Inventor
PATTEN DAVID T
US3 patents
Patents
3 patentsUS7262615B2Aug 28, 2007
Method and apparatus for testing a semiconductor structure having top-side and bottom-side connections
FREESCALE SEMICONDUCTOR INC30 citations86
US7808258B2Oct 5, 2010
Test interposer having active circuit component and method therefor
FREESCALE SEMICONDUCTOR INC9 citations82
US8044494B2Oct 25, 2011
Stackable molded packages and methods of making the same
FREESCALE SEMICONDUCTOR INC19 citations79