Inventor
ICHIYAMA KIYOTAKA
JP33 patents
⚠️ This page may combine multiple inventors who share the name “ICHIYAMA KIYOTAKA”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
ADVANTEST CORP
26 patentsUS8000931B2Aug 16, 2011
Deterministic component model judging apparatus, judging method, program, recording medium, test system and electronic device
ADVANTEST CORP7 citations84
US7903776B2Mar 8, 2011
Jitter measurement apparatus, jitter calculator, jitter measurement method, program, recording medium, communication system and test apparatus
ADVANTEST CORP7 citations84
US7496137B2Feb 24, 2009
Apparatus for measuring jitter and method of measuring jitter
ADVANTEST CORP12 citations84
US7394277B2Jul 1, 2008
Testing apparatus, testing method, jitter filtering circuit, and jitter filtering method
ADVANTEST CORP14 citations84
US7564897B2Jul 21, 2009
Jitter measuring apparatus, jitter measuring method and PLL circuit
ADVANTEST CORP7 citations74
US8659330B2Feb 25, 2014
Signal generation apparatus and signal generation method
ADVANTEST CORP2 citations63
US8045605B2Oct 25, 2011
Jitter amplifier circuit, signal generation circuit, semiconductor chip, and test apparatus
ADVANTEST CORP2 citations63
US7999531B2Aug 16, 2011
Phase detecting apparatus, test apparatus and adjusting method
ADVANTEST CORP4 citations63
US7957458B2Jun 7, 2011
Jitter measurement apparatus, jitter measurement method, test apparatus and electronic device
ADVANTEST CORP3 citations63
US7945405B2May 17, 2011
Jitter measurement apparatus, jitter measurement method, recording media, communication system and test apparatus
ADVANTEST CORP3 citations63
US7917331B2Mar 29, 2011
Deterministic component identifying apparatus, identifying, program, recording medium, test system and electronic device
ADVANTEST CORP2 citations63
US7904776B2Mar 8, 2011
Jitter injection circuit, pattern generator, test apparatus, and electronic device
ADVANTEST CORP3 citations63
US7844020B2Nov 30, 2010
Transmission system, transmitter, receiver, and transmission method
ADVANTEST CORP4 citations63
US7834639B2Nov 16, 2010
Jitter injection circuit, pattern generator, test apparatus, and electronic device
ADVANTEST CORP5 citations63
US7801211B2Sep 21, 2010
Communication system, receiver unit, and adaptive equalizer
ADVANTEST CORP2 citations63
US7778319B2Aug 17, 2010
Jitter measuring apparatus, jitter measuring method and test apparatus
ADVANTEST CORP4 citations63
US7724811B2May 25, 2010
Delay circuit, jitter injection circuit, and test apparatus
ADVANTEST CORP5 citations63
US7715512B2May 11, 2010
Jitter measurement apparatus, jitter measurement method, and recording medium
ADVANTEST CORP6 citations63
US7554332B2Jun 30, 2009
Calibration apparatus, calibration method, testing apparatus, and testing method
ADVANTEST CORP2 citations63
US7541815B2Jun 2, 2009
Electronic device, testing apparatus, and testing method
ADVANTEST CORP2 citations63
US7466140B2Dec 16, 2008
Signal generation circuit, jitter injection circuit, semiconductor chip and test apparatus
ADVANTEST CORP3 citations63
US7412341B2Aug 12, 2008
Jitter amplifier, jitter amplification method, electronic device, testing apparatus, and testing method
ADVANTEST CORP2 citations63
US11005463B2May 11, 2021
Signal processor and signal processing method
ADVANTEST CORP1 citations62
US8014465B2Sep 6, 2011
Digital modulator, digital modulating method, digital transceiver system, and testing apparatus
ADVANTEST CORP0 citations52
US7971107B2Jun 28, 2011
Calculation apparatus, calculation method, program, recording medium, test system and electronic device
ADVANTEST CORP0 citations52
US7501905B2Mar 10, 2009
Oscillator circuit, PLL circuit, semiconductor chip, and test apparatus
ADVANTEST CORP1 citations52
ICHIYAMA KIYOTAKA
4 patentsUS8204165B2Jun 19, 2012
Jitter measurement apparatus, electronic device, and test apparatus
ICHIYAMA KIYOTAKA2 citations61
US8155215B2Apr 10, 2012
Transmission system, transmitter, receiver, and transmission method
ICHIYAMA KIYOTAKA3 citations61
US8068538B2Nov 29, 2011
Jitter measuring apparatus, jitter measuring method and test apparatus
ICHIYAMA KIYOTAKA2 citations61
US8175828B2May 8, 2012
Evaluation apparatus, evaluation method, program, recording medium and electronic device
ICHIYAMA KIYOTAKA0 citations40