Inventor
HANSMA PAUL K
US26 patents
⚠️ This page may combine multiple inventors who share the name “HANSMA PAUL K”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
UNIV CALIFORNIA
19 patentsUSRE34489EDec 28, 1993
Atomic force microscope with optional replaceable fluid cell
UNIV CALIFORNIA153 citations98
US4935634AJun 19, 1990
Atomic force microscope with optional replaceable fluid cell
UNIV CALIFORNIA134 citations98
US4924091AMay 8, 1990
Scanning ion conductance microscope
UNIV CALIFORNIA115 citations96
US5479024ADec 26, 1995
Method and apparatus for performing near-field optical microscopy
UNIV CALIFORNIA115 citations94
US6871527B2Mar 29, 2005
Measurement head for atomic force microscopy and other applications
UNIV CALIFORNIA30 citations92
US5825020AOct 20, 1998
Atomic force microscope for generating a small incident beam spot
UNIV CALIFORNIA62 citations92
US5581082ADec 3, 1996
Combined scanning probe and scanning energy microscope
UNIV CALIFORNIA72 citations92
USRE34708EAug 30, 1994
Scanning ion conductance microscope
UNIV CALIFORNIA42 citations92
US6783709B2Aug 31, 2004
Self-healing organosiloxane materials containing reversible and energy-dispersive crosslinking domains
UNIV CALIFORNIA56 citations91
US4800274AJan 24, 1989
High resolution atomic force microscope
UNIV CALIFORNIA39 citations89
US7278298B2Oct 9, 2007
Scanner for probe microscopy
UNIV CALIFORNIA11 citations81
US7878987B2Feb 1, 2011
Methods and instruments for assessing bone fracture risk
UNIV CALIFORNIA10 citations79
US6376636B1Apr 23, 2002
Modular, energy-dissipating material and method for using it
UNIV CALIFORNIA8 citations73
US4566023AJan 21, 1986
Squeezable electron tunnelling junction
UNIV CALIFORNIA6 citations72
US6455838B2Sep 24, 2002
High sensitivity deflection sensing device
UNIV CALIFORNIA8 citations70
US7555941B2Jul 7, 2009
Scanner for probe microscopy
UNIV CALIFORNIA3 citations60
US6649902B2Nov 18, 2003
Summing the output of an array of optical detector segments in an atomic force microscope
UNIV CALIFORNIA1 citations48
US9983107B2May 29, 2018
Self-aligning probes and related devices
UNIV CALIFORNIA0 citations36
US10488391B2Nov 26, 2019
Neural circuit probe
UNIV CALIFORNIA0 citations30
DIGITAL INSTR INC
4 patentsUS5463897ANov 7, 1995
Scanning stylus atomic force microscope with cantilever tracking and optical access
DIGITAL INSTR INC115 citations98
US6032518AMar 7, 2000
Scanning stylus atomic force microscope with cantilever tracking and optical access
DIGITAL INSTR INC59 citations95
US5714682AFeb 3, 1998
Scanning stylus atomic force microscope with cantilever tracking and optical access
DIGITAL INSTR INC42 citations95
US5560244AOct 1, 1996
Scanning stylus atomic force microscope with cantilever tracking and optical access
DIGITAL INSTR INC70 citations95