Inventor

GUO RUIFENG

US25 patents

⚠️ This page may combine multiple inventors who share the name “GUO RUIFENG”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

GUO RUIFENG

GUO RUIFENG

Test pattern generation for diagnosing scan chain failures

Generating test sets for diagnosing scan chain failures

Fault dictionary-based scan chain failure diagnosis

Detection and diagnosis of scan cell internal defects

Generating test sets for diagnosing scan chain failures

Diagnostic test pattern generation for small delay defect

Speed-path debug using at-speed scan test patterns

MENTOR GRAPHICS CORP

Test access architecture for stacked memory and logic dies

Faulty chains identification without masking chain patterns

Generating test sets for diagnosing scan chain failures

Fault dictionary based scan chain failure diagnosis

Test pattern generation for diagnosing scan chain failures

Diagnosis-aware scan chain stitching

Test architecture for characterizing interconnects in stacked designs

SYNOPSYS INC

Cell-aware defect characterization for multibit cells

Advanced cell-aware fault model for yield analysis and physical failure analysis

Cell-aware defect characterization by considering inter-cell timing

Adaptive cell-aware test model for circuit diagnosis

Cell-aware defect characterization and waveform analysis using multiple strobe points

HUANG YU

Diagnosing mixed scan chain and system logic defects

Two-dimensional scan architecture

Method and system for scan chain diagnosis

Compound hold-time fault diagnosis

UNIV SOUTHWEST PETROLEUM

Active energy-absorbing shock absorber for perforation combined well testing

UNIV TAIYUAN TECHNOLOGY

Preparation method and application of tailings-based zeolite@CDs-TiO2 composite photocatalyst