Inventor
SIM GYOO-CHAN
KR7 patents
Patents
7 patentsUS6374380B1Apr 16, 2002
Boundary scan cells to improve testability of core-embedded circuits
SAMSUNG ELECTRONICS CO LTD45 citations90
US6199184B1Mar 6, 2001
Parallel signature compression circuit and method for designing the same
SAMSUNG ELECTRONICS CO LTD26 citations90
US6546511B1Apr 8, 2003
Apparatus and method for parallel testing of multiple functional blocks of an integrated circuit
SAMSUNG ELECTRONICS CO LTD21 citations89
US6240537B1May 29, 2001
Signature compression circuit and method
SAMSUNG ELECTRONICS CO LTD8 citations71
US6125460ASep 26, 2000
Method for testing semiconductor device having embedded nonvolatile memory
SAMSUNG ELECTRONICS CO LTD14 citations71
US6691289B2Feb 10, 2004
Semiconductor integrated circuit including circuit for selecting embedded tap cores
SAMSUNG ELECTRONICS CO LTD7 citations70
US6573742B2Jun 3, 2003
Semiconductor integrated circuit with test points inserted thereinto
SAMSUNG ELECTRONICS CO LTD5 citations60