Inventor
RONG BOR-DOOU
TW28 patents
⚠️ This page may combine multiple inventors who share the name “RONG BOR-DOOU”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
ETRON TECHNOLOGY INC
20 patentsUS7031219B2Apr 18, 2006
Internal power management scheme for a memory chip in deep power down mode
ETRON TECHNOLOGY INC25 citations92
US6101138AAug 8, 2000
Area efficient global row redundancy scheme for DRAM
ETRON TECHNOLOGY INC24 citations92
US7292494B2Nov 6, 2007
Internal power management scheme for a memory chip in deep power down mode
ETRON TECHNOLOGY INC15 citations84
US7098722B2Aug 29, 2006
Low power design for fuse control circuit
ETRON TECHNOLOGY INC12 citations83
US6661719B1Dec 9, 2003
Wafer level burn-in for memory integrated circuit
ETRON TECHNOLOGY INC17 citations83
US6643166B1Nov 4, 2003
Low power SRAM redundancy repair scheme
ETRON TECHNOLOGY INC15 citations83
US6377492B1Apr 23, 2002
Memory architecture for read and write at the same time using a conventional cell
ETRON TECHNOLOGY INC14 citations80
US5723994AMar 3, 1998
Level boost restoration circuit
ETRON TECHNOLOGY INC16 citations74
US6934899B2Aug 23, 2005
Variable self-time scheme for write recovery by low speed tester
ETRON TECHNOLOGY INC8 citations73
US6237115B1May 22, 2001
Design for testability in very high speed memory
ETRON TECHNOLOGY INC12 citations73
US6058069AMay 2, 2000
Protection circuit to ensure DRAM signal in write cycle
ETRON TECHNOLOGY INC8 citations71
US5703832ADec 30, 1997
tRAS protection circuit
ETRON TECHNOLOGY INC14 citations69
US9214448B2Dec 15, 2015
Bundled memory and manufacture method for a bundled memory with an external input/output bus
ETRON TECHNOLOGY INC2 citations63
US7515669B2Apr 7, 2009
Dynamic input setup/hold time improvement architecture
ETRON TECHNOLOGY INC6 citations62
US7478294B2Jan 13, 2009
Time controllable sensing scheme for sense amplifier in memory IC test
ETRON TECHNOLOGY INC4 citations62
US7434985B2Oct 14, 2008
Calibrated built-in temperature sensor and calibration method thereof
ETRON TECHNOLOGY INC4 citations62
US5737271AApr 7, 1998
Semiconductor memory arrays
ETRON TECHNOLOGY INC4 citations62
US5671189ASep 23, 1997
Low standby power redundancy circuit
ETRON TECHNOLOGY INC3 citations57
US9070558B2Jun 30, 2015
Bundled memory and manufacture method for a bundled memory with an external input/output bus
ETRON TECHNOLOGY INC0 citations52
US7983102B2Jul 19, 2011
Data detecting apparatus and methods thereof
ETRON TECHNOLOGY INC0 citations41
ETRON TECH INC
7 patentsUS9601456B2Mar 21, 2017
System-in-package module and manufacture method for a system-in-package module
ETRON TECH INC2 citations72
US11798613B2Oct 24, 2023
Dynamic memory with long retention time
ETRON TECH INC0 citations62
US12361998B2Jul 15, 2025
Sustainable DRAM having principle power supply voltage unified with logic circuit
ETRON TECH INC0 citations52
US12354646B2Jul 8, 2025
Dynamic memory with sustainable storage architecture
ETRON TECH INC0 citations52
US12068020B2Aug 20, 2024
Dynamic memory with sustainable storage architecture and clean up circuit
ETRON TECH INC0 citations52
US11302383B2Apr 12, 2022
Dynamic memory with sustainable storage architecture
ETRON TECH INC0 citations52
US9589931B2Mar 7, 2017
Bundled memory and manufacture method for a bundled memory with an external input/output bus
ETRON TECH INC0 citations52