P

Inventor

WU CHII-MING

TW95 patents
⚠️ This page may combine multiple inventors who share the name “WU CHII-MING”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

TAIWAN SEMICONDUCTOR MFG CO LTD

28 patents
US10748798B1Aug 18, 2020

Wireless camera wafer for vacuum chamber diagnostics

TAIWAN SEMICONDUCTOR MFG CO LTD15 citations94
US10157780B2Dec 18, 2018

Method of forming a device having a doping layer and device formed

TAIWAN SEMICONDUCTOR MFG CO LTD26 citations94
US10910560B2Feb 2, 2021

RRAM structure

TAIWAN SEMICONDUCTOR MFG CO LTD6 citations84
US10157770B2Dec 18, 2018

Semiconductor device having isolation structures with different thickness and method of forming the same

TAIWAN SEMICONDUCTOR MFG CO LTD4 citations84
US9997633B2Jun 12, 2018

Semiconductor devices, FinFET devices and methods of forming the same

TAIWAN SEMICONDUCTOR MFG CO LTD11 citations84
US9653594B2May 16, 2017

Semiconductor device and method for forming the same

TAIWAN SEMICONDUCTOR MFG CO LTD7 citations83
US9620503B1Apr 11, 2017

Fin field effect transistor and method for fabricating the same

TAIWAN SEMICONDUCTOR MFG CO LTD9 citations83
US10020401B2Jul 10, 2018

Methods for straining a transistor gate through interlayer dielectric (ILD) doping schemes

TAIWAN SEMICONDUCTOR MFG CO LTD4 citations82
US11721794B2Aug 8, 2023

Method for manufacturing reflective structure

TAIWAN SEMICONDUCTOR MFG CO LTD2 citations73
US11594593B2Feb 28, 2023

Method to reduce breakdown failure in a MIM capacitor

TAIWAN SEMICONDUCTOR MFG CO LTD1 citations73
US11527717B2Dec 13, 2022

Resistive memory cell having a low forming voltage

TAIWAN SEMICONDUCTOR MFG CO LTD2 citations73
US11479849B2Oct 25, 2022

Physical vapor deposition chamber with target surface morphology monitor

TAIWAN SEMICONDUCTOR MFG CO LTD2 citations73
US11257997B2Feb 22, 2022

Semiconductor structure

TAIWAN SEMICONDUCTOR MFG CO LTD2 citations73
US11152455B2Oct 19, 2021

Method to reduce breakdown failure in a MIM capacitor

TAIWAN SEMICONDUCTOR MFG CO LTD4 citations73
US11152568B2Oct 19, 2021

Top-electrode barrier layer for RRAM

TAIWAN SEMICONDUCTOR MFG CO LTD3 citations73
US10818544B2Oct 27, 2020

Method to enhance electrode adhesion stability

TAIWAN SEMICONDUCTOR MFG CO LTD2 citations73
US10177043B1Jan 8, 2019

Method for manufacturing multi-voltage devices using high-K-metal-gate (HKMG) technology

TAIWAN SEMICONDUCTOR MFG CO LTD3 citations73
US9570557B2Feb 14, 2017

Tilt implantation for STI formation in FinFET structures

TAIWAN SEMICONDUCTOR MFG CO LTD3 citations72
US12486566B2Dec 2, 2025

Physical vapor deposition chamber with target surface morphology monitor

TAIWAN SEMICONDUCTOR MFG CO LTD0 citations63
US12414484B2Sep 9, 2025

RRAM structure

TAIWAN SEMICONDUCTOR MFG CO LTD0 citations63
US12261197B2Mar 25, 2025

Diffusion barrier layer in top electrode to increase break down voltage

TAIWAN SEMICONDUCTOR MFG CO LTD0 citations63
US12178147B2Dec 24, 2024

Semiconductor device and method for manufacturing the same

TAIWAN SEMICONDUCTOR MFG CO LTD0 citations63
US11963468B2Apr 16, 2024

Rram structure

TAIWAN SEMICONDUCTOR MFG CO LTD0 citations63
US11532698B2Dec 20, 2022

Diffusion barrier layer in top electrode to increase break down voltage

TAIWAN SEMICONDUCTOR MFG CO LTD1 citations63
US11482668B2Oct 25, 2022

RRAM structure

TAIWAN SEMICONDUCTOR MFG CO LTD0 citations63
US11476416B2Oct 18, 2022

Semiconductor device and method for manufacturing the same

TAIWAN SEMICONDUCTOR MFG CO LTD0 citations63
US11094583B2Aug 17, 2021

Method of forming a device having a doping layer and device formed

TAIWAN SEMICONDUCTOR MFG CO LTD0 citations63
US10879354B2Dec 29, 2020

Semiconductor device and forming method thereof

TAIWAN SEMICONDUCTOR MFG CO LTD1 citations63

TAIWAN SEMICONDUCTOR MFG

16 patents
US7235482B2Jun 26, 2007

Method of manufacturing a contact interconnection layer containing a metal and nitrogen by atomic layer deposition for deep sub-micron semiconductor technology

TAIWAN SEMICONDUCTOR MFG532 citations99
US6406956B1Jun 18, 2002

Poly resistor structure for damascene metal gate

TAIWAN SEMICONDUCTOR MFG117 citations98
US7396767B2Jul 8, 2008

Semiconductor structure including silicide regions and method of making same

TAIWAN SEMICONDUCTOR MFG33 citations93
US7015126B2Mar 21, 2006

Method of forming silicided gate structure

TAIWAN SEMICONDUCTOR MFG28 citations93
US6410424B1Jun 25, 2002

Process flow to optimize profile of ultra small size photo resist free contact

TAIWAN SEMICONDUCTOR MFG26 citations93
US7268065B2Sep 11, 2007

Methods of manufacturing metal-silicide features

TAIWAN SEMICONDUCTOR MFG18 citations92
US6803309B2Oct 12, 2004

Method for depositing an adhesion/barrier layer to improve adhesion and contact resistance

TAIWAN SEMICONDUCTOR MFG35 citations92
US6884736B2Apr 26, 2005

Method of forming contact plug on silicide structure

TAIWAN SEMICONDUCTOR MFG20 citations91
US8735266B2May 27, 2014

Mechanisms for forming ultra shallow junction

TAIWAN SEMICONDUCTOR MFG8 citations84
US8536658B2Sep 17, 2013

Mechanisms for forming ultra shallow junction

TAIWAN SEMICONDUCTOR MFG12 citations84
US8383513B2Feb 26, 2013

Asymmetric rapid thermal annealing to reduce pattern effect

TAIWAN SEMICONDUCTOR MFG5 citations84
US7205234B2Apr 17, 2007

Method of forming metal silicide

TAIWAN SEMICONDUCTOR MFG11 citations84
US7432559B2Oct 7, 2008

Silicide formation on SiGe

TAIWAN SEMICONDUCTOR MFG14 citations83
US7078810B2Jul 18, 2006

Semiconductor device and fabrication method thereof

TAIWAN SEMICONDUCTOR MFG11 citations81
US7625801B2Dec 1, 2009

Silicide formation with a pre-amorphous implant

TAIWAN SEMICONDUCTOR MFG7 citations74
US7781316B2Aug 24, 2010

Methods of manufacturing metal-silicide features

TAIWAN SEMICONDUCTOR MFG4 citations73

WU CHII-MING

1 patent

HUANG YU-LIEN

1 patent

NIEH CHUN-FENG

1 patent

LIN CHEN-TUNG

1 patent

TSAI WEN-CHI

1 patent

NIEH CHUN-WEN

1 patent

Showing the top 50 of 95 patents by PatentIndex Score.