Inventor
SUK SUNG-DAE
KR60 patents
⚠️ This page may combine multiple inventors who share the name “SUK SUNG-DAE”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
SAMSUNG ELECTRONICS CO LTD
36 patentsUS9601569B1Mar 21, 2017
Semiconductor device having a gate all around structure
SAMSUNG ELECTRONICS CO LTD23 citations94
US9412849B1Aug 9, 2016
Method of fabricating semiconductor device
SAMSUNG ELECTRONICS CO LTD25 citations94
US9425259B1Aug 23, 2016
Semiconductor device having a fin
SAMSUNG ELECTRONICS CO LTD21 citations93
US7588977B2Sep 15, 2009
Method of fabricating a MOS field effect transistor having plurality of channels
SAMSUNG ELECTRONICS CO LTD25 citations93
US7271456B2Sep 18, 2007
Semiconductor devices including stress inducing layers
SAMSUNG ELECTRONICS CO LTD19 citations93
US9123774B2Sep 1, 2015
Semiconductor devices and methods of fabricating the same
SAMSUNG ELECTRONICS CO LTD24 citations92
US7803675B2Sep 28, 2010
Gate-all-around type semiconductor device and method of manufacturing the same
SAMSUNG ELECTRONICS CO LTD33 citations92
US9871103B2Jan 16, 2018
Semiconductor device
SAMSUNG ELECTRONICS CO LTD10 citations84
US9825183B2Nov 21, 2017
Semiconductor device including gate electrode extending between nanosheets
SAMSUNG ELECTRONICS CO LTD10 citations84
US9012281B2Apr 21, 2015
Semiconductor device fabrication methods
SAMSUNG ELECTRONICS CO LTD14 citations84
US7781290B2Aug 24, 2010
Complementary metal-oxide semiconductor (CMOS) devices including a thin-body channel and dual gate dielectric layers and methods of manufacturing the same
SAMSUNG ELECTRONICS CO LTD9 citations84
US10186579B2Jan 22, 2019
Semiconductor devices
SAMSUNG ELECTRONICS CO LTD8 citations83
US9929160B1Mar 27, 2018
Semiconductor devices and methods of manufacturing the same
SAMSUNG ELECTRONICS CO LTD17 citations83
US9276087B2Mar 1, 2016
Methods of manufacturing FINFET semiconductor devices using sacrificial gate patterns and selective oxidization of a fin
SAMSUNG ELECTRONICS CO LTD14 citations83
US10734273B2Aug 4, 2020
Semiconductor device including isolation layers and method of manufacturing the same
SAMSUNG ELECTRONICS CO LTD5 citations82
US9679965B1Jun 13, 2017
Semiconductor device having a gate all around structure and a method for fabricating the same
SAMSUNG ELECTRONICS CO LTD11 citations81
US10304964B2May 28, 2019
Semiconductor device
SAMSUNG ELECTRONICS CO LTD6 citations77
US7859064B1Dec 28, 2010
Semiconductor devices including channel and junction regions of different semiconductor materials
SAMSUNG ELECTRONICS CO LTD6 citations74
US7795687B2Sep 14, 2010
MOS field effect transistor having plurality of channels
SAMSUNG ELECTRONICS CO LTD7 citations74
US10818802B2Oct 27, 2020
Semiconductor device
SAMSUNG ELECTRONICS CO LTD2 citations73
US10204983B2Feb 12, 2019
Semiconductor device and method for fabricating the same
SAMSUNG ELECTRONICS CO LTD2 citations73
US10109631B2Oct 23, 2018
Semiconductor device
SAMSUNG ELECTRONICS CO LTD2 citations73
US9985141B2May 29, 2018
Semiconductor device
SAMSUNG ELECTRONICS CO LTD2 citations73
US9923058B2Mar 20, 2018
Semiconductor device having a fin
SAMSUNG ELECTRONICS CO LTD2 citations73
US9653462B2May 16, 2017
Semiconductor device and method for fabricating the same
SAMSUNG ELECTRONICS CO LTD5 citations73
US9362311B1Jun 7, 2016
Method of fabricating semiconductor device
SAMSUNG ELECTRONICS CO LTD4 citations73
US11101166B2Aug 24, 2021
Semiconductor device including isolation layers and method of manufacturing the same
SAMSUNG ELECTRONICS CO LTD1 citations71
US7955932B2Jun 7, 2011
Single electron transistor and method of manufacturing the same
SAMSUNG ELECTRONICS CO LTD6 citations71
US7952151B2May 31, 2011
Semiconductor devices including fin shaped semiconductor regions and stress inducing layers
SAMSUNG ELECTRONICS CO LTD2 citations63
US11695009B2Jul 4, 2023
Semiconductor device
SAMSUNG ELECTRONICS CO LTD0 citations62
US10991694B2Apr 27, 2021
Semiconductor device
SAMSUNG ELECTRONICS CO LTD0 citations62
US9130040B2Sep 8, 2015
FinFET semiconductor device and method of manufacturing the same
SAMSUNG ELECTRONICS CO LTD3 citations61
US12255257B2Mar 18, 2025
Semiconductor device
SAMSUNG ELECTRONICS CO LTD0 citations60
US11942558B2Mar 26, 2024
Semiconductor device
SAMSUNG ELECTRONICS CO LTD0 citations60
US11557504B2Jan 17, 2023
Semiconductor device including isolation layers and method of manufacturing the same
SAMSUNG ELECTRONICS CO LTD0 citations60
US11251312B2Feb 15, 2022
Semiconductor device
SAMSUNG ELECTRONICS CO LTD0 citations60
IBM
9 patentsUS11282838B2Mar 22, 2022
Stacked gate structures
IBM2 citations73
US11177367B2Nov 16, 2021
Self-aligned bottom spacer EPI last flow for VTFET
IBM2 citations73
US12426314B2Sep 23, 2025
Strain generation and anchoring in gate-all-around field effect transistors
IBM0 citations63
US12148833B2Nov 19, 2024
Three-dimensional, monolithically stacked field effect transistors formed on the front and backside of a wafer
IBM0 citations63
US11923434B2Mar 5, 2024
Self-aligned bottom spacer epi last flow for VTFET
IBM0 citations63
US11817501B2Nov 14, 2023
Three-dimensional, monolithically stacked field effect transistors formed on the front and backside of a wafer
IBM0 citations63
US11688741B2Jun 27, 2023
Gate-all-around devices with isolated and non-isolated epitaxy regions for strain engineering
IBM0 citations63
US12363990B2Jul 15, 2025
Upper and lower gate configurations of monolithic stacked FinFET transistors
IBM0 citations52
US11476163B2Oct 18, 2022
Confined gate recessing for vertical transport field effect transistors
IBM0 citations52
SUK SUNG-DAE
4 patentsUS8395218B2Mar 12, 2013
Gate-all-around type semiconductor device and method of manufacturing the same
SUK SUNG-DAE20 citations92
US8124961B2Feb 28, 2012
Single electron transistor
SUK SUNG-DAE10 citations81
US9613871B2Apr 4, 2017
Semiconductor device and fabricating method thereof
SUK SUNG-DAE5 citations72
US9048120B2Jun 2, 2015
Integrated junction and junctionless nanotransistors
SUK SUNG-DAE2 citations61
OH CHANG-WOO
1 patentShowing the top 50 of 60 patents by PatentIndex Score.