Inventor · disambiguated record
Taichi Karino
Also filed as: KARINO TAICHI
17 granted patents·3 pending applications·10 citations·filing 2008–2024
87Inventor score
Top patents by PatentIndex Score
20 records- 0185US10727180B2Resistive element and method of manufacturing the resistive elementFUJI ELECTRIC CO LTD·Filed 2018·Granted Jul 28, 2020·4 cites·17 claims
- 0269US9411346B2Integrated circuit and semiconductor deviceFUJI ELECTRIC CO LTD·Filed 2013·Granted Aug 9, 2016·2 cites·19 claims
- 0366US10566412B2High voltage junction field effect transistor (JFET) with spiral voltage dividerFUJI ELECTRIC CO LTD·Filed 2016·Granted Feb 18, 2020·1 cites·10 claims
- 0466US10483347B2Semiconductor device, starter circuit, and switched-mode power-supply circuitFUJI ELECTRIC CO LTD·Filed 2018·Granted Nov 19, 2019·1 cites·16 claims
- 0564US9711659B2Semiconductor deviceFUJI ELECTRIC CO LTD·Filed 2015·Granted Jul 18, 2017·1 cites·9 claims
- 0662US12261117B2Semiconductor device and method of manufacturing the sameFUJI ELECTRIC CO LTD·Filed 2021·Granted Mar 25, 2025·0 cites·8 claims
- 0762US2025261418A1Semiconductor device and method of manufacturing the sameFUJI ELECTRIC CO LTD·Filed 2024·Application pending·0 cites
- 0860US9721939B2Semiconductor deviceFUJI ELECTRIC CO LTD·Filed 2013·Granted Aug 1, 2017·1 cites·8 claims
- 0958US12451425B2Semiconductor element with resistive layers having different resistance valuesFUJI ELECTRIC CO LTD·Filed 2022·Granted Oct 21, 2025·0 cites·13 claims
- 1056US2023378245A1Semiconductor deviceFUJI ELECTRIC CO LTD·Filed 2023·Application pending·0 cites
- 1153US11626221B2Resistance element and its manufacturing methodFUJI ELECTRIC CO LTD·Filed 2022·Granted Apr 11, 2023·0 cites·11 claims
- 1251US9166064B2Junction field effect transistorFUJI ELECTRIC CO LTD·Filed 2014·Granted Oct 20, 2015·0 cites·14 claims
- 1349US11408925B2Semiconductor element and method for identifying semiconductor elementFUJI ELECTRIC CO LTD·Filed 2019·Granted Aug 9, 2022·0 cites·11 claims
- 1449US11114222B2Resistive element and method of manufacturing the sameFUJI ELECTRIC CO LTD·Filed 2020·Granted Sep 7, 2021·0 cites·9 claims
- 1547US11264515B2Resistor elementFUJI ELECTRIC CO LTD·Filed 2019·Granted Mar 1, 2022·0 cites·18 claims
- 1647US11114351B2Dummy element and method of examining defect of resistive elementFUJI ELECTRIC CO LTD·Filed 2019·Granted Sep 7, 2021·0 cites·16 claims
- 1746US8638160B2Integrated circuit and semiconductor deviceKARINO TAICHI·Filed 2008·Granted Jan 28, 2014·0 cites·7 claims
- 1846US2009212373A1Semiconductor deviceFUJI ELEC DEVICE TECH CO LTD·Filed 2009·Application pending·0 cites
- 1945US10297490B2Semiconductor device and method for manufacturing semiconductor deviceFUJI ELECTRIC CO LTD·Filed 2018·Granted May 21, 2019·0 cites·4 claims
- 2034US9048278B2Semiconductor deviceKARINO TAICHI·Filed 2011·Granted Jun 2, 2015·0 cites·11 claims
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