Inventor · disambiguated record

Matthew J. Hartnett

Also filed as: HARTNETT MATTHEW J

1 granted patent·0 citations·filing 2015–2015

4Inventor score

Technology areasH10P

Files withGLOBALFOUNDRIES INC1

Top patents by PatentIndex Score

1 record

0119US9791849B2Defect detection process in a semiconductor manufacturing environmentGLOBALFOUNDRIES INC·Filed 2015·Granted Oct 17, 2017·0 cites·18 claims

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