Inventor
USHIKU YUKIHIRO
JP45 patents
⚠️ This page may combine multiple inventors who share the name “USHIKU YUKIHIRO”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
TOSHIBA KK
41 patentsUS5844278ADec 1, 1998
Semiconductor device having a projecting element region
TOSHIBA KK170 citations98
US5032890AJul 16, 1991
Semiconductor integrated circuit with dummy patterns
TOSHIBA KK75 citations96
US5763953AJun 9, 1998
Semiconductor device and method of manufacturing the same
TOSHIBA KK85 citations94
US5529954AJun 25, 1996
Method of diffusing a metal through a silver electrode to form a protective film on the surface of the electrode
TOSHIBA KK58 citations94
US6909993B2Jun 21, 2005
Method for diagnosing failure of a manufacturing apparatus and a failure diagnosis system
TOSHIBA KK20 citations93
US6865513B2Mar 8, 2005
Method for predicting life of rotary machine and determining repair timing of rotary machine
TOSHIBA KK18 citations93
US6782348B2Aug 24, 2004
Apparatus for diagnosing failure in equipment using signals relating to the equipment
TOSHIBA KK21 citations93
US6724045B1Apr 20, 2004
Semiconductor device and method of manufacturing the same
TOSHIBA KK15 citations93
US6184083B1Feb 6, 2001
Semiconductor device and method of manufacturing the same
TOSHIBA KK35 citations93
US5185279AFeb 9, 1993
Method of manufacturing insulated-gate type field effect transistor
TOSHIBA KK23 citations93
US7221991B2May 22, 2007
System and method for monitoring manufacturing apparatuses
TOSHIBA KK24 citations92
US7057259B2Jun 6, 2006
Semiconductor wafer with ID mark, equipment for and method of manufacturing semiconductor device from them
TOSHIBA KK35 citations92
US6885972B2Apr 26, 2005
Method for predicting life span of rotary machine used in manufacturing apparatus and life predicting system
TOSHIBA KK21 citations92
US5898203AApr 27, 1999
Semiconductor device having solid phase diffusion sources
TOSHIBA KK29 citations92
US5675176AOct 7, 1997
Semiconductor device and a method for manufacturing the same
TOSHIBA KK43 citations92
US5434440AJul 18, 1995
Semiconductor device and method of manufacturing the same
TOSHIBA KK35 citations92
US6885950B2Apr 26, 2005
Method, apparatus, and computer program of searching for clustering faults in semiconductor device manufacturing
TOSHIBA KK32 citations91
US5903027AMay 11, 1999
MOSFET with solid phase diffusion source
TOSHIBA KK20 citations91
US7702413B2Apr 20, 2010
Semiconductor device manufacturing system and method for manufacturing semiconductor devices including calculating oxide film thickness using real time simulator
TOSHIBA KK22 citations90
US7324855B2Jan 29, 2008
Process-state management system, management server and control server adapted for the system, method for managing process-states, method for manufacturing a product, and computer program product for the management server
TOSHIBA KK24 citations88
US7588973B2Sep 15, 2009
Semiconductor device and method of manufacturing the same
TOSHIBA KK10 citations84
US6944572B2Sep 13, 2005
Apparatus for predicting life of rotary machine and equipment using the same
TOSHIBA KK15 citations84
US6937963B2Aug 30, 2005
Method for avoiding irregular shutoff of production equipment and system for avoiding irregular shutoff
TOSHIBA KK18 citations84
US6766275B2Jul 20, 2004
Method for diagnosing life of manufacturing equipment using rotary machine
TOSHIBA KK17 citations84
US7314766B2Jan 1, 2008
Semiconductor wafer treatment method, semiconductor wafer inspection method, semiconductor device development method and semiconductor wafer treatment apparatus
TOSHIBA KK9 citations83
US7222026B2May 22, 2007
Equipment for and method of detecting faults in semiconductor integrated circuits
TOSHIBA KK10 citations83
US5028552AJul 2, 1991
Method of manufacturing insulated-gate type field effect transistor
TOSHIBA KK20 citations82
US4661721AApr 28, 1987
Clock driver distribution system in a semiconductor integrated circuit device
TOSHIBA KK22 citations82
US5698881ADec 16, 1997
MOSFET with solid phase diffusion source
TOSHIBA KK17 citations81
US7413914B2Aug 19, 2008
Method and apparatus for manufacturing semiconductor device, method and apparatus for controlling the same, and method and apparatus for simulating manufacturing process of semiconductor device
TOSHIBA KK7 citations74
US7361960B1Apr 22, 2008
Semiconductor device and method of manufacturing the same
TOSHIBA KK6 citations74
US7065469B2Jun 20, 2006
Manufacturing apparatus and method for predicting life of a manufacturing apparatus which uses a rotary machine
TOSHIBA KK9 citations74
US7463941B2Dec 9, 2008
Quality control system, quality control method, and method of lot-to-lot wafer processing
TOSHIBA KK8 citations73
US5739575AApr 14, 1998
Dielectrically isolated substrate and method for manufacturing the same
TOSHIBA KK16 citations73
US7529634B2May 5, 2009
Method, apparatus, and computer program of searching for clustering faults in semiconductor device manufacturing
TOSHIBA KK5 citations72
US7188049B2Mar 6, 2007
System and method for controlling manufacturing processes, and method for manufacturing a semiconductor device
TOSHIBA KK2 citations63
US6930359B2Aug 16, 2005
Semiconductor device and method of manufacturing the same
TOSHIBA KK4 citations63
US6898551B2May 24, 2005
System for predicting life of a rotary machine, method for predicting life of a manufacturing apparatus which uses a rotary machine and a manufacturing apparatus
TOSHIBA KK6 citations63
US7082346B2Jul 25, 2006
Semiconductor manufacturing apparatus and semiconductor device manufacturing method
TOSHIBA KK6 citations62
US7831330B2Nov 9, 2010
Process control system, process control method, and method of manufacturing electronic apparatus
TOSHIBA KK2 citations61
US7531462B2May 12, 2009
Method of inspecting semiconductor wafer
TOSHIBA KK0 citations41