Inventor
LEE JANG-EUN
KR55 patents
⚠️ This page may combine multiple inventors who share the name “LEE JANG-EUN”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
SAMSUNG ELECTRONICS CO LTD
36 patentsUS7952914B2May 31, 2011
Memory devices including multi-bit memory cells having magnetic and resistive memory elements and related methods
SAMSUNG ELECTRONICS CO LTD45 citations98
US7495984B2Feb 24, 2009
Resistive memory devices including selected reference memory cells
SAMSUNG ELECTRONICS CO LTD54 citations98
US7351594B2Apr 1, 2008
Methods of forming magnetic random access memory devices having titanium-rich lower electrodes with oxide layer and oriented tunneling barrier
SAMSUNG ELECTRONICS CO LTD102 citations98
US7352021B2Apr 1, 2008
Magnetic random access memory devices having titanium-rich lower electrodes with oxide layer and oriented tunneling barrier
SAMSUNG ELECTRONICS CO LTD96 citations98
US6464794B1Oct 15, 2002
Process chamber used in manufacture of semiconductor device, capable of reducing contamination by particulates
SAMSUNG ELECTRONICS CO LTD75 citations94
US7672155B2Mar 2, 2010
Resistive memory devices including selected reference memory cells
SAMSUNG ELECTRONICS CO LTD23 citations92
US7482616B2Jan 27, 2009
Semiconductor devices having phase change memory cells, electronic systems employing the same and methods of fabricating the same
SAMSUNG ELECTRONICS CO LTD39 citations92
US7473597B2Jan 6, 2009
Method of forming via structures and method of fabricating phase change memory devices incorporating such via structures
SAMSUNG ELECTRONICS CO LTD21 citations92
US7378698B2May 27, 2008
Magnetic tunnel junction and memory device including the same
SAMSUNG ELECTRONICS CO LTD51 citations92
US6756292B2Jun 29, 2004
Method of forming a quantum dot and a gate electrode using the same
SAMSUNG ELECTRONICS CO LTD46 citations92
US6291342B2Sep 18, 2001
Methods of forming titanium nitride composite layers using composite gases having increasing TiCl4 to NH3 ratios
SAMSUNG ELECTRONICS CO LTD19 citations92
US9373781B2Jun 21, 2016
Dual perpendicular magnetic anisotropy magnetic junction usable in spin transfer torque magnetic random access memory applications
SAMSUNG ELECTRONICS CO LTD9 citations84
US8345467B2Jan 1, 2013
Resistive memory devices including selected reference memory cells operating responsive to read operations
SAMSUNG ELECTRONICS CO LTD6 citations84
US8026543B2Sep 27, 2011
Semiconductor devices having phase change memory cells, electronic systems employing the same and methods of fabricating the same
SAMSUNG ELECTRONICS CO LTD12 citations84
US8023311B2Sep 20, 2011
Resistive memory devices including selected reference memory cells operating responsive to read operations
SAMSUNG ELECTRONICS CO LTD7 citations84
US7871866B2Jan 18, 2011
Method of manufacturing semiconductor device having transition metal oxide layer and related device
SAMSUNG ELECTRONICS CO LTD10 citations84
US7791923B2Sep 7, 2010
Multi-state resistive memory element, multi-bit resistive memory cell, operating method thereof, and data processing system using the memory element
SAMSUNG ELECTRONICS CO LTD11 citations84
US7218556B2May 15, 2007
Method of writing to MRAM devices
SAMSUNG ELECTRONICS CO LTD10 citations84
US7141438B2Nov 28, 2006
Magnetic tunnel junction structure having an oxidized buffer layer and method of fabricating the same
SAMSUNG ELECTRONICS CO LTD17 citations84
US12014988B2Jun 18, 2024
Semiconductor device having a graphene film and method for fabricating thereof
SAMSUNG ELECTRONICS CO LTD2 citations73
US7750336B2Jul 6, 2010
Resistive memory devices and methods of forming resistive memory devices
SAMSUNG ELECTRONICS CO LTD6 citations73
US7645619B2Jan 12, 2010
Magnetic random access memory device and method of forming the same
SAMSUNG ELECTRONICS CO LTD5 citations73
US9818931B2Nov 14, 2017
Method and system for providing magnetic junctions using thermally assisted spin transfer torque switching
SAMSUNG ELECTRONICS CO LTD2 citations72
US7701748B2Apr 20, 2010
Nonvolatile memory devices using variable resistors as storage elements and methods of operating the same
SAMSUNG ELECTRONICS CO LTD7 citations72
US6797109B2Sep 28, 2004
Process chamber used in manufacture of semiconductor device, capable of reducing contamination by particulates
SAMSUNG ELECTRONICS CO LTD7 citations71
US7838863B2Nov 23, 2010
Semiconductor devices having resistive memory elements
SAMSUNG ELECTRONICS CO LTD6 citations70
US9306155B2Apr 5, 2016
Method and system for providing a bulk perpendicular magnetic anisotropy free layer in a perpendicular magnetic junction usable in spin transfer torque magnetic random access memory applications
SAMSUNG ELECTRONICS CO LTD2 citations63
US8035145B2Oct 11, 2011
Magnetic memory device
SAMSUNG ELECTRONICS CO LTD2 citations63
US7612969B2Nov 3, 2009
Magnetic memory device and method of fabricating the same
SAMSUNG ELECTRONICS CO LTD6 citations63
US7582890B2Sep 1, 2009
Magnetic tunnel junction structures having bended tips at both ends thereof, magnetic random access memory cells employing the same and photomasks used in formation thereof
SAMSUNG ELECTRONICS CO LTD3 citations62
US7372090B2May 13, 2008
Magnetic random access memory device and method of forming the same
SAMSUNG ELECTRONICS CO LTD2 citations62
US12167587B2Dec 10, 2024
Semiconductor memory device and method of fabricating the same
SAMSUNG ELECTRONICS CO LTD0 citations59
US11854979B2Dec 26, 2023
Semiconductor device
SAMSUNG ELECTRONICS CO LTD0 citations52
US7732222B2Jun 8, 2010
Magnetic memory device and method of fabricating the same
SAMSUNG ELECTRONICS CO LTD0 citations52
US7317219B2Jan 8, 2008
Magnetic random access memory (MRAM) and method of manufacturing the same
SAMSUNG ELECTRONICS CO LTD0 citations52
US9159914B2Oct 13, 2015
Nonvolatile memory devices and methods of forming the same
SAMSUNG ELECTRONICS CO LTD0 citations51
PARK JEONG HEON
5 patentsUS9065039B2Jun 23, 2015
Magnetic tunneling junction devices, memories, electronic systems, and memory systems, and methods of fabricating the same
PARK JEONG HEON5 citations83
US8772846B2Jul 8, 2014
Magnetic tunneling junction devices, memories, memory systems, and electronic devices
PARK JEONG HEON4 citations83
US9356228B2May 31, 2016
Magnetic tunneling junction devices, memories, memory systems, and electronic devices
PARK JEONG HEON0 citations51
US8987798B2Mar 24, 2015
Magnetic tunneling junction devices, memories, memory systems, and electronic devices
PARK JEONG HEON0 citations51
US8947914B2Feb 3, 2015
Magnetic tunneling junction devices, memories, electronic systems, and memory systems, and methods of fabricating the same
PARK JEONG HEON1 citations51
JEONG JUN-HO
2 patentsSAMSUNG ELECTRONICS CO INC
1 patentBAEK IN-GYU
1 patentLEE JANG-EUN
1 patentSHIN HEE-JU
1 patentYIM EUN-KYUNG
1 patentAPALKOV DMYTRO
1 patentLIM WOO-CHANG
1 patentShowing the top 50 of 55 patents by PatentIndex Score.