P

Inventor

PENNY CHRISTOPHER J

US171 patents
⚠️ This page may combine multiple inventors who share the name “PENNY CHRISTOPHER J”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

IBM

42 patents
US10229851B2Mar 12, 2019

Self-forming barrier for use in air gap formation

IBM317 citations99
US9837355B2Dec 5, 2017

Method for maximizing air gap in back end of the line interconnect through via landing modification

IBM313 citations99
US9666528B1May 30, 2017

BEOL vertical fuse formed over air gap

IBM430 citations99
US9349687B1May 24, 2016

Advanced manganese/manganese nitride cap/etch mask for air gap formation scheme in nanocopper low-K interconnect

IBM96 citations98
US9305836B1Apr 5, 2016

Air gap semiconductor structure with selective cap bilayer

IBM488 citations98
US9966337B1May 8, 2018

Fully aligned via with integrated air gaps

IBM22 citations94
US9934970B1Apr 3, 2018

Self aligned pattern formation post spacer etchback in tight pitch configurations

IBM22 citations94
US9911651B1Mar 6, 2018

Skip-vias bypassing a metallization level at minimum pitch

IBM26 citations94
US9786760B1Oct 10, 2017

Air gap and air spacer pinch off

IBM22 citations94
US9991156B2Jun 5, 2018

Self-aligned quadruple patterning (SAQP) for routing layouts including multi-track jogs

IBM15 citations93
US9553019B1Jan 24, 2017

Airgap protection layer for via alignment

IBM20 citations93
US9449871B1Sep 20, 2016

Hybrid airgap structure with oxide liner

IBM21 citations92
US11152257B2Oct 19, 2021

Barrier-less prefilled via formation

IBM5 citations84
US11004790B2May 11, 2021

Method of manufacturing an interconnect without dielectric exclusion zones by thermal decomposition of a sacrificial filler material

IBM4 citations84
US10770653B1Sep 8, 2020

Selective dielectric deposition to prevent gouging in MRAM

IBM7 citations84
US10529569B2Jan 7, 2020

Self aligned pattern formation post spacer etchback in tight pitch configurations

IBM5 citations84
US10366952B2Jul 30, 2019

Semiconductor device including a porous dielectric layer, and method of forming the semiconductor device

IBM5 citations84
US10361157B2Jul 23, 2019

Method of manufacturing self-aligned interconnects by deposition of a non-conformal air-gap forming layer having an undulated upper surface

IBM6 citations84
US10242933B2Mar 26, 2019

Air gap and air spacer pinch off

IBM4 citations84
US10109579B2Oct 23, 2018

Semiconductor device including a porous dielectric layer, and method of forming the semiconductor device

IBM8 citations84
US10083905B2Sep 25, 2018

Skip-vias bypassing a metallization level at minimum pitch

IBM9 citations84
US9997451B2Jun 12, 2018

Semiconductor device including a porous dielectric layer, and method of forming the semiconductor device

IBM5 citations84
US9837305B1Dec 5, 2017

Forming deep airgaps without flop over

IBM10 citations84
US9793193B1Oct 17, 2017

Air gap and air spacer pinch off

IBM7 citations84
US9793206B1Oct 17, 2017

Heterogeneous metallization using solid diffusion removal of metal interconnects

IBM8 citations84
US9779944B1Oct 3, 2017

Method and structure for cut material selection

IBM17 citations84
US9780027B2Oct 3, 2017

Hybrid airgap structure with oxide liner

IBM13 citations84
US9607886B1Mar 28, 2017

Self aligned conductive lines with relaxed overlay

IBM6 citations84
US7544609B2Jun 9, 2009

Method for integrating liner formation in back end of line processing

IBM9 citations84
US9711455B2Jul 18, 2017

Method of forming an air gap semiconductor structure with selective cap bilayer

IBM5 citations83
US9685366B1Jun 20, 2017

Forming chamferless vias using thermally decomposable porefiller

IBM12 citations83
US9978560B2May 22, 2018

System and method for performing nano beam diffraction analysis

IBM6 citations80
US11894265B2Feb 6, 2024

Top via with damascene line and via

IBM2 citations73
US11735524B2Aug 22, 2023

Electrical device having conductive lines with air gaps therebetween and interconnects without exclusion zones

IBM3 citations73
US11348060B2May 31, 2022

Increasing cost benefit and energy efficiency with modular delivery drones in inclement weather

IBM2 citations73
US11276639B2Mar 15, 2022

Conductive lines with subtractive cuts

IBM3 citations73
US11195795B1Dec 7, 2021

Well-controlled edge-to-edge spacing between adjacent interconnects

IBM3 citations73
US11195792B2Dec 7, 2021

Top via stack

IBM2 citations73
US11189568B2Nov 30, 2021

Top via interconnect having a line with a reduced bottom dimension

IBM2 citations73
US11171084B2Nov 9, 2021

Top via with next level line selective growth

IBM2 citations73
US11139201B2Oct 5, 2021

Top via with hybrid metallization

IBM2 citations73
US10978343B2Apr 13, 2021

Interconnect structure having fully aligned vias

IBM2 citations73

TESSERA LLC

3 patents

TESSERA INC

2 patents

ADEIA SEMICONDUCTOR SOLUTIONS LLC

2 patents

YANG CHIH-CHAO

1 patent

Showing the top 50 of 171 patents by PatentIndex Score.