Inventor · disambiguated record
Gyu-Yeol Kim
Also filed as: KIM GYU-YEOL
6 granted patents·1 pending application·6 citations·filing 2005–2019
72Inventor score
Top patents by PatentIndex Score
7 records- 0174US10309987B2Probe and probe card including the sameSAMSUNG ELECTRONICS CO LTD·Filed 2017·Granted Jun 4, 2019·2 cites·20 claims
- 0273US10811118B2Test interface boards, test systems, and methods of operating test interface boardsSAMSUNG ELECTRONICS CO LTD·Filed 2019·Granted Oct 20, 2020·1 cites·20 claims
- 0371US10935574B2Probe card assemblySAMSUNG ELECTRONICS CO LTD·Filed 2017·Granted Mar 2, 2021·1 cites·17 claims
- 0450US7433252B2Semiconductor memory device capable of storing data of various patterns and method of electrically testing the semiconductor memory deviceSAMSUNG ELECTRONICS CO LTD·Filed 2005·Granted Oct 7, 2008·2 cites·12 claims
- 0540US10996242B2Probe card and test apparatus including the sameSAMSUNG ELECTRONICS CO LTD·Filed 2017·Granted May 4, 2021·0 cites·18 claims
- 0640US8139949B2Electrical signal transmission module, method of transmitting electric signals and electrical inspection apparatus having the sameLEE SANG-HOON·Filed 2008·Granted Mar 20, 2012·0 cites·13 claims
- 0738US2008316846A1Semiconductor memory device capable of storing data of various patterns and method of electrically testing the semiconductor memory deviceSAMSUNG ELECTRONICS CO LTD·Filed 2008·Application pending·0 cites
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