Inventor
WU CHII-MING
TW95 patents
⚠️ This page may combine multiple inventors who share the name “WU CHII-MING”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
TAIWAN SEMICONDUCTOR MFG CO LTD
28 patentsUS10748798B1Aug 18, 2020
Wireless camera wafer for vacuum chamber diagnostics
TAIWAN SEMICONDUCTOR MFG CO LTD15 citations94
US10157780B2Dec 18, 2018
Method of forming a device having a doping layer and device formed
TAIWAN SEMICONDUCTOR MFG CO LTD26 citations94
US10910560B2Feb 2, 2021
RRAM structure
TAIWAN SEMICONDUCTOR MFG CO LTD6 citations84
US10157770B2Dec 18, 2018
Semiconductor device having isolation structures with different thickness and method of forming the same
TAIWAN SEMICONDUCTOR MFG CO LTD4 citations84
US9997633B2Jun 12, 2018
Semiconductor devices, FinFET devices and methods of forming the same
TAIWAN SEMICONDUCTOR MFG CO LTD11 citations84
US9653594B2May 16, 2017
Semiconductor device and method for forming the same
TAIWAN SEMICONDUCTOR MFG CO LTD7 citations83
US9620503B1Apr 11, 2017
Fin field effect transistor and method for fabricating the same
TAIWAN SEMICONDUCTOR MFG CO LTD9 citations83
US10020401B2Jul 10, 2018
Methods for straining a transistor gate through interlayer dielectric (ILD) doping schemes
TAIWAN SEMICONDUCTOR MFG CO LTD4 citations82
US11721794B2Aug 8, 2023
Method for manufacturing reflective structure
TAIWAN SEMICONDUCTOR MFG CO LTD2 citations73
US11594593B2Feb 28, 2023
Method to reduce breakdown failure in a MIM capacitor
TAIWAN SEMICONDUCTOR MFG CO LTD1 citations73
US11527717B2Dec 13, 2022
Resistive memory cell having a low forming voltage
TAIWAN SEMICONDUCTOR MFG CO LTD2 citations73
US11479849B2Oct 25, 2022
Physical vapor deposition chamber with target surface morphology monitor
TAIWAN SEMICONDUCTOR MFG CO LTD2 citations73
US11257997B2Feb 22, 2022
Semiconductor structure
TAIWAN SEMICONDUCTOR MFG CO LTD2 citations73
US11152455B2Oct 19, 2021
Method to reduce breakdown failure in a MIM capacitor
TAIWAN SEMICONDUCTOR MFG CO LTD4 citations73
US11152568B2Oct 19, 2021
Top-electrode barrier layer for RRAM
TAIWAN SEMICONDUCTOR MFG CO LTD3 citations73
US10818544B2Oct 27, 2020
Method to enhance electrode adhesion stability
TAIWAN SEMICONDUCTOR MFG CO LTD2 citations73
US10177043B1Jan 8, 2019
Method for manufacturing multi-voltage devices using high-K-metal-gate (HKMG) technology
TAIWAN SEMICONDUCTOR MFG CO LTD3 citations73
US9570557B2Feb 14, 2017
Tilt implantation for STI formation in FinFET structures
TAIWAN SEMICONDUCTOR MFG CO LTD3 citations72
US12486566B2Dec 2, 2025
Physical vapor deposition chamber with target surface morphology monitor
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations63
US12414484B2Sep 9, 2025
RRAM structure
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations63
US12261197B2Mar 25, 2025
Diffusion barrier layer in top electrode to increase break down voltage
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations63
US12178147B2Dec 24, 2024
Semiconductor device and method for manufacturing the same
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations63
US11963468B2Apr 16, 2024
Rram structure
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations63
US11532698B2Dec 20, 2022
Diffusion barrier layer in top electrode to increase break down voltage
TAIWAN SEMICONDUCTOR MFG CO LTD1 citations63
US11482668B2Oct 25, 2022
RRAM structure
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations63
US11476416B2Oct 18, 2022
Semiconductor device and method for manufacturing the same
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations63
US11094583B2Aug 17, 2021
Method of forming a device having a doping layer and device formed
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations63
US10879354B2Dec 29, 2020
Semiconductor device and forming method thereof
TAIWAN SEMICONDUCTOR MFG CO LTD1 citations63
TAIWAN SEMICONDUCTOR MFG
16 patentsUS7235482B2Jun 26, 2007
Method of manufacturing a contact interconnection layer containing a metal and nitrogen by atomic layer deposition for deep sub-micron semiconductor technology
TAIWAN SEMICONDUCTOR MFG532 citations99
US6406956B1Jun 18, 2002
Poly resistor structure for damascene metal gate
TAIWAN SEMICONDUCTOR MFG117 citations98
US7396767B2Jul 8, 2008
Semiconductor structure including silicide regions and method of making same
TAIWAN SEMICONDUCTOR MFG33 citations93
US7015126B2Mar 21, 2006
Method of forming silicided gate structure
TAIWAN SEMICONDUCTOR MFG28 citations93
US6410424B1Jun 25, 2002
Process flow to optimize profile of ultra small size photo resist free contact
TAIWAN SEMICONDUCTOR MFG26 citations93
US7268065B2Sep 11, 2007
Methods of manufacturing metal-silicide features
TAIWAN SEMICONDUCTOR MFG18 citations92
US6803309B2Oct 12, 2004
Method for depositing an adhesion/barrier layer to improve adhesion and contact resistance
TAIWAN SEMICONDUCTOR MFG35 citations92
US6884736B2Apr 26, 2005
Method of forming contact plug on silicide structure
TAIWAN SEMICONDUCTOR MFG20 citations91
US8735266B2May 27, 2014
Mechanisms for forming ultra shallow junction
TAIWAN SEMICONDUCTOR MFG8 citations84
US8536658B2Sep 17, 2013
Mechanisms for forming ultra shallow junction
TAIWAN SEMICONDUCTOR MFG12 citations84
US8383513B2Feb 26, 2013
Asymmetric rapid thermal annealing to reduce pattern effect
TAIWAN SEMICONDUCTOR MFG5 citations84
US7205234B2Apr 17, 2007
Method of forming metal silicide
TAIWAN SEMICONDUCTOR MFG11 citations84
US7432559B2Oct 7, 2008
Silicide formation on SiGe
TAIWAN SEMICONDUCTOR MFG14 citations83
US7078810B2Jul 18, 2006
Semiconductor device and fabrication method thereof
TAIWAN SEMICONDUCTOR MFG11 citations81
US7625801B2Dec 1, 2009
Silicide formation with a pre-amorphous implant
TAIWAN SEMICONDUCTOR MFG7 citations74
US7781316B2Aug 24, 2010
Methods of manufacturing metal-silicide features
TAIWAN SEMICONDUCTOR MFG4 citations73
WU CHII-MING
1 patentHUANG YU-LIEN
1 patentNIEH CHUN-FENG
1 patentLIN CHEN-TUNG
1 patentTSAI WEN-CHI
1 patentNIEH CHUN-WEN
1 patentShowing the top 50 of 95 patents by PatentIndex Score.