Inventor

HUANG CHIN-LING

TW35 patents

⚠️ This page may combine multiple inventors who share the name “HUANG CHIN-LING”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

HUANG CHIN-LING

NANYA TECHNOLOGY CORP

Device and method for detecting alignment of active areas and memory cell structures in DRAM devices

Device and method for detecting alignment of deep trench capacitors and word lines in DRAM devices

Semiconductor device with fuse and anti-fuse structures and method for forming the same

Semiconductor structure having vertical fin with oxidized sidewall and method of manufacturing the same

Semiconductor device with fuse-detecting structure

Semiconductor device and method for manufacturing the same

Test structure of DRAM

Antifuse structure

Semiconductor device structure with fuse and resistor and method for preparing the same

Semiconductor device structure with fuse and resistor and method for preparing the same

Method for preparing semiconductor device with copper-manganese liner

Method for fabricating semiconductor device with programmable anti-fuse feature

Semiconductor device with fuse and anti-fuse structures

Programmable memory device

Semiconductor device with copper-manganese liner and method for forming the same

Semiconductor device with air gaps between adjacent conductive lines

Method of manufacturing semiconductor structure having vertical fin with oxidized sidewall

Method for fabricating a semiconductor device with a programmable contact

Method for fabricating semiconductor device with programmable feature

Semiconductor device with programmable feature and method for fabricating the same

Semiconductor device with programmable anti-fuse feature and method for fabricating the same

Programmable memory device

Semiconductor device with a programmable contact and method for fabricating the same

Device and method for detecting alignment of active areas and memory cell structures in DRAM devices

Misalignment test structure and method thereof

Method and device for detecting whether the alignment of bit line contacts and active areas in DRAM devices is normal

Memory device and fabrication method thereof

Semiconductor device with copper-manganese liner and method for forming the same

Method for preparing a memory device

Anti-fuse structure

Memory device and fabrication method thereof

Method and device for detecting whether the alignment of bit line contacts and active areas in DRAM devices is normal

Antifuse structure

NANYA TECHONOLGY CORP

Misalignment test structure and method thereof

WU TIEH-CHIANG

Semiconductor device and method for fabricating thereof