P

Inventor

SCHAEFER SCOTT E

US106 patents
⚠️ This page may combine multiple inventors who share the name “SCHAEFER SCOTT E”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

MICRON TECHNOLOGY INC

46 patents
US5335201AAug 2, 1994

Method for providing synchronous refresh cycles in self-refreshing interruptable DRAMs

MICRON TECHNOLOGY INC68 citations95
US6751159B2Jun 15, 2004

Memory device operable in either a high-power, full-page size mode or a low-power, reduced-page size mode

MICRON TECHNOLOGY INC22 citations92
US5229970AJul 20, 1993

Circuit for synchronizing refresh cycles in self-refreshing drams having timing circuit shutdown

MICRON TECHNOLOGY INC37 citations92
US5208779AMay 4, 1993

Circuit for providing synchronous refresh cycles in self-refreshing interruptable DRAMs

MICRON TECHNOLOGY INC34 citations91
US11755409B2Sep 12, 2023

Internal error correction for memory devices

MICRON TECHNOLOGY INC7 citations86
US10657081B2May 19, 2020

Individually addressing memory devices disconnected from a data bus

MICRON TECHNOLOGY INC6 citations84
US6965540B2Nov 15, 2005

Memory device operable in either a high-power, full-page size mode or a low-power, reduced-page size mode

MICRON TECHNOLOGY INC12 citations84
US11953988B2Apr 9, 2024

Error correction memory device with fast data access

MICRON TECHNOLOGY INC5 citations75
US12242343B2Mar 4, 2025

Command address fault detection using a parity pin

MICRON TECHNOLOGY INC3 citations74
US12079068B2Sep 3, 2024

Error log indication via error control information

MICRON TECHNOLOGY INC2 citations73
US12066891B2Aug 20, 2024

Real time syndrome check

MICRON TECHNOLOGY INC2 citations73
US12051477B2Jul 30, 2024

Indicating a status of a memory built-in self-test for multiple memory device ranks

MICRON TECHNOLOGY INC2 citations73
US12046316B2Jul 23, 2024

Techniques for detecting a state of a bus

MICRON TECHNOLOGY INC2 citations73
US11983433B2May 14, 2024

Techniques for detecting a state of a bus

MICRON TECHNOLOGY INC2 citations73
US11928023B1Mar 12, 2024

Techniques for indicating a write link error

MICRON TECHNOLOGY INC2 citations73
US11928018B2Mar 12, 2024

Coordinated error protection

MICRON TECHNOLOGY INC2 citations73
US11789818B2Oct 17, 2023

Coordinated error correction

MICRON TECHNOLOGY INC1 citations73
US11714711B2Aug 1, 2023

Memory device with status feedback for error correction

MICRON TECHNOLOGY INC2 citations73
US11675662B2Jun 13, 2023

Extended error detection for a memory device

MICRON TECHNOLOGY INC3 citations73
US11586383B2Feb 21, 2023

Command block management

MICRON TECHNOLOGY INC2 citations73
US11579784B2Feb 14, 2023

Refresh counters in a memory system

MICRON TECHNOLOGY INC2 citations73
US11436169B2Sep 6, 2022

Individually addressing memory devices disconnected from a data bus

MICRON TECHNOLOGY INC2 citations73
US11436082B2Sep 6, 2022

Internal error correction for memory devices

MICRON TECHNOLOGY INC3 citations73
US11307929B2Apr 19, 2022

Memory device with status feedback for error correction

MICRON TECHNOLOGY INC3 citations73
US11249847B2Feb 15, 2022

Targeted command/address parity low lift

MICRON TECHNOLOGY INC2 citations73
US11216333B2Jan 4, 2022

Methods and devices for error correction

MICRON TECHNOLOGY INC2 citations73
US11182244B2Nov 23, 2021

Error correction management for a memory device

MICRON TECHNOLOGY INC3 citations73
US11126498B2Sep 21, 2021

Memory device with configurable error correction modes

MICRON TECHNOLOGY INC2 citations73
US11061771B2Jul 13, 2021

Extended error detection for a memory device

MICRON TECHNOLOGY INC4 citations73
US11054995B2Jul 6, 2021

Row hammer protection for a memory device

MICRON TECHNOLOGY INC4 citations73
US10983934B2Apr 20, 2021

Individually addressing memory devices disconnected from a data bus

MICRON TECHNOLOGY INC2 citations73
US10754801B2Aug 25, 2020

Individually addressing memory devices disconnected from a data bus

MICRON TECHNOLOGY INC3 citations73
US5229969AJul 20, 1993

Method for synchronizing refresh cycles in self-refreshing DRAMs having timing circuit shutdown

MICRON TECHNOLOGY INC17 citations73
US12038806B2Jul 16, 2024

Evaluation of memory device health monitoring logic

MICRON TECHNOLOGY INC2 citations72
US11977772B2May 7, 2024

Temperature monitoring for memory devices

MICRON TECHNOLOGY INC2 citations72
US11600355B2Mar 7, 2023

Monitoring and adjusting access operations at a memory device

MICRON TECHNOLOGY INC2 citations72
US11561891B1Jan 24, 2023

Adaptive user defined health indication

MICRON TECHNOLOGY INC3 citations72
US12237031B2Feb 25, 2025

Refresh rate selection for a memory built-in self-test

MICRON TECHNOLOGY INC1 citations64
US12531576B2Jan 20, 2026

Managing error control information using a register

MICRON TECHNOLOGY INC0 citations63
US12423175B2Sep 23, 2025

Coordinated error protection

MICRON TECHNOLOGY INC0 citations63
US12386699B2Aug 12, 2025

Techniques for indicating a write link error

MICRON TECHNOLOGY INC0 citations63
US12374418B2Jul 29, 2025

Techniques for detecting a state of a bus

MICRON TECHNOLOGY INC0 citations63
US12373132B2Jul 29, 2025

Techniques for detecting a state of a bus

MICRON TECHNOLOGY INC0 citations63
US12360848B2Jul 15, 2025

Error correction memory device with fast data access

MICRON TECHNOLOGY INC0 citations63
US12362031B2Jul 15, 2025

Indicating a status of a memory built-in self-test for multiple memory device ranks

MICRON TECHNOLOGY INC0 citations63
US12354691B2Jul 8, 2025

Indicating valid memory access operations

MICRON TECHNOLOGY INC0 citations63

LODESTAR LICENSING GROUP LLC

4 patents

Showing the top 50 of 106 patents by PatentIndex Score.