Inventor
TSUKUDE MASAKI
JP116 patents
⚠️ This page may combine multiple inventors who share the name “TSUKUDE MASAKI”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
MITSUBISHI ELECTRIC CORP
48 patentsUS6232793B1May 15, 2001
Switched backgate bias for FET
MITSUBISHI ELECTRIC CORP140 citations99
US5726946AMar 10, 1998
Semiconductor integrated circuit device having hierarchical power source arrangement
MITSUBISHI ELECTRIC CORP224 citations99
US5646900AJul 8, 1997
Sense amplifier including MOS transistors having threshold voltages controlled dynamically in a semiconductor memory device
MITSUBISHI ELECTRIC CORP314 citations99
US5610533AMar 11, 1997
Switched substrate bias for logic circuits
MITSUBISHI ELECTRIC CORP262 citations99
US4977542ADec 11, 1990
Dynamic semiconductor memory device of a twisted bit line system having improved reliability of readout
MITSUBISHI ELECTRIC CORP446 citations99
US5812490ASep 22, 1998
Synchronous dynamic semiconductor memory device capable of restricting delay of data output timing
MITSUBISHI ELECTRIC CORP102 citations98
US5652725AJul 29, 1997
Semiconductor memory device having a redundant row and a redundant column which can be accessed prior to substitution
MITSUBISHI ELECTRIC CORP112 citations98
US5831924ANov 3, 1998
Synchronous semiconductor memory device having a plurality of banks distributed in a plurality of memory arrays
MITSUBISHI ELECTRIC CORP164 citations97
US5703522ADec 30, 1997
Switched substrate bias for MOS-DRAM circuits
MITSUBISHI ELECTRIC CORP94 citations97
US6643208B2Nov 4, 2003
Semiconductor integrated circuit device having hierarchical power source arrangement
MITSUBISHI ELECTRIC CORP32 citations96
US6404056B1Jun 11, 2002
Semiconductor integrated circuit
MITSUBISHI ELECTRIC CORP69 citations96
US6134171AOct 17, 2000
Semiconductor integrated circuit device having hierarchical power source arrangement
MITSUBISHI ELECTRIC CORP68 citations96
US6097180AAug 1, 2000
Voltage supply circuit and semiconductor device including such circuit
MITSUBISHI ELECTRIC CORP44 citations96
US5959927ASep 28, 1999
Semiconductor integrated circuit device having hierarchical power source arrangement
MITSUBISHI ELECTRIC CORP33 citations96
USRE36089EFeb 9, 1999
Column selecting circuit in semiconductor memory device
MITSUBISHI ELECTRIC CORP52 citations96
US5854561ADec 29, 1998
Switched substrate bias for MOS DRAM circuits
MITSUBISHI ELECTRIC CORP59 citations96
US5838627ANov 17, 1998
Arrangement of power supply and data input/output pads in semiconductor memory device
MITSUBISHI ELECTRIC CORP92 citations96
US5687123ANov 11, 1997
Semiconductor memory device
MITSUBISHI ELECTRIC CORP66 citations96
US5659517AAug 19, 1997
Semiconductor memory device with an improved hierarchical power supply line configuration
MITSUBISHI ELECTRIC CORP71 citations96
US5604710AFeb 18, 1997
Arrangement of power supply and data input/output pads in semiconductor memory device
MITSUBISHI ELECTRIC CORP82 citations96
US5568440AOct 22, 1996
Semiconductor memory device having self-refreshing function
MITSUBISHI ELECTRIC CORP42 citations96
US5249155ASep 28, 1993
Semiconductor device incorporating internal voltage down converting circuit
MITSUBISHI ELECTRIC CORP81 citations96
US6525984B2Feb 25, 2003
Semiconductor integrated circuit device having hierarchical power source arrangement
MITSUBISHI ELECTRIC CORP17 citations93
US6434065B1Aug 13, 2002
Semiconductor memory device of low power consumption
MITSUBISHI ELECTRIC CORP39 citations93
US6414883B2Jul 2, 2002
Semiconductor memory device
MITSUBISHI ELECTRIC CORP18 citations93
US6341098B2Jan 22, 2002
Semiconductor integrated circuit device having hierarchical power source arrangement
MITSUBISHI ELECTRIC CORP14 citations93
US6246625B1Jun 12, 2001
Semiconductor integrated circuit device having hierarchical power source arrangement
MITSUBISHI ELECTRIC CORP19 citations93
US6205067B1Mar 20, 2001
Semiconductor memory device having burn-in mode operation stably accelerated
MITSUBISHI ELECTRIC CORP34 citations93
US6150728ANov 21, 2000
Semiconductor memory device having a pad arrangement with reduced occupying area
MITSUBISHI ELECTRIC CORP29 citations93
US6038183AMar 14, 2000
Semiconductor memory device having burn-in mode operation stably accelerated
MITSUBISHI ELECTRIC CORP28 citations93
US6011428AJan 4, 2000
Voltage supply circuit and semiconductor device including such circuit
MITSUBISHI ELECTRIC CORP43 citations93
US5969420AOct 19, 1999
Semiconductor device comprising a plurality of interconnection patterns
MITSUBISHI ELECTRIC CORP24 citations93
US5966340AOct 12, 1999
Semiconductor memory device having hierarchical word line structure
MITSUBISHI ELECTRIC CORP26 citations93
US5949731ASep 7, 1999
Semiconductor memory device having burn-in mode operation stably accelerated
MITSUBISHI ELECTRIC CORP33 citations93
US5943273AAug 24, 1999
Semiconductor memory device
MITSUBISHI ELECTRIC CORP23 citations93
US5917765AJun 29, 1999
Semiconductor memory device capable of burn in mode operation
MITSUBISHI ELECTRIC CORP42 citations93
US5910927AJun 8, 1999
Memory device and sense amplifier control device
MITSUBISHI ELECTRIC CORP24 citations93
US5909046AJun 1, 1999
Semiconductor integrated circuit device having stable input protection circuit
MITSUBISHI ELECTRIC CORP19 citations93
US5896328AApr 20, 1999
Semiconductor memory device allowing writing of desired data to a storage node of a defective memory cell
MITSUBISHI ELECTRIC CORP34 citations93
US5856951AJan 5, 1999
Semiconductor memory device with an improved hierarchical power supply line configuration
MITSUBISHI ELECTRIC CORP33 citations93
US5844295ADec 1, 1998
Semiconductor device having a fuse and an improved moisture resistance
MITSUBISHI ELECTRIC CORP26 citations93
US5815428ASep 29, 1998
Semiconductor memory device having hierarchical bit line structure
MITSUBISHI ELECTRIC CORP37 citations93
US5757175AMay 26, 1998
Constant current generating circuit
MITSUBISHI ELECTRIC CORP27 citations93
US5696727ADec 9, 1997
Semiconductor memory device provided with sense amplifier capable of high speed operation with low power consumption
MITSUBISHI ELECTRIC CORP21 citations93
US5694364ADec 2, 1997
Semiconductor integrated circuit device having a test mode for reliability evaluation
MITSUBISHI ELECTRIC CORP46 citations93
US5682343AOct 28, 1997
Hierarchical bit line arrangement in a semiconductor memory
MITSUBISHI ELECTRIC CORP54 citations93
US5652726AJul 29, 1997
Semiconductor memory device having hierarchical bit line structure employing improved bit line precharging system
MITSUBISHI ELECTRIC CORP22 citations93
US5587959ADec 24, 1996
Semiconductor memory device
MITSUBISHI ELECTRIC CORP23 citations93
RENESAS TECH CORP
2 patentsShowing the top 50 of 116 patents by PatentIndex Score.