P

Inventor

GEFFKEN ROBERT M

US34 patents
⚠️ This page may combine multiple inventors who share the name “GEFFKEN ROBERT M”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

IBM

32 patents
US7071532B2Jul 4, 2006

Adjustable self-aligned air gap dielectric for low capacitance wiring

IBM243 citations99
US5985762ANov 16, 1999

Method of forming a self-aligned copper diffusion barrier in vias

IBM284 citations99
US6236103B1May 22, 2001

Integrated high-performance decoupling capacitor and heat sink

IBM93 citations98
US5126006AJun 30, 1992

Plural level chip masking

IBM133 citations97
US4423547AJan 3, 1984

Method for forming dense multilevel interconnection metallurgy for semiconductor devices

IBM245 citations97
US6680514B1Jan 20, 2004

Contact capping local interconnect

IBM48 citations96
US6498385B1Dec 24, 2002

Post-fuse blow corrosion prevention structure for copper fuses

IBM68 citations96
US6452251B1Sep 17, 2002

Damascene metal capacitor

IBM61 citations96
US6426249B1Jul 30, 2002

Buried metal dual damascene plate capacitor

IBM64 citations96
US6344373B1Feb 5, 2002

Antifuse structure and process

IBM45 citations96
US6150723ANov 21, 2000

Copper stud structure with refractory metal liner

IBM71 citations96
US5811870ASep 22, 1998

Antifuse structure

IBM49 citations96
US6495917B1Dec 17, 2002

Method and structure of column interconnect

IBM71 citations95
US5457345AOct 10, 1995

Metallization composite having nickle intermediate/interface

IBM56 citations94
US6939791B2Sep 6, 2005

Contact capping local interconnect

IBM18 citations93
US6888251B2May 3, 2005

Metal spacer in single and dual damascene processing

IBM26 citations93
US6846741B2Jan 25, 2005

Sacrificial metal spacer damascene process

IBM38 citations93
US6746947B2Jun 8, 2004

Post-fuse blow corrosion prevention structure for copper fuses

IBM20 citations93
US6548338B2Apr 15, 2003

Integrated high-performance decoupling capacitor and heat sink

IBM39 citations93
US6300236B1Oct 9, 2001

Copper stud structure with refractory metal liner

IBM33 citations92
US6982227B2Jan 3, 2006

Single and multilevel rework

IBM16 citations91
US6674168B1Jan 6, 2004

Single and multilevel rework

IBM17 citations91
US6503827B1Jan 7, 2003

Method of reducing planarization defects

IBM42 citations91
US6426558B1Jul 30, 2002

Metallurgy for semiconductor devices

IBM28 citations91
US5339212AAug 16, 1994

Sidewall decoupling capacitor

IBM23 citations88
US7358148B2Apr 15, 2008

Adjustable self-aligned air gap dielectric for low capacitance wiring

IBM14 citations84
US7393777B2Jul 1, 2008

Sacrificial metal spacer damascene process

IBM8 citations74
US7381637B2Jun 3, 2008

Metal spacer in single and dual damascence processing

IBM5 citations74
US5585674ADec 17, 1996

Transverse diffusion barrier interconnect structure

IBM14 citations74
US5488013AJan 30, 1996

Method of forming transverse diffusion barrier interconnect structure

IBM14 citations74
US7655547B2Feb 2, 2010

Metal spacer in single and dual damascene processing

IBM2 citations63
US6420263B1Jul 16, 2002

Method for controlling extrusions in aluminum metal lines and the device formed therefrom

IBM2 citations60

TEL EPION INC

1 patent

TEL EPION CORP

1 patent