsUS11476359B2Oct 18, 2022
Structures for reducing electron concentration and process for reducing electron concentration
WOLFSPEED INC2 citations73
US11658234B2May 23, 2023
Field effect transistor with enhanced reliability
WOLFSPEED INC2 citations72
US12324179B2Jun 3, 2025
Group III-nitride high-electron mobility transistors with a buried metallic conductive material layer and process for making the same
WOLFSPEED INC1 citations64
US12484244B2Nov 25, 2025
Group III-nitride high-electron mobility transistors with gate connected buried p-type layers and process for making the same
WOLFSPEED INC0 citations62
US12477770B2Nov 18, 2025
Group III-nitride high-electron mobility transistors with buried p-type layers and process for making the same
WOLFSPEED INC0 citations62
US12142674B2Nov 12, 2024
Gallium Nitride high-electron mobility transistors with p-type layers and process for making the same
WOLFSPEED INC0 citations62
US11244831B2Feb 8, 2022
Depletion mode semiconductor devices including current dependent resistance
WOLFSPEED INC0 citations61
US12402348B2Aug 26, 2025
Field effect transistor with selective channel layer doping
WOLFSPEED INC0 citations52
NORTHROP GRUMMAN CORP
4 patentsUS5925895AJul 20, 1999
Silicon carbide power MESFET with surface effect supressive layer
NORTHROP GRUMMAN CORP75 citations96
US5825076AOct 20, 1998
Integrated circuit non-etch technique for forming vias in a semiconductor wafer and a semiconductor wafer having vias formed therein using non-etch technique
NORTHROP GRUMMAN CORP61 citations94
US5612547AMar 18, 1997
Silicon carbide static induction transistor
NORTHROP GRUMMAN CORP26 citations92
US5821576AOct 13, 1998
Silicon carbide power field effect transistor
NORTHROP GRUMMAN CORP18 citations84
WESTINGHOUSE ELECTRIC CORP
2 patentsSMITH JR THOMAS J
1 patentCREE FAYETTEVILLE INC
1 patentMACOM TECH SOLUTIONS HOLDINGS INC
1 patentSRIRAM SAPTHARISHI
1 patentHAGLEITNER HELMUT
1 patentShowing the top 50 of 54 patents by PatentIndex Score.