Inventor · disambiguated record
Arian Kriesch
Also filed as: KRIESCH ARIAN
1 granted patent·2 pending applications·0 citations·filing 2022–2024
2Inventor score
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3 records- 0158US2024404786A1Method to investigate a semiconductor sample layer by layer and investigation device to perform such methodZEISS CARL SMT GMBH·Filed 2024·Application pending·0 cites
- 0252US2022368104A1Control device, control system, method for operating a control systemZEISS CARL SMT GMBH·Filed 2022·Application pending·0 cites
- 0348US12340972B2Method for operating a particle beam microscope, particle beam microscope and computer program productZEISS CARL MICROSCOPY GMBH·Filed 2022·Granted Jun 24, 2025·0 cites·20 claims
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