P

Inventor

SUK SUNG-DAE

KR60 patents
⚠️ This page may combine multiple inventors who share the name “SUK SUNG-DAE”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

SAMSUNG ELECTRONICS CO LTD

36 patents
US9601569B1Mar 21, 2017

Semiconductor device having a gate all around structure

SAMSUNG ELECTRONICS CO LTD23 citations94
US9412849B1Aug 9, 2016

Method of fabricating semiconductor device

SAMSUNG ELECTRONICS CO LTD25 citations94
US9425259B1Aug 23, 2016

Semiconductor device having a fin

SAMSUNG ELECTRONICS CO LTD21 citations93
US7588977B2Sep 15, 2009

Method of fabricating a MOS field effect transistor having plurality of channels

SAMSUNG ELECTRONICS CO LTD25 citations93
US7271456B2Sep 18, 2007

Semiconductor devices including stress inducing layers

SAMSUNG ELECTRONICS CO LTD19 citations93
US9123774B2Sep 1, 2015

Semiconductor devices and methods of fabricating the same

SAMSUNG ELECTRONICS CO LTD24 citations92
US7803675B2Sep 28, 2010

Gate-all-around type semiconductor device and method of manufacturing the same

SAMSUNG ELECTRONICS CO LTD33 citations92
US9871103B2Jan 16, 2018

Semiconductor device

SAMSUNG ELECTRONICS CO LTD10 citations84
US9825183B2Nov 21, 2017

Semiconductor device including gate electrode extending between nanosheets

SAMSUNG ELECTRONICS CO LTD10 citations84
US9012281B2Apr 21, 2015

Semiconductor device fabrication methods

SAMSUNG ELECTRONICS CO LTD14 citations84
US7781290B2Aug 24, 2010

Complementary metal-oxide semiconductor (CMOS) devices including a thin-body channel and dual gate dielectric layers and methods of manufacturing the same

SAMSUNG ELECTRONICS CO LTD9 citations84
US10186579B2Jan 22, 2019

Semiconductor devices

SAMSUNG ELECTRONICS CO LTD8 citations83
US9929160B1Mar 27, 2018

Semiconductor devices and methods of manufacturing the same

SAMSUNG ELECTRONICS CO LTD17 citations83
US9276087B2Mar 1, 2016

Methods of manufacturing FINFET semiconductor devices using sacrificial gate patterns and selective oxidization of a fin

SAMSUNG ELECTRONICS CO LTD14 citations83
US10734273B2Aug 4, 2020

Semiconductor device including isolation layers and method of manufacturing the same

SAMSUNG ELECTRONICS CO LTD5 citations82
US9679965B1Jun 13, 2017

Semiconductor device having a gate all around structure and a method for fabricating the same

SAMSUNG ELECTRONICS CO LTD11 citations81
US10304964B2May 28, 2019

Semiconductor device

SAMSUNG ELECTRONICS CO LTD6 citations77
US7859064B1Dec 28, 2010

Semiconductor devices including channel and junction regions of different semiconductor materials

SAMSUNG ELECTRONICS CO LTD6 citations74
US7795687B2Sep 14, 2010

MOS field effect transistor having plurality of channels

SAMSUNG ELECTRONICS CO LTD7 citations74
US10818802B2Oct 27, 2020

Semiconductor device

SAMSUNG ELECTRONICS CO LTD2 citations73
US10204983B2Feb 12, 2019

Semiconductor device and method for fabricating the same

SAMSUNG ELECTRONICS CO LTD2 citations73
US10109631B2Oct 23, 2018

Semiconductor device

SAMSUNG ELECTRONICS CO LTD2 citations73
US9985141B2May 29, 2018

Semiconductor device

SAMSUNG ELECTRONICS CO LTD2 citations73
US9923058B2Mar 20, 2018

Semiconductor device having a fin

SAMSUNG ELECTRONICS CO LTD2 citations73
US9653462B2May 16, 2017

Semiconductor device and method for fabricating the same

SAMSUNG ELECTRONICS CO LTD5 citations73
US9362311B1Jun 7, 2016

Method of fabricating semiconductor device

SAMSUNG ELECTRONICS CO LTD4 citations73
US11101166B2Aug 24, 2021

Semiconductor device including isolation layers and method of manufacturing the same

SAMSUNG ELECTRONICS CO LTD1 citations71
US7955932B2Jun 7, 2011

Single electron transistor and method of manufacturing the same

SAMSUNG ELECTRONICS CO LTD6 citations71
US7952151B2May 31, 2011

Semiconductor devices including fin shaped semiconductor regions and stress inducing layers

SAMSUNG ELECTRONICS CO LTD2 citations63
US11695009B2Jul 4, 2023

Semiconductor device

SAMSUNG ELECTRONICS CO LTD0 citations62
US10991694B2Apr 27, 2021

Semiconductor device

SAMSUNG ELECTRONICS CO LTD0 citations62
US9130040B2Sep 8, 2015

FinFET semiconductor device and method of manufacturing the same

SAMSUNG ELECTRONICS CO LTD3 citations61
US12255257B2Mar 18, 2025

Semiconductor device

SAMSUNG ELECTRONICS CO LTD0 citations60
US11942558B2Mar 26, 2024

Semiconductor device

SAMSUNG ELECTRONICS CO LTD0 citations60
US11557504B2Jan 17, 2023

Semiconductor device including isolation layers and method of manufacturing the same

SAMSUNG ELECTRONICS CO LTD0 citations60
US11251312B2Feb 15, 2022

Semiconductor device

SAMSUNG ELECTRONICS CO LTD0 citations60

IBM

9 patents

SUK SUNG-DAE

4 patents

OH CHANG-WOO

1 patent

Showing the top 50 of 60 patents by PatentIndex Score.