Inventor
YUN WON-JOO
KR61 patents
⚠️ This page may combine multiple inventors who share the name “YUN WON-JOO”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
HYNIX SEMICONDUCTOR INC
25 patentsUS7598783B2Oct 6, 2009
DLL circuit and method of controlling the same
HYNIX SEMICONDUCTOR INC51 citations94
US7821310B2Oct 26, 2010
DLL circuit having duty cycle correction and method of controlling the same
HYNIX SEMICONDUCTOR INC25 citations93
US7800422B2Sep 21, 2010
Semiconductor memory apparatus
HYNIX SEMICONDUCTOR INC21 citations93
US7633324B2Dec 15, 2009
Data output strobe signal generating circuit and semiconductor memory apparatus having the same
HYNIX SEMICONDUCTOR INC27 citations93
US7560963B2Jul 14, 2009
Delay-locked loop apparatus and delay-locked method
HYNIX SEMICONDUCTOR INC21 citations93
US7928783B2Apr 19, 2011
Semiconductor integrated circuit
HYNIX SEMICONDUCTOR INC7 citations84
US7868673B2Jan 11, 2011
Power-down mode control apparatus and DLL circuit having the same
HYNIX SEMICONDUCTOR INC11 citations84
US7830186B2Nov 9, 2010
Delay locked loop apparatus
HYNIX SEMICONDUCTOR INC15 citations84
US7782105B2Aug 24, 2010
Semiconductor memory device for generating a delay locked clock in early stage
HYNIX SEMICONDUCTOR INC8 citations84
US7755405B2Jul 13, 2010
DLL circuit and method of controlling the same
HYNIX SEMICONDUCTOR INC10 citations84
US7683684B2Mar 23, 2010
Power-down mode control apparatus and DLL circuit having the same
HYNIX SEMICONDUCTOR INC8 citations84
US7605623B2Oct 20, 2009
Semiconductor memory apparatus with a delay locked loop circuit
HYNIX SEMICONDUCTOR INC17 citations84
US7535270B2May 19, 2009
Semiconductor memory device
HYNIX SEMICONDUCTOR INC13 citations84
US7791384B2Sep 7, 2010
Phase synchronization apparatus
HYNIX SEMICONDUCTOR INC7 citations74
US7719333B2May 18, 2010
Power control circuit, method of controlling power control circuit, and DLL circuit including power control circuit
HYNIX SEMICONDUCTOR INC5 citations74
US7576581B2Aug 18, 2009
Circuit and method for correcting duty cycle
HYNIX SEMICONDUCTOR INC5 citations74
US7557627B2Jul 7, 2009
Semiconductor memory device for generating a delay locked clock in early stage
HYNIX SEMICONDUCTOR INC7 citations74
US7994831B2Aug 9, 2011
Semiconductor integrated circuit and method of controlling the same
HYNIX SEMICONDUCTOR INC3 citations63
US7952403B2May 31, 2011
Update control apparatus in DLL circuit
HYNIX SEMICONDUCTOR INC2 citations63
US7782106B2Aug 24, 2010
Circuit and method for correcting duty cycle
HYNIX SEMICONDUCTOR INC4 citations63
US7764096B2Jul 27, 2010
DLL circuit and method of controlling the same
HYNIX SEMICONDUCTOR INC5 citations63
US7761757B2Jul 20, 2010
Apparatus and method of setting test mode in semiconductor integrated circuit
HYNIX SEMICONDUCTOR INC4 citations63
US7755403B2Jul 13, 2010
Apparatus and method of setting operation mode in DLL circuit
HYNIX SEMICONDUCTOR INC2 citations63
US7750703B2Jul 6, 2010
Duty cycle correcting circuit
HYNIX SEMICONDUCTOR INC5 citations63
US7733147B2Jun 8, 2010
Delay circuit of delay locked loop having single and dual delay lines and control method of the same
HYNIX SEMICONDUCTOR INC2 citations63
MICRON TECHNOLOGY INC
9 patentsUS12499079B2Dec 16, 2025
Apparatus including reconfigurable interface and methods of manufacturing the same
MICRON TECHNOLOGY INC0 citations63
US11886376B2Jan 30, 2024
Apparatus including reconfigurable interface and methods of manufacturing the same
MICRON TECHNOLOGY INC0 citations63
US12505875B2Dec 23, 2025
Data input buffer with a branched DFE reset path
MICRON TECHNOLOGY INC1 citations62
US11996162B2May 28, 2024
Synchronous input buffer enable for DFE operation
MICRON TECHNOLOGY INC0 citations62
US11922996B2Mar 5, 2024
Apparatuses, systems, and methods for ZQ calibration
MICRON TECHNOLOGY INC0 citations62
US11855812B2Dec 26, 2023
Hybrid loop unrolled decision feedback equalizer architecture
MICRON TECHNOLOGY INC0 citations62
US11677537B2Jun 13, 2023
Signal delay control and related apparatuses, systems, and methods
MICRON TECHNOLOGY INC0 citations62
US11619964B2Apr 4, 2023
Methods for improving timing in memory devices, and related devices and systems
MICRON TECHNOLOGY INC0 citations62
US11789835B2Oct 17, 2023
Test input/output speed conversion and related apparatuses and methods
MICRON TECHNOLOGY INC0 citations57
SAMSUNG ELECTRONICS CO LTD
8 patentsUS9870808B2Jan 16, 2018
Memory device for performing calibration operation
SAMSUNG ELECTRONICS CO LTD8 citations83
US9654093B2May 16, 2017
Electronic device having a delay locked loop, and memory device having the same
SAMSUNG ELECTRONICS CO LTD8 citations82
US10078110B2Sep 18, 2018
Short circuit detecting device of stacked memory chips and method thereof
SAMSUNG ELECTRONICS CO LTD3 citations72
US9501041B2Nov 22, 2016
Duty cycle error detection device and duty cycle correction device having the same
SAMSUNG ELECTRONICS CO LTD6 citations71
US9959935B2May 1, 2018
Input-output circuit for supporting multiple-input shift register (MISR) function and memory device including the same
SAMSUNG ELECTRONICS CO LTD5 citations70
US10908212B2Feb 2, 2021
Semiconductor memory device including a shift register
SAMSUNG ELECTRONICS CO LTD0 citations62
US9214202B2Dec 15, 2015
Input buffer and memory device including the same
SAMSUNG ELECTRONICS CO LTD3 citations62
US10651156B2May 12, 2020
Memory package and memory device utilizing an intermediate chip
SAMSUNG ELECTRONICS CO LTD1 citations58
YUN WON JOO
4 patentsUS8237478B2Aug 7, 2012
DLL circuit having activation points
YUN WON JOO8 citations83
US8742806B2Jun 3, 2014
Power control circuit, method of controlling power control circuit, and DLL circuit including power control circuit
YUN WON JOO2 citations62
US8154326B2Apr 10, 2012
Power control circuit, method of controlling power control circuit, and DLL circuit including power control circuit
YUN WON JOO1 citations62
US8120397B2Feb 21, 2012
Delay locked loop apparatus
YUN WON JOO2 citations62
LEE HYUN WOO
2 patentsKIM KI HAN
1 patentYUN WON-JOO
1 patentShowing the top 50 of 61 patents by PatentIndex Score.