Inventor · disambiguated record

Yamada Naruhito

Also filed as: NARUHITO YAMADA

1 granted patent·72 citations·filing 1995–1995

51Inventor score

Technology areasG01R

Files withADVANTEST CORP1

Top patents by PatentIndex Score

1 record

0182US5788084AAutomatic testing system and method for semiconductor devicesADVANTEST CORP·Filed 1995·Granted Aug 4, 1998·72 cites·5 claims

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