Inventor

DO CHANG-HO

KR114 patents

⚠️ This page may combine multiple inventors who share the name “DO CHANG-HO”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

DO CHANG-HO

HYNIX SEMICONDUCTOR INC

Test operation of multi-port memory device

Circuit and method for initializing an internal logic unit in a semiconductor memory device

Method for measuring offset voltage of sense amplifier and semiconductor employing the method

Word line driving circuit, semiconductor memory device including the same, and method for testing the semiconductor memory device

Multi-port memory device with serial input/output interface

Semiconductor memory device

Semiconductor memory device and method for reading/writing data thereof

Power up signal generation circuit and method for generating power up signal

Multi-port memory device with serial input/output interface

Data input circuit of semiconductor memory device

Semiconductor memory device

Semiconductor memory device

Internal voltage generator capable of regulating an internal voltage of a semiconductor memory device

Semiconductor memory device performing self refresh operation

Circuit and method for fuse disposing in a semiconductor memory device

Internal voltage generator capable of regulating an internal voltage of a semiconductor memory device

Apparatus for delivering inputted signal data

Power-up circuit in semiconductor memory device

High voltage generator in semiconductor memory device

Internal voltage generating circuit in semiconductor memory device

Semiconductor memory device employing row repair scheme

Semiconductor memory device with signal aligning circuit

Semiconductor memory device with reduced sense amplification time and operation method thereof

Multi-port memory device with serial input/output interface

Semiconductor device with a power down mode

Internal voltage generator capable of regulating an internal voltage of a semiconductor memory device

Multi-bank testing apparatus for a synchronous dram

Bit line sense amplifier and semiconductor memory device having the same

Apparatus for generating internal voltage in test mode and its method

Semiconductor memory device

Semiconductor memory device

Memory device with test mode for controlling of bitline sensing margin time

Internal signal monitoring device in semiconductor memory device and method for monitoring the same

Internal voltage generating circuit of semiconductor device

High voltage generator and word line driving high voltage generator of memory device

Apparatus and method for testing semiconductor memory device

Apparatus and method for transmitting/receiving signals at high speed

Semiconductor device for receiving external signal having receiving circuit using internal reference voltage

DO CHANG-HO

Fuse circuit and semiconductor device having the same

Integrated circuit chip and semiconductor memory device

Semiconductor memory device and method for generating bit line equalizing signal

Multi-port memory device with serial input/output interface

Word line driving circuit, semiconductor memory device including the same, and method for testing the semiconductor memory device

Electrostatic discharge protection of semiconductor device

Monitoring circuit for semiconductor device

HYUNDAI ELECTRONICS IND

Row redundancy circuit using a fuse box independent of banks

Data transmission device

SK HYNIX INC

Signal receiver circuit

Internal voltage generation circuits

HYUNDI ELECTRONICS IND CO LTD

Multi-bank testing apparatus for a synchronous DRAM