Inventor
CHEN FUSEN E
US51 patents
⚠️ This page may combine multiple inventors who share the name “CHEN FUSEN E”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
SGS THOMSON MICROELECTRONICS
29 patentsUS5130268AJul 14, 1992
Method for forming planarized shallow trench isolation in an integrated circuit and a structure formed thereby
SGS THOMSON MICROELECTRONICS138 citations99
US5410176AApr 25, 1995
Integrated circuit with planarized shallow trench isolation
SGS THOMSON MICROELECTRONICS91 citations96
US5270254ADec 14, 1993
Integrated circuit metallization with zero contact enclosure requirements and method of making the same
SGS THOMSON MICROELECTRONICS51 citations96
US5260229ANov 9, 1993
Method of forming isolated regions of oxide
SGS THOMSON MICROELECTRONICS86 citations96
US5108951AApr 28, 1992
Method for forming a metal contact
SGS THOMSON MICROELECTRONICS80 citations96
US5593921AJan 14, 1997
Method of forming vias
SGS THOMSON MICROELECTRONICS37 citations93
US5523624AJun 4, 1996
Integrated circuit device structure with dielectric and metal stacked plug in contact hole
SGS THOMSON MICROELECTRONICS28 citations93
US5371410ADec 6, 1994
Integrated circuit metallization with zero contact enclosure requirements
SGS THOMSON MICROELECTRONICS26 citations93
US5348901ASep 20, 1994
Interconnect and resistor for integrated circuits
SGS THOMSON MICROELECTRONICS20 citations93
US5309025AMay 3, 1994
Semiconductor bond pad structure and method
SGS THOMSON MICROELECTRONICS24 citations93
US5244827ASep 14, 1993
Method for planarized isolation for cmos devices
SGS THOMSON MICROELECTRONICS22 citations93
US5493144AFeb 20, 1996
Field progammable device with contact openings
SGS THOMSON MICROELECTRONICS17 citations82
US5403777AApr 4, 1995
Semiconductor bond pad structure and method
SGS THOMSON MICROELECTRONICS19 citations82
US4978637ADec 18, 1990
Local interconnect process for integrated circuits
SGS THOMSON MICROELECTRONICS20 citations82
US5582971ADec 10, 1996
Method of forming submicron contacts
SGS THOMSON MICROELECTRONICS13 citations74
US5578872ANov 26, 1996
Planar contact with a void
SGS THOMSON MICROELECTRONICS7 citations74
US5571752ANov 5, 1996
Method of forming a planar contact with a void
SGS THOMSON MICROELECTRONICS10 citations74
US5521411AMay 28, 1996
Transistor spacer etch pinpoint structure
SGS THOMSON MICROELECTRONICS9 citations74
US5510294AApr 23, 1996
Method of forming vias for multilevel metallization
SGS THOMSON MICROELECTRONICS11 citations74
US5444019AAug 22, 1995
Semiconductor contact via structure and method
SGS THOMSON MICROELECTRONICS11 citations74
US5440166AAug 8, 1995
Planarized isolation structure for CMOS devices
SGS THOMSON MICROELECTRONICS10 citations74
US5369302ANov 29, 1994
Method to improve step coverage by contact reflow
SGS THOMSON MICROELECTRONICS7 citations74
US5317192AMay 31, 1994
Semiconductor contact via structure having amorphous silicon side walls
SGS THOMSON MICROELECTRONICS15 citations74
US5182627AJan 26, 1993
Interconnect and resistor for integrated circuits
SGS THOMSON MICROELECTRONICS8 citations74
US5146309ASep 8, 1992
Method for forming polycrystalline silicon contacts
SGS THOMSON MICROELECTRONICS9 citations73
USRE35111EDec 5, 1995
Local interconnect process for integrated circuits
SGS THOMSON MICROELECTRONICS4 citations63
US5233135AAug 3, 1993
Interconnect for integrated circuits
SGS THOMSON MICROELECTRONICS4 citations63
US5075761ADec 24, 1991
Local interconnect for integrated circuits
SGS THOMSON MICROELECTRONICS2 citations63
US5759869AJun 2, 1998
Method to imporve metal step coverage by contact reflow
SGS THOMSON MICROELECTRONICS4 citations62
APPLIED MATERIALS INC
10 patentsUS6919275B2Jul 19, 2005
Method of preventing diffusion of copper through a tantalum-comprising barrier layer
APPLIED MATERIALS INC87 citations99
US7253109B2Aug 7, 2007
Method of depositing a tantalum nitride/tantalum diffusion barrier layer system
APPLIED MATERIALS INC44 citations96
US7074714B2Jul 11, 2006
Method of depositing a metal seed layer on semiconductor substrates
APPLIED MATERIALS INC26 citations96
US6758947B2Jul 6, 2004
Damage-free sculptured coating deposition
APPLIED MATERIALS INC47 citations96
US7381639B2Jun 3, 2008
Method of depositing a metal seed layer on semiconductor substrates
APPLIED MATERIALS INC10 citations93
US7687909B2Mar 30, 2010
Metal / metal nitride barrier layer for semiconductor device applications
APPLIED MATERIALS INC7 citations74
US7989343B2Aug 2, 2011
Method of depositing a uniform metal seed layer over a plurality of recessed semiconductor features
APPLIED MATERIALS INC2 citations63
US7795138B2Sep 14, 2010
Method of depositing a metal seed layer over recessed feature surfaces in a semiconductor substrate
APPLIED MATERIALS INC2 citations63
US9991157B2Jun 5, 2018
Method for depositing a diffusion barrier layer and a metal conductive layer
APPLIED MATERIALS INC0 citations52
US7589016B2Sep 15, 2009
Method of depositing a sculptured copper seed layer
APPLIED MATERIALS INC0 citations52
ST MICROELECTRONICS INC
9 patentsUS6271137B1Aug 7, 2001
Method of producing an aluminum stacked contact/via for multilayer
ST MICROELECTRONICS INC16 citations84
US6303452B1Oct 16, 2001
Method for making transistor spacer etch pinpoint structure
ST MICROELECTRONICS INC8 citations73
US5856233AJan 5, 1999
Method of forming a field programmable device
ST MICROELECTRONICS INC10 citations73
US6287963B1Sep 11, 2001
Method for forming a metal contact
ST MICROELECTRONICS INC5 citations63
US5977607ANov 2, 1999
Method of forming isolated regions of oxide
ST MICROELECTRONICS INC2 citations63
US5930673AJul 27, 1999
Method for forming a metal contact
ST MICROELECTRONICS INC4 citations63
US5847457ADec 8, 1998
Structure and method of forming vias
ST MICROELECTRONICS INC4 citations63
US6617242B1Sep 9, 2003
Method for fabricating interlevel contacts of aluminum/refractory metal alloys
ST MICROELECTRONICS INC6 citations62
US6242811B1Jun 5, 2001
Interlevel contact including aluminum-refractory metal alloy formed during aluminum deposition at an elevated temperature
ST MICROELECTRONICS INC5 citations62
CHIANG TONY
2 patentsUS9390970B2Jul 12, 2016
Method for depositing a diffusion barrier layer and a metal conductive layer
CHIANG TONY10 citations92
US8158511B2Apr 17, 2012
Method of depositing a uniform barrier layer and metal seed layer with reduced overhang over a plurality of recessed semiconductor features
CHIANG TONY1 citations62
Showing the top 50 of 51 patents by PatentIndex Score.