Inventor
WATANABE NAOYA
JP79 patents
⚠️ This page may combine multiple inventors who share the name “WATANABE NAOYA”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
MITSUBISHI ELECTRIC CORP
19 patentsUS5963502AOct 5, 1999
Clock-synchronous type semiconductor memory device capable of outputting read clock signal at correct timing
MITSUBISHI ELECTRIC CORP175 citations99
US5404338AApr 4, 1995
Synchronous type semiconductor memory device operating in synchronization with an external clock signal
MITSUBISHI ELECTRIC CORP242 citations99
US6418067B1Jul 9, 2002
Semiconductor memory device suitable for merging with logic
MITSUBISHI ELECTRIC CORP97 citations98
US6292040B1Sep 18, 2001
Internal clock signal generating circuit having function of generating internal clock signals which are multiplication of an external clock signal
MITSUBISHI ELECTRIC CORP90 citations98
US5994934ANov 30, 1999
Delay locked loop circuit
MITSUBISHI ELECTRIC CORP142 citations98
US6392897B1May 21, 2002
Circuit module
MITSUBISHI ELECTRIC CORP66 citations96
US6101151AAug 8, 2000
Synchronous semiconductor memory device employing temporary data output stop scheme
MITSUBISHI ELECTRIC CORP68 citations96
US5956349ASep 21, 1999
Semiconductor memory device for high speed data communication capable of accurate testing of pass/fail and memory system employing the same
MITSUBISHI ELECTRIC CORP55 citations96
US5517462AMay 14, 1996
Synchronous type semiconductor memory device operating in synchronization with an external clock signal
MITSUBISHI ELECTRIC CORP81 citations96
US6421291B1Jul 16, 2002
Semiconductor memory device having high data input/output frequency and capable of efficiently testing circuit associated with data input/output
MITSUBISHI ELECTRIC CORP34 citations93
US6378102B1Apr 23, 2002
Synchronous semiconductor memory device with multi-bank configuration
MITSUBISHI ELECTRIC CORP23 citations93
US6345348B2Feb 5, 2002
Memory system capable of supporting different memory devices and a memory device used therefor
MITSUBISHI ELECTRIC CORP25 citations93
US6304502B1Oct 16, 2001
Semiconductor memory device connected to memory controller and memory system employing the same
MITSUBISHI ELECTRIC CORP26 citations93
US6249476B1Jun 19, 2001
Semiconductor memory device suitable for mounting mixed with logic circuit, having short cycle time in reading operation
MITSUBISHI ELECTRIC CORP35 citations93
US6091659AJul 18, 2000
Synchronous semiconductor memory device with multi-bank configuration
MITSUBISHI ELECTRIC CORP36 citations93
US5956285ASep 21, 1999
Synchronous semiconductor memory device with multi-bank configuration
MITSUBISHI ELECTRIC CORP35 citations93
US5926837AJul 20, 1999
Memory system capable of reducing timing skew between clock signal and data
MITSUBISHI ELECTRIC CORP24 citations93
US6473352B2Oct 29, 2002
Semiconductor integrated circuit device having efficiently arranged link program circuitry
MITSUBISHI ELECTRIC CORP22 citations92
US6160434ADec 12, 2000
Ninety-degree phase shifter
MITSUBISHI ELECTRIC CORP23 citations92
CANON KK
7 patentsUS7113976B2Sep 26, 2006
Communication apparatus and control method of the same
CANON KK47 citations93
US5832190ANov 3, 1998
Image recording apparatus with reliable, efficient and power-saving stand-by state
CANON KK27 citations92
US6442252B1Aug 27, 2002
Communication apparatus
CANON KK24 citations91
US5689289ANov 18, 1997
Image recording apparatus
CANON KK32 citations91
US6519057B1Feb 11, 2003
Image recording apparatus and mode switching method in the apparatus
CANON KK13 citations84
US5911526AJun 15, 1999
Printing apparatus
CANON KK9 citations74
US5732196AMar 24, 1998
Data processing method and apparatus
CANON KK14 citations74
WATANABE NAOYA
3 patentsRENESAS ELECTRONICS CORP
3 patentsUS10121541B2Nov 6, 2018
Semiconductor device and information processing system
RENESAS ELECTRONICS CORP2 citations73
US9620214B2Apr 11, 2017
Content addressable memory with reduced power consumption and increased search operation speed
RENESAS ELECTRONICS CORP3 citations73
US9824757B2Nov 21, 2017
Semiconductor device including TCAM cell arrays capable of skipping TCAM-cell search in response to control signal
RENESAS ELECTRONICS CORP3 citations72
SII NANOTECHNOLOGY INC
3 patentsUS7285792B2Oct 23, 2007
Scratch repairing processing method and scanning probe microscope (SPM) used therefor
SII NANOTECHNOLOGY INC4 citations63
US7278299B2Oct 9, 2007
Method of processing vertical cross-section using atomic force microscope
SII NANOTECHNOLOGY INC2 citations63
US7259372B2Aug 21, 2007
Processing method using probe of scanning probe microscope
SII NANOTECHNOLOGY INC4 citations63
HONDA MOTOR CO LTD
2 patentsMITSUBISHI ELECTRIC ENG
2 patentsINAMI AKIKO
2 patentsSEIKO INSTR INC
2 patentsMAZDA MOTOR
1 patentNAGATSU KAZUHIRO
1 patentIWAI KOUHEI
1 patentNAT INST ADVANCED IND SCIENCE & TECH
1 patentKYOCERA CORP
1 patentAIST
1 patentOBA SHUJI
1 patentShowing the top 50 of 79 patents by PatentIndex Score.