Inventor
AVANZINO STEVEN
US43 patents
⚠️ This page may combine multiple inventors who share the name “AVANZINO STEVEN”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
ADVANCED MICRO DEVICES INC
22 patentsUS5705430AJan 6, 1998
Dual damascene with a sacrificial via fill
ADVANCED MICRO DEVICES INC173 citations99
US5614765AMar 25, 1997
Self aligned via dual damascene
ADVANCED MICRO DEVICES INC172 citations99
US5795823AAug 18, 1998
Self aligned via dual damascene
ADVANCED MICRO DEVICES INC114 citations98
US6143656ANov 7, 2000
Slurry for chemical mechanical polishing of copper
ADVANCED MICRO DEVICES INC67 citations96
US5691238ANov 25, 1997
Subtractive dual damascene
ADVANCED MICRO DEVICES INC68 citations96
US5686354ANov 11, 1997
Dual damascene with a protective mask for via etching
ADVANCED MICRO DEVICES INC80 citations96
US5837618ANov 17, 1998
Uniform nonconformal deposition for forming low dielectric constant insulation between certain conductive lines
ADVANCED MICRO DEVICES INC53 citations95
US5776834AJul 7, 1998
Bias plasma deposition for selective low dielectric insulation
ADVANCED MICRO DEVICES INC45 citations95
US7071564B1Jul 4, 2006
Composite tantalum capped inlaid copper with reduced electromigration and reduced stress migration
ADVANCED MICRO DEVICES INC29 citations93
US5990557ANov 23, 1999
Bias plasma deposition for selective low dielectric insulation
ADVANCED MICRO DEVICES INC18 citations92
US5955786ASep 21, 1999
Semiconductor device using uniform nonconformal deposition for forming low dielectric constant insulation between certain conductive lines
ADVANCED MICRO DEVICES INC20 citations92
US5770519AJun 23, 1998
Copper reservoir for reducing electromigration effects associated with a conductive via in a semiconductor device
ADVANCED MICRO DEVICES INC49 citations92
US5691573ANov 25, 1997
Composite insulation with a dielectric constant of less than 3 in a narrow space separating conductive lines
ADVANCED MICRO DEVICES INC44 citations92
US5639691AJun 17, 1997
Copper pellet for reducing electromigration effects associated with a conductive via in a semiconductor device
ADVANCED MICRO DEVICES INC19 citations92
US6051882AApr 18, 2000
Subtractive dual damascene semiconductor device
ADVANCED MICRO DEVICES INC17 citations90
US6422918B1Jul 23, 2002
Chemical-mechanical polishing of photoresist layer
ADVANCED MICRO DEVICES INC14 citations81
US6048802AApr 11, 2000
Selective nonconformal deposition for forming low dielectric insulation between certain conductive lines
ADVANCED MICRO DEVICES INC15 citations73
US5646448AJul 8, 1997
Copper pellet for reducing electromigration effects associated with a conductive via in a semiconductor device
ADVANCED MICRO DEVICES INC7 citations73
US6465156B1Oct 15, 2002
Method for mitigating formation of silicon grass
ADVANCED MICRO DEVICES INC3 citations63
US6352817B1Mar 5, 2002
Methodology for mitigating formation of t-tops in photoresist
ADVANCED MICRO DEVICES INC2 citations63
US6332989B1Dec 25, 2001
Slurry for chemical mechanical polishing of copper
ADVANCED MICRO DEVICES INC3 citations63
US6518185B1Feb 11, 2003
Integration scheme for non-feature-size dependent cu-alloy introduction
ADVANCED MICRO DEVICES INC5 citations62
SPANSION LLC
12 patentsUS7035141B1Apr 25, 2006
Diode array architecture for addressing nanoscale resistive memory arrays
SPANSION LLC111 citations97
US7307321B1Dec 11, 2007
Memory device with improved data retention
SPANSION LLC21 citations92
US7468525B2Dec 23, 2008
Test structures for development of metal-insulator-metal (MIM) devices
SPANSION LLC4 citations61
US7220642B2May 22, 2007
Protection of active layers of memory cells during processing of other elements
SPANSION LLC2 citations61
US8035099B2Oct 11, 2011
Diode and resistive memory device structures
SPANSION LLC0 citations52
US7968464B2Jun 28, 2011
Memory device with improved data retention
SPANSION LLC0 citations52
US7830015B2Nov 9, 2010
Memory device with improved data retention
SPANSION LLC1 citations52
US7384800B1Jun 10, 2008
Method of fabricating metal-insulator-metal (MIM) device with stable data retention
SPANSION LLC0 citations52
US8828837B2Sep 9, 2014
Metal-insulator-metal (MIM) device and method of formation thereof
SPANSION LLC0 citations51
US7706168B2Apr 27, 2010
Erase, programming and leakage characteristics of a resistive memory device
SPANSION LLC0 citations51
US7790497B2Sep 7, 2010
Method to prevent alloy formation when forming layered metal oxides by metal oxidation
SPANSION LLC0 citations50
US9012299B2Apr 21, 2015
Metal-insualtor-metal (MIM) device and method of formation thereof
SPANSION LLC0 citations49
RATHOR MANUJ
4 patentsUS8093698B2Jan 10, 2012
Gettering/stop layer for prevention of reduction of insulating oxide in metal-insulator-metal device
RATHOR MANUJ6 citations71
US8093680B1Jan 10, 2012
Metal-insulator-metal-insulator-metal (MIMIM) memory device
RATHOR MANUJ2 citations61
US8803120B2Aug 12, 2014
Diode and resistive memory device structures
RATHOR MANUJ1 citations51
US8717803B2May 6, 2014
Metal-insulator-metal-insulator-metal (MIMIM) memory device
RATHOR MANUJ1 citations51
PANGRLE SUZETTE K
3 patentsUS8232175B2Jul 31, 2012
Damascene metal-insulator-metal (MIM) device with improved scaleability
PANGRLE SUZETTE K0 citations48
US8089113B2Jan 3, 2012
Damascene metal-insulator-metal (MIM) device
PANGRLE SUZETTE K1 citations48
US9343666B2May 17, 2016
Damascene metal-insulator-metal (MIM) device with improved scaleability
PANGRLE SUZETTE K0 citations47