Inventor

ETOH JUN

JP59 patents

⚠️ This page may combine multiple inventors who share the name “ETOH JUN”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

ETOH JUN

HITACHI LTD

Ferroelectric memory

Large scale integrated circuit with sense amplifier circuits for low voltage operation

Large scale integrated circuit for low voltage operation

Semiconductor device and a method for fabricating the same

Large scale integrated circuit with sense amplifier circuits for low voltage operation

Semiconductor device having redundancy circuit

Semiconductor device having redundancy circuit

Semiconductor memory device and defect remedying method thereof

Semiconductor memory device and defect remedying method thereof

Semiconductor IC device having a voltage conversion circuit which generates an internal supply voltage having value compensated for external supply voltage variations

Reference voltage generator

Semiconductor memory having redundancy circuit

Large scale integrated circuit for low voltage operation

Semiconductor memory having redundancy circuit with means to switch power from a normal memory block to a spare memory block

Semiconductor device having a reference voltage generating circuit

Method for selectively initiating/terminating a test mode in an address multiplexed DRAM and address multiplexed DRAM having such a capability

Dynamic RAM device having a separate test mode capability

Protective circuit and device for metal-oxide-semiconductor field effect transistor and method for fabricating the device

Dynamic random access memory capable of fast erasing of storage data

Semiconductor memory having selectively activated blocks including CMOS sense amplifiers

Pulse drive circuit

Dynamic type semiconductor monolithic memory

Semiconductor memory device and defect remedying method thereof

Semiconductor memory device and defect remedying method thereof

Semiconductor memory device and defect remedying method thereof

Semiconductor memory device and defect remedying method thereof

Semiconductor memory device and defect remedying method thereof

Large scale integrated circuit having low internal operating voltage

Semiconductor memory device and defect remedying method thereof

Input buffer using a differential amplifier

Semiconductor device formed in a rectangle region on a semiconductor substrate including a voltage generating circuit

Semiconductor device having redundancy circuit

Semiconductor memory device having zigzag bonding pad arrangement

Semiconductor memory having redundancy circuit

Semiconductor memory having redundancy circuit

Address multiplexed dynamic RAM having a test mode capability

Method of testing memory cells in an address multiplexed dynamic ram including test mode selection

Semiconductor memory device and defect remedying method thereof

Semiconductor device having redundancy circuit

Semiconductor device having redundancy circuit

Semiconductor memory having redundancy circuit

Method of testing an address multiplexed dynamic RAM

RENESAS TECH CORP

Semiconductor device having redundancy circuit

Semiconductor device having redundancy circuit

Method for manufacturing memory device provided with a defect recovery mechanism featuring a redundancy circuit

HITACHI VLSI ENG

Large scale integrated circuit having low internal operating voltage

Semiconductor memory device and defect remedying method thereof

ELPIDA MEMORY INC

Large scale integrated circuit with sense amplifier circuits for low voltage operation

VICTOR COMPANY OF JAPAN

Reel brake and associated tension arm control device for a reversible tape recording and/or reproducing apparatus

HITACHI ULSI SYS CO LTD

Semiconductor memory device and defect remedying method thereof