Inventor · disambiguated record

Wen-Shan Hsiao

Also filed as: HSIAO WEN-SHAN

1 granted patent·0 citations·filing 2017–2017

4Inventor score

Technology areasG01R

Files withUNITED MICROELECTRONICS CORP1

Top patents by PatentIndex Score

1 record

0138US10145889B2Testkey structure and method of measuring device defect or connection defect by using the sameUNITED MICROELECTRONICS CORP·Filed 2017·Granted Dec 4, 2018·0 cites·19 claims

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