Inventor
TRIVEDI JIGISH D
US97 patents
⚠️ This page may combine multiple inventors who share the name “TRIVEDI JIGISH D”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
MICRON TECHNOLOGY INC
49 patentsUS7517744B2Apr 14, 2009
Capacitorless DRAM on bulk silicon
MICRON TECHNOLOGY INC123 citations99
US7384849B2Jun 10, 2008
Methods of forming recessed access devices associated with semiconductor constructions
MICRON TECHNOLOGY INC113 citations99
US6436805B1Aug 20, 2002
Local interconnect structures and methods for making the same
MICRON TECHNOLOGY INC215 citations99
US5847463ADec 8, 1998
Local interconnect comprising titanium nitride barrier layer
MICRON TECHNOLOGY INC115 citations99
US6524901B1Feb 25, 2003
Method for forming a notched damascene planar poly/metal gate
MICRON TECHNOLOGY INC84 citations98
US7514366B2Apr 7, 2009
Methods for forming shallow trench isolation
MICRON TECHNOLOGY INC42 citations96
US7112513B2Sep 26, 2006
Sub-micron space liner and densification process
MICRON TECHNOLOGY INC37 citations96
US6599789B1Jul 29, 2003
Method of forming a field effect transistor
MICRON TECHNOLOGY INC67 citations96
US6548401B1Apr 15, 2003
Semiconductor processing methods, and semiconductor constructions
MICRON TECHNOLOGY INC60 citations96
US6355966B1Mar 12, 2002
Methods of forming an integrated circuitry isolation trench, method of forming integrated circuitry, and integrated circuitry
MICRON TECHNOLOGY INC60 citations96
US6093661AJul 25, 2000
Integrated circuitry and semiconductor processing method of forming field effect transistors
MICRON TECHNOLOGY INC74 citations96
US5981380ANov 9, 1999
Method of forming a local interconnect including selectively etched conductive layers and recess formation
MICRON TECHNOLOGY INC60 citations96
US6875697B2Apr 5, 2005
Dual depth trench isolation
MICRON TECHNOLOGY INC22 citations93
US6812529B2Nov 2, 2004
Suppression of cross diffusion and gate depletion
MICRON TECHNOLOGY INC19 citations93
US6683365B1Jan 27, 2004
Edge intensive antifuse device structure
MICRON TECHNOLOGY INC15 citations93
US6630718B1Oct 7, 2003
Transistor gate and local interconnect
MICRON TECHNOLOGY INC27 citations93
US6605533B2Aug 12, 2003
Process for forming low resistance metal silicide local interconnects
MICRON TECHNOLOGY INC19 citations93
US6583518B2Jun 24, 2003
Cross-diffusion resistant dual-polycide semiconductor structure and method
MICRON TECHNOLOGY INC18 citations93
US6498088B1Dec 24, 2002
Stacked local interconnect structure and method of fabricating same
MICRON TECHNOLOGY INC19 citations93
US6482689B2Nov 19, 2002
Stacked local interconnect structure and method of fabricating same
MICRON TECHNOLOGY INC17 citations93
US6440817B2Aug 27, 2002
Methods of forming integrated circuitry
MICRON TECHNOLOGY INC33 citations93
US6376358B1Apr 23, 2002
Method of forming plugs and local interconnect for embedded memory/system-on-chip (SOC) applications
MICRON TECHNOLOGY INC19 citations93
US6335254B1Jan 1, 2002
Methods of forming transistors
MICRON TECHNOLOGY INC34 citations93
US6323104B1Nov 27, 2001
Method of forming an integrated circuitry isolation trench, method of forming integrated circuitry, and integrated circuitry
MICRON TECHNOLOGY INC30 citations93
US6294464B1Sep 25, 2001
Low resistance metal silicide local interconnects and a method of making
MICRON TECHNOLOGY INC18 citations93
US7897460B2Mar 1, 2011
Methods of forming recessed access devices associated with semiconductor constructions
MICRON TECHNOLOGY INC25 citations92
US7271464B2Sep 18, 2007
Liner for shallow trench isolation
MICRON TECHNOLOGY INC15 citations92
US6893957B2May 17, 2005
Method of forming a dual damascene interconnect by selective metal deposition
MICRON TECHNOLOGY INC16 citations92
US6744102B2Jun 1, 2004
MOS transistors with nitrogen in the gate oxide of the p-channel transistor
MICRON TECHNOLOGY INC14 citations92
US6541395B1Apr 1, 2003
Semiconductor processing method of forming field effect transistors
MICRON TECHNOLOGY INC31 citations92
US6534866B1Mar 18, 2003
Dual damascene interconnect
MICRON TECHNOLOGY INC18 citations92
US6417546B2Jul 9, 2002
P-type FET in a CMOS with nitrogen atoms in the gate dielectric
MICRON TECHNOLOGY INC21 citations92
US7919829B2Apr 5, 2011
Liner for shallow trench isolation
MICRON TECHNOLOGY INC9 citations84
US7332388B2Feb 19, 2008
Method to simultaneously form both fully silicided and partially silicided dual work function transistor gates during the manufacture of a semiconductor device, semiconductor devices, and systems including same
MICRON TECHNOLOGY INC18 citations84
US7078284B2Jul 18, 2006
Method for forming a notched gate
MICRON TECHNOLOGY INC11 citations84
US6677650B2Jan 13, 2004
Silicon plugs and local interconnect for embedded memory and system-on-chip (SOC) applications
MICRON TECHNOLOGY INC15 citations84
US8035160B2Oct 11, 2011
Recessed access device for a memory
MICRON TECHNOLOGY INC5 citations74
US7210224B2May 1, 2007
Method for forming an antifuse
MICRON TECHNOLOGY INC5 citations74
US7153731B2Dec 26, 2006
Method of forming a field effect transistor with halo implant regions
MICRON TECHNOLOGY INC6 citations74
US7112482B2Sep 26, 2006
Method of forming a field effect transistor
MICRON TECHNOLOGY INC5 citations74
US7057218B2Jun 6, 2006
Edge intensive antifuse
MICRON TECHNOLOGY INC3 citations74
US6987291B2Jan 17, 2006
Integrated transistor circuitry
MICRON TECHNOLOGY INC9 citations74
US6844601B2Jan 18, 2005
Local interconnect structure for integrated circuit devices, source structure for the same, and method for fabricating the same
MICRON TECHNOLOGY INC4 citations74
US6809014B2Oct 26, 2004
Method to fabricate surface p-channel CMOS
MICRON TECHNOLOGY INC8 citations74
US6790781B2Sep 14, 2004
Dual depth trench isolation
MICRON TECHNOLOGY INC6 citations74
US6770921B2Aug 3, 2004
Sidewall strap for complementary semiconductor structures and method of making same
MICRON TECHNOLOGY INC5 citations74
US6740575B2May 25, 2004
Method for forming an antifuse
MICRON TECHNOLOGY INC3 citations74
US6724089B2Apr 20, 2004
Dual damascene interconnect
MICRON TECHNOLOGY INC9 citations74
US6639319B2Oct 28, 2003
Conductive structure in an integrated circuit
MICRON TECHNOLOGY INC10 citations74
PAREKH KUNAL R
1 patentShowing the top 50 of 97 patents by PatentIndex Score.