P

Inventor

RONG BOR-DOOU

TW28 patents
⚠️ This page may combine multiple inventors who share the name “RONG BOR-DOOU”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

ETRON TECHNOLOGY INC

20 patents
US7031219B2Apr 18, 2006

Internal power management scheme for a memory chip in deep power down mode

ETRON TECHNOLOGY INC25 citations92
US6101138AAug 8, 2000

Area efficient global row redundancy scheme for DRAM

ETRON TECHNOLOGY INC24 citations92
US7292494B2Nov 6, 2007

Internal power management scheme for a memory chip in deep power down mode

ETRON TECHNOLOGY INC15 citations84
US7098722B2Aug 29, 2006

Low power design for fuse control circuit

ETRON TECHNOLOGY INC12 citations83
US6661719B1Dec 9, 2003

Wafer level burn-in for memory integrated circuit

ETRON TECHNOLOGY INC17 citations83
US6643166B1Nov 4, 2003

Low power SRAM redundancy repair scheme

ETRON TECHNOLOGY INC15 citations83
US6377492B1Apr 23, 2002

Memory architecture for read and write at the same time using a conventional cell

ETRON TECHNOLOGY INC14 citations80
US5723994AMar 3, 1998

Level boost restoration circuit

ETRON TECHNOLOGY INC16 citations74
US6934899B2Aug 23, 2005

Variable self-time scheme for write recovery by low speed tester

ETRON TECHNOLOGY INC8 citations73
US6237115B1May 22, 2001

Design for testability in very high speed memory

ETRON TECHNOLOGY INC12 citations73
US6058069AMay 2, 2000

Protection circuit to ensure DRAM signal in write cycle

ETRON TECHNOLOGY INC8 citations71
US5703832ADec 30, 1997

tRAS protection circuit

ETRON TECHNOLOGY INC14 citations69
US9214448B2Dec 15, 2015

Bundled memory and manufacture method for a bundled memory with an external input/output bus

ETRON TECHNOLOGY INC2 citations63
US7515669B2Apr 7, 2009

Dynamic input setup/hold time improvement architecture

ETRON TECHNOLOGY INC6 citations62
US7478294B2Jan 13, 2009

Time controllable sensing scheme for sense amplifier in memory IC test

ETRON TECHNOLOGY INC4 citations62
US7434985B2Oct 14, 2008

Calibrated built-in temperature sensor and calibration method thereof

ETRON TECHNOLOGY INC4 citations62
US5737271AApr 7, 1998

Semiconductor memory arrays

ETRON TECHNOLOGY INC4 citations62
US5671189ASep 23, 1997

Low standby power redundancy circuit

ETRON TECHNOLOGY INC3 citations57
US9070558B2Jun 30, 2015

Bundled memory and manufacture method for a bundled memory with an external input/output bus

ETRON TECHNOLOGY INC0 citations52
US7983102B2Jul 19, 2011

Data detecting apparatus and methods thereof

ETRON TECHNOLOGY INC0 citations41

ETRON TECH INC

7 patents

IND TECH RES INST

1 patent