Inventor · disambiguated record
Ronaldus Johannes Gijsbertus Goossens
Also filed as: GOOSSENS RONALDUS JOHANNES GIJSBERTUS · GOOSSENS RONALDUS JOHANNES GLJSBERTUS · GOOSSENS RONALDUS JOHANNES GYSBERTUS
8 granted patents·1 pending application·44 citations·filing 2009–2020
85Inventor score
Top patents by PatentIndex Score
9 records- 0195US8874423B2Model-based scanner tuning systems and methodsASML NETHERLANDS BV·Filed 2013·Granted Oct 28, 2014·9 cites·26 claims
- 0294US8571845B2Model-based scanner tuning systems and methodsCAO YU·Filed 2009·Granted Oct 29, 2013·15 cites·13 claims
- 0392US8694928B2Pattern selection for lithographic model calibrationCAO YU·Filed 2009·Granted Apr 8, 2014·12 cites·12 claims
- 0489US8806387B2Model-based process simulation systems and methodsCAO YU·Filed 2009·Granted Aug 12, 2014·7 cites·18 claims
- 0575US10137643B2Model-based process simulation systems and methodsASML NETHERLANDS BV·Filed 2014·Granted Nov 27, 2018·1 cites·25 claims
- 0667US2020189192A1Model-based scanner tuning systems and methodsASML NETHERLANDS BV·Filed 2020·Application pending·0 cites
- 0762US9672301B2Pattern selection for lithographic model calibrationASML NETHERLANDS BV·Filed 2014·Granted Jun 6, 2017·0 cites·20 claims
- 0859US10569469B2Model-based scanner tuning systems and methodsASML NETHERLANDS BV·Filed 2014·Granted Feb 25, 2020·0 cites·20 claims
- 0947US11561480B2System and method for inspecting a waferASML NETHERLANDS BV·Filed 2019·Granted Jan 24, 2023·0 cites·20 claims
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