Inventor · disambiguated record
Joshua G. Nickel
Also filed as: NICKEL JOSHUA · NICKEL JOSHUA G
31 granted patents·3 pending applications·909 citations·filing 2002–2019
97Inventor score
Top patents by PatentIndex Score
34 records- 0198US9274142B2Testing system with capacitively coupled probe for evaluating electronic device structuresNICKEL JOSHUA G·Filed 2011·Granted Mar 1, 2016·45 cites·23 claims
- 0298US9157954B2Test system with temporary test structuresNICKEL JOSHUA G·Filed 2011·Granted Oct 13, 2015·131 cites·21 claims
- 0398US9084124B2Methods and apparatus for performing passive antenna testing with active antenna tuning device controlAPPLE INC·Filed 2012·Granted Jul 14, 2015·137 cites·11 claims
- 0497US8742997B2Testing system with electrically coupled and wirelessly coupled probesNICKEL JOSHUA G·Filed 2011·Granted Jun 3, 2014·142 cites·11 claims
- 0596US9319908B2Methods for reducing path loss while testing wireless electronic devices with multiple antennasNICKEL JOSHUA G·Filed 2011·Granted Apr 19, 2016·29 cites·18 claims
- 0696US8798554B2Tunable antenna system with multiple feedsDARNELL DEAN F·Filed 2012·Granted Aug 5, 2014·44 cites·26 claims
- 0795US9372228B2Non-contact test system for determining whether electronic device structures contain manufacturing faultsAPPLE INC·Filed 2014·Granted Jun 21, 2016·151 cites·20 claims
- 0895US9350069B2Antenna with switchable inductor low-band tuningPASCOLINI MATTIA·Filed 2012·Granted May 24, 2016·26 cites·26 claims
- 0994US9214718B2Methods for characterizing tunable radio-frequency elementsMOW MATTHEW A·Filed 2012·Granted Dec 15, 2015·39 cites·5 claims
- 1092US9164159B2Methods for validating radio-frequency test stationsAPPLE INC·Filed 2012·Granted Oct 20, 2015·10 cites·20 claims
- 1191US8847617B2Non-contact test system for determining whether electronic device structures contain manufacturing faultsNICKEL JOSHUA G·Filed 2011·Granted Sep 30, 2014·12 cites·14 claims
- 1290US9000989B2Test system with adjustable radio-frequency probe arrayNICKEL JOSHUA G·Filed 2011·Granted Apr 7, 2015·9 cites·16 claims
- 1390US8995926B2Methods and apparatus for performing coexistence testing for multi-antenna electronic devicesAPPLE INC·Filed 2012·Granted Mar 31, 2015·13 cites·15 claims
- 1489US9287627B2Customizable antenna feed structureJARVIS DANIEL W·Filed 2011·Granted Mar 15, 2016·12 cites·12 claims
- 1589US9270012B2Electronic device with calibrated tunable antennaNICKEL JOSHUA G·Filed 2012·Granted Feb 23, 2016·11 cites·19 claims
- 1688US9404965B2Radio-frequency test system with tunable test antenna circuitryAPPLE INC·Filed 2013·Granted Aug 2, 2016·7 cites·20 claims
- 1788US9310422B2Methods and apparatus for testing small form factor antenna tuning elementsNATH JAYESH·Filed 2012·Granted Apr 12, 2016·9 cites·9 claims
- 1887US11114748B2Flexible printed circuit structures for electronic device antennasAPPLE INC·Filed 2019·Granted Sep 7, 2021·7 cites·20 claims
- 1986US8587335B2Methods for providing proper impedance matching during radio-frequency testingGREGG JUSTIN·Filed 2011·Granted Nov 19, 2013·6 cites·21 claims
- 2083US6700138B2Modular semiconductor die package and method of manufacturing thereofSILICON BANDWIDTH INC·Filed 2002·Granted Mar 2, 2004·27 cites·21 claims
- 2180US9154972B2Methods and apparatus for testing electronic devices with antenna arraysAPPLE INC·Filed 2013·Granted Oct 6, 2015·4 cites·20 claims
- 2280US8947113B2Methods for modeling tunable radio-frequency elementsHAN LIANG·Filed 2012·Granted Feb 3, 2015·4 cites·6 claims
- 2378US7070340B2High performance optoelectronic packaging assemblySILICON BANDWIDTH INC·Filed 2002·Granted Jul 4, 2006·20 cites·65 claims
- 2474US9653783B2Multiband antennas formed from bezel bands with gapsAPPLE INC·Filed 2015·Granted May 16, 2017·2 cites·15 claims
- 2574US9157930B2Bidirectional radio-frequency probingNICKEL JOSHUA G·Filed 2011·Granted Oct 13, 2015·4 cites·14 claims
- 2671US9404842B2Methodology and apparatus for testing conductive adhesive within antenna assemblyAPPLE INC·Filed 2013·Granted Aug 2, 2016·1 cites·14 claims
- 2767US8610439B2Radio-frequency test probes with integrated matching circuitry for testing transceiver circuitryNICKEL JOSHUA G·Filed 2011·Granted Dec 17, 2013·2 cites·10 claims
- 2863US9213053B2System for field testing wireless devices with reduced multipath interferenceNICKEL JOSHUA G·Filed 2010·Granted Dec 15, 2015·1 cites·14 claims
- 2963US8333623B2Cable connector retention clipsNICKEL JOSHUA G·Filed 2010·Granted Dec 18, 2012·4 cites·13 claims
- 3044US9285419B2Test probe alignment structures for radio-frequency test systemsNICKEL JOSHUA G·Filed 2011·Granted Mar 15, 2016·0 cites·10 claims
- 3143US8478549B2Weld check stationsNICKEL JOSHUA G·Filed 2010·Granted Jul 2, 2013·0 cites·25 claims
- 3241US2013271328A1Impedance Reference Structures for Radio-Frequency Test SystemsNICKEL JOSHUA G·Filed 2012·Application pending·0 cites
- 3340US2004026757A1Modular semiconductor die package and method of manufacturing thereofSILICON BANDWIDTH INC·Filed 2003·Application pending·0 cites
- 3439US2013015870A1Test system with contact test probesNICKEL JOSHUA G·Filed 2011·Application pending·0 cites
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