Inventor · disambiguated record

Yu-Yiu Lin

Also filed as: LIN YU-YIU

1 granted patent·16 citations·filing 2001–2001

37Inventor score

Technology areasG01R

Files withUNITED MICROELECTRONICS CORP1

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1 record

0167US6583641B2Method of determining integrity of a gate dielectricUNITED MICROELECTRONICS CORP·Filed 2001·Granted Jun 24, 2003·16 cites·15 claims

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