Inventor
BASU ANIRBAN
US70 patents
⚠️ This page may combine multiple inventors who share the name “BASU ANIRBAN”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
IBM
43 patentsUS9287362B1Mar 15, 2016
Vertical field effect transistors with controlled overlap between gate electrode and source/drain contacts
IBM62 citations98
US9287360B1Mar 15, 2016
III-V nanowire FET with compositionally-graded channel and wide-bandgap core
IBM22 citations93
US8937299B2Jan 20, 2015
III-V finFETs on silicon substrate
IBM40 citations93
US9564514B2Feb 7, 2017
Reducing direct source-to-drain tunneling in field effect transistors with low effective mass channels
IBM5 citations84
US9397226B2Jul 19, 2016
Vertical field effect transistors with controlled overlap between gate electrode and source/drain contacts
IBM12 citations84
US9337309B1May 10, 2016
Reducing direct source-to-drain tunneling in field effect transistors with low effective mass channels
IBM7 citations84
US9337255B1May 10, 2016
Reducing direct source-to-drain tunneling in field effect transistors with low effective mass channels
IBM7 citations84
US9270940B1Feb 23, 2016
Remote object sensing in video
IBM12 citations84
US9263260B1Feb 16, 2016
Nanowire field effect transistor with inner and outer gates
IBM10 citations84
US9136357B1Sep 15, 2015
Fabrication process for mitigating external resistance and interface state density in a multigate device
IBM9 citations84
US9070770B2Jun 30, 2015
Low interfacial defect field effect transistor
IBM12 citations84
US8877574B1Nov 4, 2014
Elemental semiconductor material contact for high electron mobility transistor
IBM7 citations84
US10529855B2Jan 7, 2020
Charge carrier transport facilitated by strain
IBM1 citations73
US10249719B2Apr 2, 2019
Device isolation using preferential oxidation of the bulk substrate
IBM2 citations73
US10243050B2Mar 26, 2019
Device isolation using preferential oxidation of the bulk substrate
IBM2 citations73
US9865688B2Jan 9, 2018
Device isolation using preferential oxidation of the bulk substrate
IBM2 citations73
US9698046B2Jul 4, 2017
Fabrication of III-V-on-insulator platforms for semiconductor devices
IBM2 citations73
US9653606B2May 16, 2017
Fabrication process for mitigating external resistance of a multigate device
IBM4 citations73
US9520496B2Dec 13, 2016
Charge carrier transport facilitated by strain
IBM4 citations73
US9484463B2Nov 1, 2016
Fabrication process for mitigating external resistance of a multigate device
IBM4 citations73
US9425312B2Aug 23, 2016
Silicon-containing, tunneling field-effect transistor including III-N source
IBM3 citations73
US9368574B1Jun 14, 2016
Nanowire field effect transistor with inner and outer gates
IBM5 citations73
US9343569B2May 17, 2016
Vertical compound semiconductor field effect transistor on a group IV semiconductor substrate
IBM3 citations73
US9275546B2Mar 1, 2016
System and method for minimizing the time to park a vehicle
IBM6 citations70
US10978562B2Apr 13, 2021
Device isolation using preferential oxidation of the bulk substrate
IBM0 citations63
US9997630B2Jun 12, 2018
Charge carrier transport facilitated by strain
IBM1 citations63
US9773909B2Sep 26, 2017
Silicon-containing, tunneling field-effect transistor including III-N source
IBM1 citations63
US9530921B2Dec 27, 2016
Multi-junction solar cell
IBM1 citations63
US9318561B2Apr 19, 2016
Device isolation for III-V substrates
IBM2 citations63
US9159822B2Oct 13, 2015
III-V semiconductor device having self-aligned contacts
IBM3 citations63
US9150434B2Oct 6, 2015
Electricity-less water disinfection
IBM2 citations63
US10580926B2Mar 3, 2020
Multi-junction solar cell
IBM0 citations52
US10559666B2Feb 11, 2020
Device isolation using preferential oxidation of the bulk substrate
IBM0 citations52
US10367065B2Jul 30, 2019
Device isolation for III-V substrates
IBM0 citations52
US10312400B2Jun 4, 2019
Multi-junction solar cell
IBM0 citations52
US10096711B2Oct 9, 2018
Silicon-containing, tunneling field-effect transistor including III-N source
IBM0 citations52
US10050110B2Aug 14, 2018
Device isolation for III-V substrates
IBM0 citations52
US9985113B2May 29, 2018
Fabrication process for mitigating external resistance of a multigate device
IBM0 citations52
US9748357B2Aug 29, 2017
III-V MOSFET with strained channel and semi-insulating bottom barrier
IBM0 citations52
US9716150B2Jul 25, 2017
Device isolation for III-V substrates
IBM0 citations52
US9553015B2Jan 24, 2017
Fabrication of III-V-on-insulator platforms for semiconductor devices
IBM0 citations52
US9502562B2Nov 22, 2016
Fin field effect transistor including self-aligned raised active regions
IBM0 citations52
US9472658B2Oct 18, 2016
III-V nanowire FET with compositionally-graded channel and wide-bandgap core
IBM0 citations52
GLOBALFOUNDRIES INC
3 patentsUS9276077B2Mar 1, 2016
Contact metallurgy for self-aligned high electron mobility transistor
GLOBALFOUNDRIES INC7 citations84
US9666684B2May 30, 2017
III-V semiconductor device having self-aligned contacts
GLOBALFOUNDRIES INC5 citations73
US9224866B2Dec 29, 2015
Suspended body field effect transistor
GLOBALFOUNDRIES INC4 citations73
MICROSOFT TECHNOLOGY LICENSING LLC
2 patentsADOBE INC
2 patentsShowing the top 50 of 70 patents by PatentIndex Score.